Abstract:
In a semiconductor device, parallel first and second conductive lines having a unit width extend from a memory cell region into a connection region. A trim region in the connection region includes pads respectively connected to the first and second conductive lines but are separated by a width much greater than the unit width.
Abstract:
Methods of fabricating semiconductor devices are provided including providing a substrate having a first region and a second region, the substrate defining trenches in the first and second regions; forming active fins on the first and second regions, the active fins protruding from the trenches in the first and second regions; forming spacers on sidewalls of the active fins in the first and second regions; recessing floors of the trenches under the spacers to provide extensions of the active fins; implanting impurities of a first type in the extensions of the active fins in the first region; and implanting impurities of a second, type, different from the first type, in the extensions of the active fins in the second region.
Abstract:
According to various examples, a method for providing, in an electronic device, an image can comprise the steps of: obtaining a first image of a subject by using a camera functionally connected to the electronic device; generating at least one image comprising a second image to be related to the first image; and concurrently displaying the first image on a first region of a display functionally connected to the electronic device, and the second image on a second region of the display.
Abstract:
A method of processing measurement information in which a determined parameter value is determined at each of a plurality of measurement times including determining a predicted parameter value at each of the measurement times, determining an error range at each of the measurement times based on the predicted parameter value, obtaining a measured parameter value at each of the measurement times, and determining the determined parameter value based on the predicted parameter value, the measured parameter value, and the error range.
Abstract:
A method of sharing a resource using a virtual device driver and an electronic device thereof are provided. The method includes generating a virtual device driver, which corresponds to a real device driver of a host electronic device, in the client electronic device, receiving a resource from the host electronic device by using the virtual device driver through a first communication mechanism designated in the host electronic device, and after the first communication mechanism is changed to a second communication mechanism designated in the host electronic device, receiving the resource from the host electronic device by using the virtual device driver.
Abstract:
Methods of fabricating semiconductor devices are provided including providing a substrate having a first region and a second region, the substrate defining trenches in the first and second regions; forming active fins on the first and second regions, the active fins protruding from the trenches in the first and second regions; forming spacers on sidewalls of the active fins in the first and second regions; recessing floors of the trenches under the spacers to provide extensions of the active fins; implanting impurities of a first type in the extensions of the active fins in the first region; and implanting impurities of a second, type, different from the first type, in the extensions of the active fins in the second region.