READ CHANNEL ERROR CORRECTION USING MULTIPLE CALIBRATORS

    公开(公告)号:US20140139943A1

    公开(公告)日:2014-05-22

    申请号:US13681917

    申请日:2012-11-20

    Abstract: Read channel circuitry comprises a decoder and error correction circuitry. The error correction circuitry is configured to calibrate a first set of filters using a read channel data signal, to determine first hard decision information regarding the read channel data signal using the calibrated first set of filters, to determine an error corrected read channel data signal using the first hard decision information, to calibrate a second set of filters using the error corrected read channel data signal, to determine second hard decision information regarding the error corrected read channel data signal using the calibrated second set of filters, and to decode the second hard decision information. The first set of filters and the second set of filters are calibrated in respective first and second calibrators.

    Test Pattern Optimization for LDPC Based Flawscan
    26.
    发明申请
    Test Pattern Optimization for LDPC Based Flawscan 有权
    基于LDPC的Flawscan的测试模式优化

    公开(公告)号:US20140129890A1

    公开(公告)日:2014-05-08

    申请号:US13672218

    申请日:2012-11-08

    Abstract: A method for producing a LDPC encoded test pattern for media in a LDPC based drive system includes adding error detection code data to a predominantly zero bit test pattern and adding additional zero bits to produce a test pattern of a desirable length. The test pattern may then be scrambled to produce a desirable flaw detection test pattern. The flaw detection test pattern may then be encoding with an LDPC code, or other error correction code with minimal disturbance to the run length constraints of the data pattern, and written to a storage medium.

    Abstract translation: 一种用于在基于LDPC的驱动系统中产生用于媒体的LDPC编码测试模式的方法,包括将误差检测码数据添加到主要为零比特的测试模式,并且添加额外的零比特以产生期望长度的测试模式。 然后可以对测试图案进行加扰以产生所需的探伤测试图案。 然后,探伤测试模式可以用LDPC码或其他纠错码进行编码,对数据模式的游程长度限制具有最小干扰,并写入存储介质。

    Threshold Acquisition and Adaption in NAND Flash Memory
    27.
    发明申请
    Threshold Acquisition and Adaption in NAND Flash Memory 有权
    NAND闪存中的阈值采集和适配

    公开(公告)号:US20140119113A1

    公开(公告)日:2014-05-01

    申请号:US13664583

    申请日:2012-10-31

    CPC classification number: G11C16/06 G11C16/34 G11C16/349

    Abstract: A method, apparatus, and controller for acquiring and tracking at least one threshold voltage of at least one cell of at least one flash chip. The method can include acquiring the at least one threshold voltage of a particular cell of the at least one flash cell. The method can further include performing at least one threshold voltage adjustment iteration.

    Abstract translation: 一种用于获取和跟踪至少一个闪存芯片的至少一个单元的至少一个阈值电压的方法,装置和控制器。 该方法可以包括获取至少一个闪存单元的特定单元的至少一个阈值电压。 该方法还可以包括执行至少一个阈值电压调整迭代。

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