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公开(公告)号：US20200082518A1
公开(公告)日：2020-03-12
申请号：US16684507
申请日：2019-11-14
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stellari
Abstract: A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.
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公开(公告)号：US20200082053A1
公开(公告)日：2020-03-12
申请号：US16683368
申请日：2019-11-14
Applicant: International Business Machines Corporation
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stellari
Abstract: Techniques facilitating integrated circuit identification and reverse engineering are provided. A computer-implemented method can comprise identifying, by a system operatively coupled to a processor, an element within a first elementary cell of one or more elementary cells of an integrated circuit. The method can also comprise matching, by the system, the element with respective elements across the one or more elementary cells including the first elementary cell. The respective elements can be replicas of the element. Further, matching the element with respective elements can be based on a layout analysis of the integrated circuit.
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公开(公告)号：US10574240B2
公开(公告)日：2020-02-25
申请号：US15445587
申请日：2017-02-28
Applicant: International Business Machines Corporation
Inventor： Keith A. Jenkins , Peilin Song , James H. Stathis , Franco Stellari
Abstract: An electronic apparatus for testing an integrated circuit (IC) that includes a ring oscillator is provided. The apparatus configures the ring oscillator to produce oscillation at a first frequency and configures the ring oscillator to produce oscillation at a second frequency. The apparatus then compares the second frequency with an integer multiple of the first frequency to determine a resistive voltage drop between a voltage applied to the IC and a local voltage at the ring oscillator. The ring oscillator has a chain of inverting elements forming a long ring and a short ring. The ring oscillator also has an oscillation selection circuit that is configured to disable the short ring so that the ring oscillator produces a fundamental oscillation based on signal propagation through the long ring and enable the short ring so that the ring oscillator produces a harmonic oscillation based on a signal propagation through the short ring and the long ring.
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公开(公告)号：US10515183B2
公开(公告)日：2019-12-24
申请号：US15842639
申请日：2017-12-14
Applicant: International Business Machines Corporation
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stellari
Abstract: Techniques facilitating integrated circuit identification and reverse engineering are provided. A computer-implemented method can comprise identifying, by a system operatively coupled to a processor, an element within a first elementary cell of one or more elementary cells of an integrated circuit. The method can also comprise matching, by the system, the element with respective elements across the one or more elementary cells including the first elementary cell. The respective elements can be replicas of the element. Further, matching the element with respective elements can be based on a layout analysis of the integrated circuit.
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公开(公告)号：US20190285690A1
公开(公告)日：2019-09-19
申请号：US16422411
申请日：2019-05-24
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Raphael P. Robertazzi , Peilin Song , Franco Stellari
Abstract: A method for characterizing an integrated circuit that selecting at least two devices from an integrated circuit for measuring light emission, wherein each of the at least two devices have experienced a different level of stress, applying power to the integrated circuit, and measuring the light emission from the at least two devices. The method also includes comparing the light emission that is measured from the at least two devices, wherein a difference between the light emission that is measured from the at least two devices greater than a predetermined ratio indicates that at least one of the devices from the at least two devices has a below specification performance.
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Patent Agency Ranking
公开(公告)号：US10302697B2
公开(公告)日：2019-05-28
申请号：US14945892
申请日：2015-11-19
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Franco Stellari , Peilin Song
IPC: G06F17/50 , G01R31/30 , G01R31/317 , G01R31/311
Abstract: Methods and systems for automated diagnostics include registering an image of a device under test (DUT) to a corresponding design layout. The image is segmented based on the registration to allocate pixels to individual design elements. Emission signatures for the individual design elements are compared to expected signatures. If the emissions differ from the expected signatures more than a threshold amount to determine if a defect is present.
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公开(公告)号：US20180330037A1
公开(公告)日：2018-11-15
申请号：US15591691
申请日：2017-05-10
Applicant: International Business Machines Corporation
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stellari
IPC: G06F17/50
Abstract: Techniques facilitating integrated circuit identification and reverse engineering are provided. A computer-implemented method can comprise identifying, by a system operatively coupled to a processor, an element within a first elementary cell of one or more elementary cells of an integrated circuit. The method can also comprise matching, by the system, the element with respective elements across the one or more elementary cells including the first elementary cell. The respective elements can be replicas of the element. Further, matching the element with respective elements can be based on a layout analysis of the integrated circuit.
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公开(公告)号：US10102090B2
公开(公告)日：2018-10-16
申请号：US15156136
申请日：2016-05-16
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Keith A. Jenkins , Barry P. Linder , Emily A. Ray , Raphael P. Robertazzi , Peilin Song , James H. Stathis , Kevin G. Stawiasz , Franco Stellari , Alan J. Weger , Emmanuel Yashchin
IPC: G06F11/00 , G06F11/22 , G06F11/263
Abstract: A method and system are provided for chip testing. The method includes ascertaining a baseline for a functioning chip with no stress history by performing a non-destructive test procedure on the functioning chip. The method further includes repeating the test procedure on a chip under test using a threshold derived from the baseline as a reference point to determine a stress history of the chip under test. The test procedure includes ordering each of a plurality of functional patterns by a respective minimum operating period corresponding thereto, ranking each pattern based on at least one preceding available pattern to provide a plurality of pattern ranks, and calculating a sum by summing the pattern ranks. The sum calculated by the ascertaining step is designated as the baseline, and the sum calculated by the repeating step is compared to the threshold to determine the stress history of the chip under test.
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公开(公告)号：US20180027003A1
公开(公告)日：2018-01-25
申请号：US15217074
申请日：2016-07-22
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor： Andrea Bahgat Shehata , Peilin Song , Franco Stallari
IPC: H04L29/06 , G01R29/08 , G06T7/00 , G01R31/302
CPC classification number: G06T7/001 , G01R29/0814 , G06F11/263 , G06F17/5031 , G06F21/56 , G06F21/564 , H04K3/00 , H04K3/82 , H04K2203/14 , H04L63/1416 , H04L63/162
Abstract: A method and apparatus related to developing electromagnetic emission and power models for a target device using photonic emissions thereof are provided. Data of photonic emissions of a target device during a first period of time with the target device in one or more modes is recorded. Data of electromagnetic emissions of the target device during the first period of time with the target device in the one or more modes is also recorded. The recorded data of the photonic emissions and the recorded data of the electromagnetic emissions are correlated to establish one or more electromagnetic emission models for the target device. The one or more electromagnetic emission models enable predictive analysis of emissions by the target device.
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公开(公告)号：US20170242073A1
公开(公告)日：2017-08-24
申请号：US15590617
申请日：2017-05-09
Applicant: International Business Machines Corporation
Inventor： Dzmitry S. Maliuk , Franco , Alan J. Weger , Peilin Song
IPC: G01R31/3177 , G01R31/317
Abstract: A scan chain latch circuit, a method of operating a latch circuit in a scan chain, and a computer-readable medium having stored thereon a data structure defining a scan chain latch circuit for instantiation on a semiconductor die are disclosed. In an embodiment, the scan chain latch circuit comprises a first latch for holding one data value, a second latch for holding another data value, and a multiplexor. The one data value is applied to a first data input of the multiplexor and the another data value is applied to a second data input of the multiplexor. An alternating clock signal is applied to a select input of the multiplexor to control the output of the multiplexor, wherein the output of the multiplexor toggles between the two data values held in the two latches at a defined frequency.
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