公开(公告)号：US07135875B2

公开(公告)日：2006-11-14

申请号：US10716102

申请日：2003-11-18

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: G01R31/305 ,  G01R31/28

CPC classification number: G09G3/006 ,  G01R31/2887 ,  G01R31/302

Abstract: The invention relates to methods for positioning of a substrate 140 and contacting of the test object 301 for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder 130. The substrate is positioned relative to the optical axis. A contact unit 150 is also positioned relative to the optical axis, whereby the contact unit is positioned independent of the positioning activity of the substrate. Thereby, a flexible contacting of test objects on the substrate can be realized.

Abstract translation: 本发明涉及一种用于定位基片140的方法，以及用于测试的测试对象301与具有光轴和对应装置的测试装置的接触。 由此，将基板放置在保持器130上。 基板相对于光轴定位。 接触单元150也相对于光轴定位，由此接触单元独立于衬底的定位活动而定位。 从而可以实现测试对象在基板上的柔性接触。

公开(公告)号：US20060181290A1

公开(公告)日：2006-08-17

申请号：US11398052

申请日：2006-04-05

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: G01R31/305

CPC classification number: G09G3/006 ,  G01R31/2887 ,  G01R31/302

Abstract: The invention relates to methods for positioning of a substrate and contacting of the test object for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder. The substrate is positioned relative to the optical axis. A contact unit is also positioned relative to the optical axis, whereby the contact unit is positioned independent of the positioning activity of the substrate. Thereby, a flexible contacting of test objects on the substrate can be realized.

公开(公告)号：US20060028230A1

公开(公告)日：2006-02-09

申请号：US10977510

申请日：2004-10-29

Applicant: Axel Wenzel ,  Ralf Schmid ,  Matthias Brunner

Inventor： Axel Wenzel ,  Ralf Schmid ,  Matthias Brunner

IPC: G01R31/00

CPC classification number: G01N23/2251 ,  G02F2001/136254

Abstract: The present invention provides a method of electron beam testing of liquid crystal displays comprising non-uniform electrodes having a conductive portion and a dielectric portion. In accordance with methods of the present invention, the diameter of the electron beam is increased so that the beam is less focused, i.e., enlarged or “blurred,” over a non-uniform electrode area. The diameter of the beam is increased so that the beam generates secondary electrons from the conductive portion of the non-uniform electrode area. The configured test beam may be circular, elliptical, or other suitable shapes.

Abstract translation: 本发明提供了包括具有导电部分和电介质部分的不均匀电极的液晶显示器的电子束测试方法。 根据本发明的方法，电子束的直径增加，使得光束在非均匀电极区域上聚焦较少，即扩大或“模糊”。 光束的直径增加，使得光束从非均匀电极区域的导电部分产生二次电子。 配置的测试光束可以是圆形，椭圆形或其他合适的形状。

公开(公告)号：US4985681A

公开(公告)日：1991-01-15

申请号：US813875

申请日：1985-12-27

Applicant: Matthias Brunner ,  Juergen Frosien ,  Reinhold Schmitt ,  Burkhard Lischke

Inventor： Matthias Brunner ,  Juergen Frosien ,  Reinhold Schmitt ,  Burkhard Lischke

IPC: G01N23/225 ,  G01R31/02 ,  G01R31/302 ,  G01R31/305 ,  H01L21/66

CPC classification number: G01R31/024 ,  G01R31/305

Abstract: For testing an interconnect network for shorts and interruptions, a point of the network to be tested is charged with a particle beam. Subsequently, a potential at least one further contact point is read with the same particle beam and an unaltered primary energy. An identification of potential occurs by documenting the secondary electrons triggered at the contact points. In order to avoid a disturbing change of potential during the measuring phase, the measuring time is only a fraction of the time for charging the network.

Abstract translation: 为了测试短路和中断的互连网络，要测试的网络的一点充满了粒子束。 随后，用相同的粒子束和未改变的一次能量读取潜在的至少一个另外的接触点。 通过记录在接触点处触发的二次电子来发生电位的识别。 为了避免测量阶段电位的干扰变化，测量时间只是网络充电时间的一小部分。

公开(公告)号：US08208114B2

公开(公告)日：2012-06-26

申请号：US12355698

申请日：2009-01-16

Applicant: Matthias Brunner

Inventor： Matthias Brunner

IPC: G02F1/1345

CPC classification number: G09G3/006 ,  G02F1/1309

Abstract: Embodiments of the present invention relate to a drive electronics for driving a display with a matrix 101 of picture elements. The drive circuit 102x and 102y for generating signals for driving the pixels via control lines 103 is provided with signals at the input terminals 110 via contact areas 104. In addition to the contact areas used for the generation of arbitrary pictures, there exist contact areas 105 used within the framework of a testing method. These contact areas for the testing method are also connected with the input terminals 110 of the drive circuit and are used for generating a test pattern.

Abstract translation: 本发明的实施例涉及一种用于利用图像元素的矩阵101驱动显示器的驱动电子装置。 用于通过控制线103产生用于驱动像素的信号的驱动电路102x和102y在接收区域104处在输入端110处被提供有信号。除了用于产生任意图像的接触区域之外还存在接触区域105 在测试方法的框架内使用。 用于测试方法的这些接触区域也与驱动电路的输入端子110连接，并用于产生测试图案。

公开(公告)号：US20100230936A1

公开(公告)日：2010-09-16

申请号：US12438912

申请日：2007-08-22

Applicant: Frank Bonarens ,  Dietmar Breidert ,  Matthias Brunner ,  Benjamin De Buysscher ,  Johannes Diehl ,  Mathias Grube ,  Waldemar Medla

Inventor： Frank Bonarens ,  Dietmar Breidert ,  Matthias Brunner ,  Benjamin De Buysscher ,  Johannes Diehl ,  Mathias Grube ,  Waldemar Medla

IPC: B60R21/20 ,  F16B37/04 ,  B23P11/00

CPC classification number: B60R21/213 ,  B60R21/232 ,  F16B37/043 ,  Y10T29/49963

Abstract: The invention relates to a method for securing an airbag (25) to a motor vehicle. Said method consists of the following steps: an airbag (25) that comprises a securing lug (20) and that can be filled with a gas is secured to a securing device (10) that comprises a plate (11) and an attachment device (16) that is secured to the plate. Said plate comprises a first plate section (12) having a first opening (14) provided with a screw thread (15) and a second plate section (13). Said attachment device (16) is secured to the first plate section (12) and the airbag is secured to the securing device (10) by bending the second plate section (13) in such a manner that the first plate section (12) and the second plate section (13) at least partially surround the securing lug (20) on both sides. The invention also relates to a securing device for an airbag, an airbag module and a motor vehicle.

Abstract translation: 本发明涉及一种将气囊（25）固定到机动车辆上的方法。 所述方法包括以下步骤：包括固定凸耳（20）并可填充有气体的气囊（25）固定到固定装置（10）上，所述固定装置包括板（11）和附接装置 16）固定到板上。 所述板包括具有设置有螺纹（15）和第二板部（13）的第一开口（14）的第一板部分（12）。 所述附接装置（16）固定到第一板部分（12），并且气囊通过使第二板部分（13）弯曲而固定到固定装置（10），使得第一板部分（12）和 第二板部分（13）至少部分地围绕两侧的固定凸耳（20）包围。 本发明还涉及一种用于气囊，气囊模块和机动车辆的固定装置。

公开(公告)号：US20080251019A1

公开(公告)日：2008-10-16

申请号：US11871510

申请日：2007-10-12

Applicant: SRIRAM KRISHNASWAMI ,  Hung T. Nguyen ,  George Tzeng ,  Matthias Brunner

Inventor： SRIRAM KRISHNASWAMI ,  Hung T. Nguyen ,  George Tzeng ,  Matthias Brunner

IPC: B05C11/00 ,  H01L21/02

CPC classification number: H01L21/6719 ,  H01L21/67201 ,  H01L21/67236 ,  H01L21/67748

Abstract: The present invention comprises a system and method for transferring a substrate into and out of a chamber configured to accommodate multiple substrates. In one embodiment, the system comprises a chamber housing that includes a first substrate support tray and a second substrate support tray independently movable along a vertical axis, and a substrate conveyor movable into and out of the chamber housing. The first substrate support tray and the second substrate support tray are movable to a position where a portion of the second substrate support tray is received in the first substrate support tray.

Abstract translation: 本发明包括用于将衬底转入和移出被配置为容纳多个衬底的室的系统和方法。 在一个实施例中，系统包括腔室壳体，其包括第一衬底支撑托盘和可沿着垂直轴线独立移动的第二衬底支撑托盘以及可移入和移出腔室壳体的衬底输送器。 第一基板支撑托盘和第二基板支撑托盘可移动到第二基板支撑托盘的一部分被容纳在第一基板支撑托盘中的位置。

公开(公告)号：US07375505B2

公开(公告)日：2008-05-20

申请号：US10115685

申请日：2002-04-04

Applicant: Matthias Brunner ,  Ralf Schmid

Inventor： Matthias Brunner ,  Ralf Schmid

IPC: G01R31/02

CPC classification number: G01R31/311 ,  G01R31/307

Abstract: A method and an apparatus for testing the function of a plurality of microstructural elements by irradiation with particle radiation. All of the microstructural elements detected as malfunctioning are listed in a first error list in a first test sequence. The microstructural elements listed in the first error list are tested once more in at least one further test sequence and at least the result of the test sequence last carried out is evaluated to establish the overall test result. The first test sequence is designed so that, if possible, all of the microstructural elements which are actually malfunctioning are detected. The invention further relates to a method for producing microstructural elements which are constructed as a plurality on a substrate and are tested according to the above test method.

Abstract translation: 一种用于通过用粒子辐射照射来测试多个微结构元件的功能的方法和装置。 检测为故障的所有微结构元件都列在第一个测试序列的第一个错误列表中。 在第一个错误列表中列出的微结构元素在至少一个进一步的测试序列中再次被测试，并且至少对上次执行的测试序列的结果进行评估以建立整体测试结果。 第一测试序列被设计成使得如果可能的话，检测到所有实际故障的微结构元件。 本发明还涉及一种用于制造在基板上多个构造并根据上述测试方法测试的显微结构元件的方法。

公开(公告)号：US20080061807A1

公开(公告)日：2008-03-13

申请号：US11940432

申请日：2007-11-15

Applicant: Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez (Frank) Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

Inventor： Matthias Brunner ,  Shinichi Kurita ,  Ralf Schmid ,  Fayez (Frank) Abboud ,  Benjamin Johnston ,  Paul Bocian ,  Emanuel Beer

IPC: G01R31/02

CPC classification number: G09G3/006 ,  G01R31/2893 ,  G01R31/305

Abstract: A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.

Abstract translation: 描述了一种在基板上测试电子器件的方法。 该方法包括将可配置的探测器放置在第一衬底上，测试第一衬底，重新配置可配置的探测器，将可配置的探测器放置在第二衬底上，以及测试第二衬底。

公开(公告)号：US07317325B2

公开(公告)日：2008-01-08

申请号：US11290932

申请日：2005-11-29

Applicant: Matthias Brunner ,  Young Seop Ko

Inventor： Matthias Brunner ,  Young Seop Ko

IPC: G01R31/00

CPC classification number: G09G3/006 ,  G01R31/2853 ,  G01R31/302 ,  G09G3/3648

Abstract: A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more signal lines having the short, locating one or more defective pixels disposed between the two or more signal lines having the short, and identifying the defective pixels as the location of the short.

Abstract translation: 一种用于识别具有多个薄膜晶体管和与该薄膜晶体管相关联的多个像素的衬底上的两条或更多条信号线之间的短路位置的方法和装置。 该方法包括定位两条或更多条信号线，该信号线具有设置在具有短路的两条或多条信号线之间的一个或多个缺陷像素，并且识别缺陷像素作为短路的位置。