摘要:
A circuit for repairing a defective memory cell is provided between a row or column decoder and a memory cell array. When the decoder has n output lines, the memory cell array includes at least (N+1) row or column lines, where n is an integer. The repair circuit includes connection circuit for connecting the output lines of the decoder to the row or column lines, and a circuit for defining the connection of the connection circuit. The connection circuit includes n switching elements each of which is operable to connect one output line of the decoder to at least two row or column lines. The defining circuit defines the connection path of each switching element such that the output lines of the decoder is connected in one to one correspondence to successively located row or column lines excluding a row or column line connecting a defective memory cell. The defining circuit includes a series of laser programmable fuse elements provided between an operation voltage supply and a ground line. The repair circuit occupies a reduced area of a chip because of no spare decoder and nor program circuit and it carries out a reliable and fast memory repair because of the reduced number of the fuse elements to be blown off.
摘要:
A circuit for repairing a defective memory cell between a row or column decoder and a memory cell array. When the decoder has n output lines, the memory cell array includes at least (N+1) row or column lines, where n is an integer. The repair circuit includes connection circuit for connecting the output lines of the decoder to the row or column lines, and a circuit for defining the connection of the connection circuit. The connection circuit includes n switching elements each of which is operable to connect one output line of the decoder to at least two row or column lines. The defining circuit defines the connection path of each switching element such that the output lines of the decoder is connected in one to one correspondence to successively located row or column lines excluding a row or column line connecting a defective memory cell. The defining circuit includes a series of laser programmable fuse elements provided between an operation voltage supply and a ground line. The repair circuit occupies a reduced area of a chip because of no spare decoder and no program circuit and it carries out a reliable and fast memory repair because of the reduced number of the fuse elements to be blown off.
摘要:
In a SRAM of a selected word line structure, each local decoder is connected to a corresponding main word line and a corresponding Z decoder signal line. Each local decoder includes a circuit including two MOS transistors connected in series to each other which circuit has one end grounded. The corresponding local word line is connected to a node between these two transistors. Out of the corresponding main word line and the corresponding Z decoder signal line, one is connected to the gates of these transistors and the other is connected to the other end of said circuit, which the other end is not grounded. The potential on the corresponding local word line attains a high level only when the potential on the signal line connected to the gate of these two transistors, is at a logical level at which the transistor can be turned on and the potential on said one signal line is at a high level. Theoretically, therefore, each local word line is controlled to be activated or inactivated by the operations of two elements in the corresponding local decoder.
摘要:
A static random access memory includes a plurality of memory cells each constituted by 5 elements. One memory cell is connected to a single bit line through a single access gate transistor. Additionally, a source line potential controlling circuit is provided for applying a predetermined intermediate potential to the source of a driver transistor of the memory cell in a column which is not accessed, when the memory cell is not accessed. Since one memory cell is constituted by only five elements, and connected to a single bit line, its density is improved. Furthermore, since a power supply voltage applied to the memory cell provided in the column which is not accessed is decreased by an effect of a source line potential controlling circuit, power consumption is decreased, and moreover, destruction of the memory cell can be prevented.
摘要:
A memory matrix is segmented in the direction of columns into a plurality of groups of memory cells. The memory cells are accessible through respective preceding word lines each of which is provided for each of the rows of the matrix and commonly to all of the groups of the memory cells and group word lines each of which is provided per group and per row, so that a path for column current is set up during access time only in the column which belongs to a particular group including a particular memory to be accessed.
摘要:
When an input terminal, which is connected to an input transistor, is opened, a transistor having an emitter connected to the input transistor conducts to supply constant current to a constant current source which is connected to the emitter of the input transistor. Therefore, load current of a reference circuit connected to the constant current source is not changed even if the input terminal is opened. As the result, current values of all constant current sources receiving voltage from the reference circuit are not changed so that the internal circuit of a semiconductor integrated circuit device can be stably operated.
摘要:
A semiconductor memory device comprises a memory cell array, a row decoder, a column decoder, a plurality of sense amplifiers, a plurality of write circuits, a signal switching circuit, a plurality of input buffers, a plurality of output buffers and a plurality of terminals, which are formed on the same chip. A switching signal B1/B4 is applied to one of the plurality of terminals. The semiconductor memory device has a 256K word by 4 bit organization when the switching signal B1/B4 is at an "L" level and has a 1M word by 1 bit organization when the switching signal B1/B4 is at an "H" level. The word organization can be switched mainly by the signal switching circuit.
摘要:
A semiconductor memory device having a plurality of word line pairs and drain lines, a plurality of bit line pairs, and a plurality of memory cells connected to both of the word line pairs and the bit line pairs at the cross points thereof, comprising: a first and a second word line provided as the word line pair, a memory cell including a first and a second multi-emitter transistor whose commonly connected emitters are connected to the drain line, first and second resistors where one of their ends are connected between the collectors of the first and second multi-emitter transistors respectively, and where their other ends are both connected to the first word line and the bases of the second and first multi-emitter transistors are connected to the other's collectors, respectively, and first and second diodes such as Schottky barrier diodes are connected between the collectors of the first and second multi-emitter transistors and the second word line, respectively. A current which is provided for each row which consists of an input transistor which receives an address input signal at its base input and a reference transistor which receives a predetermined voltage at its base input with the emitters thereof being commonly connected with each other. Third and fourth resistors are serially connected between the collector of the input transistor and a power supply voltage. A first word line driving transistor for driving the first word line whose base is connected between the third resistor and the fourth resistor and whose emitter is connected to the first word line. A second word line driving transistor for driving the second word line whose base is connected between the collector of the input transistor and the fourth resistor and whose emitter is connected to the second word line. The collectors of the first and the second word line driving transistor are connected to the voltage power supply.
摘要:
A driver circuit comprises a bipolar transistor for passing current from a power supply potential V.sub.CC to an output terminal, two CMOS inverters connected between an input terminal and the output terminal, a diode for passing current from the output terminal to the input terminal, and an NMOSFET for passing current from the input terminal to a power supply potential V.sub.EE. When a signal applied to the input terminal falls from an "H" level to an "L" level, the potential of the output terminal is changed from V.sub.CC to V.sub.EE. At the time, current flows from the output terminal to the input terminal through the diode. In addition, the current flows to the power supply potential V.sub.EE through the NMOSFET. When the signal applied to the input terminal rises from the "L" level to the "H" level, the potential of the output terminal is changed from the V.sub.EE to the V.sub.CC. At that time, current flows from the power supply potential V.sub.CC to the output terminal through the bipolar transistor.
摘要:
A power supply voltage to be applied to a metallic connection 36a is supplied through an n.sup.+ diffusion region 34a, an N type well 22, an n.sup.+ diffusion region 34c and a metallic connection 36C to a p.sup.+ diffusion region 23b serving as a power supply line. An n.sup.+ diffusion region 73 serving as a ground line is grounded through a metallic connection 76c, a p.sup.+ diffusion region 74c, a P type well 72, a p.sup.+ diffusion region 74b and a metallic connection 76b.