Abstract:
Methods, systems, and devices for leakage current reduction in electronic devices are described. Electronic devices may be susceptible to leakage currents when operating in a first mode, such as an inactive (e.g., a standby) mode. To mitigate leakage current, an electronic device may include transistors coupled in cascode configuration where a gate of a drain-side transistor in the cascode configuration is configured to be biased by an adjustable (e.g., a dynamic) control signal. When the transistors are inactive (e.g., “off”), the control signal may be adjusted to prevent leakage associated with the inactive transistors. Further, a source-side transistor in the cascode configuration may be configured to have a high threshold voltage (e.g., relative to the drain-side transistor).
Abstract:
Apparatuses and methods related to power domain boundary protection in memory. A number of embodiments can include using a voltage detector to monitor a floating power supply voltage used to power a number of logic components while a memory device operates in a reduced power mode, and responsive to the voltage detector detecting that the floating power supply voltage reaches a threshold value while the memory device is in the reduced power mode, providing a control signal to protection logic to prevent a floating output signal driven from one or more of the logic components from being provided across a power domain boundary to one or more of a different number of logic components.
Abstract:
Methods, systems, and devices for sequential voltage control for a memory device are described. A memory device may have various voltage sources that support different voltage levels used in various operations of the memory device. Voltage sources of a memory device may be disabled under some circumstances, such as when the memory device is idled, or operated in a low-power or powered-down mode, among other circumstances. In accordance with examples as disclosed herein, voltage sources of a memory device or memory die may be sequentially enabled or sequentially disabled. For example, voltage sources may be enabled in an order from voltage sources having relatively higher nominal voltages to voltage sources having relatively lower voltages, or disabled in an order from voltage sources having relatively lower nominal voltages to voltage sources having relatively higher voltages.
Abstract:
Disclosed herein is an apparatus that includes a memory cell array including a plurality of memory cells, a first counter circuit configured to periodically update a count value during a first operation mode, a burst clock generator configured to successively generate a burst pulse predetermined times when the count value indicates a predetermined value, and a row address control circuit configured to perform a refresh operation on the memory cell array in response to the burst pulse.
Abstract:
An electronic device may include a main circuit including multiple sub-circuits powered by a direct-current (DC) power supply circuit. The main circuit has a main circuit current demand being a time-varying demand for a DC voltage-regulated supply current being a function of a number of the sub-circuits being active. The DC power supply circuit may include multiple DC voltage regulators to provide the main circuit with the supply current and a command decoding and power management circuit to control enablement of the voltage regulators. The command decoding and power management circuit may be configured to detect an instant value of the main circuit current demand and to selectively enable one or more of the voltage regulators based on the detected instant value.
Abstract:
A regulator includes an operational amplifier, a programmable offset voltage, and a circuit. The operational amplifier includes a non-inverting input, an inverting input, and an output. The programmable offset voltage is configured to cancel a built-in offset voltage of the regulator based on a code. The circuit is configured to set the code based on a sensed built-in offset voltage of the regulator in response to an offset cancellation calibration mode enable signal.
Abstract:
Disclosed herein is an apparatus that includes a memory cell array including a plurality of memory cells, a first counter circuit configured to periodically update a count value during a first operation mode, a burst clock generator configured to successively generate a burst pulse predetermined times when the count value indicates a predetermined value, and a row address control circuit configured to perform a refresh operation on the memory cell array in response to the burst pulse.
Abstract:
Methods, systems, and devices for leakage current reduction in electronic devices are described. Electronic devices may be susceptible to leakage currents when operating in a first mode, such as an inactive (e.g., a standby) mode. To mitigate leakage current, an electronic device may include transistors coupled in cascode configuration where a gate of a drain-side transistor in the cascode configuration is configured to be biased by an adjustable (e.g., a dynamic) control signal. When the transistors are inactive (e.g., “off”), the control signal may be adjusted to prevent leakage associated with the inactive transistors. Further, a source-side transistor in the cascode configuration may be configured to have a high threshold voltage (e.g., relative to the drain-side transistor).
Abstract:
Apparatuses and methods for capturing data using a divided clock are described. An example apparatus includes a clock divider configured to receive a DQS signal, and to provide divided clock signals. A divided clock signal of the divided clock signals has a frequency that is less than a frequency of the DQS signal. The example apparatus further includes a command circuit configured to receive a command, and to assert one of a plurality of flag signals based on the divided clock signals and on a defined latency from a time of receipt of the command. The example apparatus further includes a data capture circuit configured serially receive data associated with the command and to provide deserialized data responsive to the divided clock signals. The data capture circuit is further configured to sort the deserialized data based on the asserted one of the plurality of flag signals to provide sorted data.