摘要:
A device couples energy from an electromagnetic wave to charged particles in a beam. The device includes a micro-resonant structure and a cathode for providing electrons along a path. The micro-resonant structure, on receiving the electromagnetic wave, generates a varying field in a space including a portion of the path. Electrons are deflected or angularly modulated to a second path.
摘要:
A coupled nano-resonating structure includes a plurality of a nano-resonating substructures constructed and adapted to couple energy from a beam of charged particles into said nano-resonating structure and to transmit the coupled energy outside said nano-resonating structure. The nano-resonant substructures may have various shapes and may include parallel rows of structures. The rows may be symmetric or asymmetric, tilted, and/or staggered.
摘要:
A method and apparatus for modulating a beam of charged particles is described in which a beam of charged particles is produced by a particle source and a varying electric field is induced within an ultra-small resonant structure. The beam of charged particles is modulated by the interaction of the varying electric field with the beam of charged particles.
摘要:
A system is disclosed for conveying articles for processing, the system including a conveyor configured to convey articles to the processing station. The conveyor includes a plurality of links, each link including at least one movable gripper for gripping an article, articles being gripped by adjacent links so as to achieve a predetermined spacing between the articles. A processing station is disposed along the conveyor, the conveyor being driven so as to move the articles through the processing station maintaining the predetermined spacing via the movable grippers, the processing station including mating elements spaced according to the predetermined spacing for processing the articles. The articles may be containers, and the processing station may be a filler or other container processing elements.
摘要:
Methods and systems for performing stateful signaling transactions in a distributed processing environment are disclosed. A method for performing stateful signaling transactions in a distributed processing environment includes receiving a signaling message at a routing node, such as a signal transfer point. The signaling message is distributed to one of the plurality of stateful processing modules. The receiving stateful processing module buffers the signaling message and initiates a stateful transaction based on the signaling message. Initiating the stateful transaction may include generating a query message and inserting a stateful processing module identifier in the query message. The query message is sent to an external node, such as an SCP, which formulates a response. The SCP may insert the stateful processing module in the response and send the response back to the signal transfer point. The signal transfer point decodes the response and uses the stateful processing module identifier to forward the response to the correct stateful processing module.
摘要:
A link is disclosed for a conveyor suitable for conveying objects along a transport direction. The link includes a body having a length extending across the direction of transport and a width extending along the direction of transport. The body has a conveying surface and two opposed gripping members extending from the conveying surface. Each gripping member is movable from a first opened position to a second gripping position. The gripping members each include a gripping arm configured to be pivotable relative to the conveying surface when the gripping members move from the first position to the second position. The gripping arms are located so as to be able to contact one of the objects when the gripping members are in the second position to hold the object relative to the link during transport. The link includes at least one spring member urging the gripping members toward the second position. Various other related options are disclosed, along with related conveyors.
摘要:
An apparatus including a first robot, a blade on the first robot, the blade including a pocket to receive a wafer and self-correct a positioning error of the wafer in the pocket, and a first chamber to receive the wafer from the blade and deposit a first metal on the received wafer.
摘要:
A method whereby the image produced in a coherence probe microscope is modified by means of a certain specific additive electronic transformation for the purpose of improving the measurement of selected features. The technique improves measurement accuracy on optically complex materials, in particular it improves the accuracy of linewidth measurement on semiconductor linewidths.
摘要:
A method may include receiving an input from an optimization control that indicates a value along a scale, wherein the value is indicative of a design tradeoff between at least optimization for a first parameter of an electrical design and an optimization for a second parameter of the electrical design, wherein the value places an emphasis on the first parameter and an emphasis on the second parameter such that when the value on the scale is closer to the first parameter a larger emphasis is placed on the first parameter of the electrical design and when the value on the scale is closer to the second parameter a larger emphasis is placed on the second parameter of the electrical design. The method may further include choosing components for the electrical design based on the value indicated using the optimization control, the emphases affecting the components selected for the electrical design.
摘要:
An apparatus includes an interferometer configured to generate an interference pattern by combining test light from a test object with reference light reflected from a reference object, the interferometer being further configured to direct at least a first part of a monitor test beam to the test object at a first incident angle and at least a second part of a monitor reference beam to the reference object at a second incident angle, and recombine the first part and the second part of the monitor beams after they reflect from the test and reference surfaces to interfere with one another and form a monitor pattern, where the first and second angles cause the monitor pattern to have spatial interference fringes, and wherein a change in the position of the interference fringes is indicative of a change in a relative position between the test and reference objects.