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公开(公告)号:US20170356946A1
公开(公告)日:2017-12-14
申请号:US15606109
申请日:2017-05-26
Applicant: Micron Technology, Inc.
Inventor: Paul E. Gregory , Randon K. Richards
Abstract: The present disclosure includes apparatuses and methods related to test devices, for example testing devices by measuring signals emitted by a device. One example apparatus can include a first portion including a number of sidewalls positioned to at least partially surround a device under test; and a second portion electrically coupled to the first portion, wherein the second portion is configured to move in the x-direction, the y-direction, and z-direction.
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公开(公告)号:US12199068B2
公开(公告)日:2025-01-14
申请号:US17817690
申请日:2022-08-05
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Randon K. Richards , Aparna U. Limaye , Dong Soon Lim , Chan H. Yoo , Bret K. Street , Eiichi Nakano , Shijian Luo
IPC: H01L25/065 , H01L21/66 , H01L21/78 , H01L23/00 , H01L23/552 , H01L23/64 , H01L23/66 , H01L25/00 , H01L25/18 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate, each microelectronic device comprising an active surface having bond pads operably coupled to conductive traces extending over a dielectric material to via locations beyond at least one side of the stack, and vias extending through the dielectric materials at the via locations and comprising conductive material in contact with at least some of the conductive traces of each of the two or more electronic devices and extending to exposed conductors of the substrate. Methods of fabrication and related electronic systems are also disclosed.
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公开(公告)号:US11589480B2
公开(公告)日:2023-02-21
申请号:US17523750
申请日:2021-11-10
Applicant: Micron Technology, Inc.
Inventor: Thomas H. Kinsley , George E. Pax , Yogesh Sharma , Gregory A. King , Chan H. Yoo , Randon K. Richards
IPC: H05K7/20 , H01L23/367 , H01L23/373 , G06F1/20 , H01L23/467
Abstract: Systems, apparatuses, and methods for thermal dissipation on or from an electronic device are described. An apparatus may have a printed circuit board (PCB) having an edge connector. At least one integrated circuit device may be disposed on a surface of the PCB. A tubular heat spreader may be disposed along an edge of the PCB opposite the edge connector.
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公开(公告)号:US11456284B2
公开(公告)日:2022-09-27
申请号:US16939678
申请日:2020-07-27
Applicant: Micron Technology, Inc.
Inventor: Randon K. Richards , Aparna U. Limaye , Owen R. Fay , Dong Soon Lim
IPC: H01L23/48 , H01L23/52 , H01L29/40 , H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00 , H01L23/66 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate and the components are connected with conductive material in preformed holes in dielectric material in the bond lines aligned with TSVs of the devices and the exposed conductors of the substrate. Methods of fabrication are also disclosed.
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公开(公告)号:US20220071061A1
公开(公告)日:2022-03-03
申请号:US17523750
申请日:2021-11-10
Applicant: Micron Technology, Inc.
Inventor: Thomas H. Kinsley , George E. Pax , Yogesh Sharma , Gregory A. King , Chan H. Yoo , Randon K. Richards
IPC: H05K7/20 , H01L23/367 , H01L23/373 , G06F1/20 , H01L23/467
Abstract: Systems, apparatuses, and methods for thermal dissipation on or from an electronic device are described. An apparatus may have a printed circuit board (PCB) having an edge connector. At least one integrated circuit device may be disposed on a surface of the PCB. A tubular heat spreader may be disposed along an edge of the PCB opposite the edge connector.
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公开(公告)号:US20210367057A1
公开(公告)日:2021-11-25
申请号:US17391920
申请日:2021-08-02
Applicant: Micron Technology, Inc.
Inventor: Chan H. Yoo , George E. Pax , Yogesh Sharma , Gregory A. King , Thomas H. Kinsley , Randon K. Richards
IPC: H01L29/66 , H01L23/495 , H05K1/11 , H01L23/14 , H05K1/18
Abstract: Systems, apparatuses, and methods relating to memory devices and packaging are described. A device, such as a dual inline memory module (DIMM) or other electronic device package, may include a substrate with a layer of graphene configured to conduct thermal energy (e.g., heat) away from components mounted or affixed to the substrate. In some examples, a DIMM includes an uppermost or top layer of graphene that is exposed to the air and configured to allow connection of memory devices (e.g., DRAMs) to be soldered to the conducting pads of the substrate. The graphene may be in contact with parts of the memory device other than the electrical connections with the conducting pads and may thus be configured as a heat sink for the device. Other thin, conductive layers of may be used in addition to or as an alternative to graphene. Graphene may be complementary to other heat sink mechanisms.
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公开(公告)号:US20210118851A1
公开(公告)日:2021-04-22
申请号:US16939720
申请日:2020-07-27
Applicant: Micron Technology, Inc.
Inventor: Randon K. Richards , Owen R. Fay , Aparna U. Limaye , Dong Soon Lim
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate, each microelectronic device comprising an active surface operably coupled to conductive traces extending over a dielectric material to via locations beyond at least one side of the stack, at least one surface mount component operably coupled to conductive traces of at least one dielectric material, and vias extending through the dielectric materials at the via locations and comprising conductive material in contact with at least some of the conductive traces of each of the two or more electronic devices and extending to exposed conductors of the substrate.
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公开(公告)号:US10943628B2
公开(公告)日:2021-03-09
申请号:US16518767
申请日:2019-07-22
Applicant: Micron Technology, Inc.
Inventor: Randon K. Richards , Dirgha Khatri
IPC: G11C7/22 , G11C8/18 , G06F13/16 , G11C11/4076 , G11C11/4093
Abstract: Methods, systems, and apparatuses for managing clock signals at a memory device are described. A memory device or other component of a memory module or electronic system may offset a received clock signal. For example, the memory device may receive a clock signal that has a nominal speed or frequency of operation for a system, and the memory device may adjust or offset the clock signal based on other operating factors, such as the speed or frequency of other signals, physical constraints, indications received from a host device, or the like. A clock offset value may be based on propagation of, for example, command/address signaling. In some examples, a memory module may include a registering clock driver (RCD), hub, or local controller that may manage or coordinate clock offsets among or between various memory devices on the module. Clock offset values may be programmed to a mode register or registers.
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公开(公告)号:US20210035617A1
公开(公告)日:2021-02-04
申请号:US16530739
申请日:2019-08-02
Applicant: Micron Technology, Inc.
Inventor: Eric J. Stave , George E. Pax , Yogesh Sharma , Gregory A. King , Chan H. Yoo , Randon K. Richards , Timothy M. Hollis
Abstract: Systems, apparatuses, and methods for operating a memory device or devices are described. A memory device or module may introduce latency in commands to coordinate operations at the device or to improve timing or power consumption at the device. For example, a host may issue a command to a memory module, and a component or feature of the memory module may receive the command and modify the command or the timing of its execution in manner that is invisible or non-disruptive to the host while facilitating operations at the memory module. In some examples, components or features of a memory module may be disabled to effect or introduce latency in operation without affecting timing or operation of a host device. A memory module may operate in different modes that allow for different latencies; the use or introduction of latencies may not affect other features or operability of the memory module.
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公开(公告)号:US20210027816A1
公开(公告)日:2021-01-28
申请号:US16518767
申请日:2019-07-22
Applicant: Micron Technology, Inc.
Inventor: Randon K. Richards , Dirgha Khatri
Abstract: Methods, systems, and apparatuses for managing clock signals at a memory device are described. A memory device or other component of a memory module or electronic system may offset a received clock signal. For example, the memory device may receive a clock signal that has a nominal speed or frequency of operation for a system, and the memory device may adjust or offset the clock signal based on other operating factors, such as the speed or frequency of other signals, physical constraints, indications received from a host device, or the like. A clock offset value may be based on propagation of, for example, command/address signaling. In some examples, a memory module may include a registering clock driver (RCD), hub, or local controller that may manage or coordinate clock offsets among or between various memory devices on the module. Clock offset values may be programmed to a mode register or registers.
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