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21.
公开(公告)号:US11501823B2
公开(公告)日:2022-11-15
申请号:US16812850
申请日:2020-03-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sangyun Kim , Younghun Seo , Hyejung Kwon , Myungkyu Lee , Sunghye Cho
IPC: G11C11/4091 , G11C11/56 , G11C11/4074 , G06F11/10
Abstract: A semiconductor memory device includes a memory cell array, an ECC engine, a voltage generator and a control logic circuit. The memory cell array includes a plurality of memory cells coupled to word-lines and bit-lines, and a plurality of sense amplifiers to sense data stored in the plurality of memory cells. The ECC engine reads memory data from a target page of the memory cell array, performs an ECC decoding on the memory data, detects, based on the ECC decoding, an error in the memory data, and outputs error information associated with the error. The voltage generator provides driving voltages to the plurality of sense amplifiers, respectively. The control logic circuit controls the ECC engine, and controls the at least one voltage generator to increase an operating margin of each of the plurality of sense amplifiers based on error pattern information including the error information.
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公开(公告)号:US20220270661A1
公开(公告)日:2022-08-25
申请号:US17408454
申请日:2021-08-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sunghye Cho , Kijun Lee , Eunae Lee
IPC: G11C11/406 , G11C11/408 , G11C11/4091
Abstract: A memory device includes a memory cell array connected to a plurality of wordlines and a plurality of bitlines; a row decoder configured to select a wordline, among the plurality of wordlines, in response to a row address; a column decoder configured to corresponding bitlines, among the plurality of bitlines, in response to a column address; a sense amplification circuit having a plurality of amplifiers connected to the selected corresponding bitlines; a row hammer detector configured to generate a refresh row address when t the number of accesses to a row corresponding to the row address is a multiple of a predetermined value; and a refresh controller configured to perform a refresh operation on a row corresponding to the refresh row address. The row corresponding to the refresh row address is disposed adjacent to the row corresponding to the row address.
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公开(公告)号:US11068340B2
公开(公告)日:2021-07-20
申请号:US16792515
申请日:2020-02-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sanguhn Cha , Hoyoung Song , Myungkyu Lee , Sunghye Cho
IPC: G06F11/00 , G06F11/10 , G06F11/07 , G11C11/408 , G06F12/0882 , G06F13/16 , G11C11/406 , G06F11/30
Abstract: A semiconductor memory device includes a memory cell array, an error correction code (ECC) engine circuit, an error information register and a control logic circuit. The memory cell array includes memory cell rows. The control logic circuit controls the ECC engine circuit to generate an error generation signal based on performing a first ECC decoding on first sub-pages in a first memory cell row in a scrubbing operation and based on performing a second ECC decoding on second sub-pages in a second memory cell row in a normal read operation on the second memory cell row. The control logic circuit records error information in the error information register and controls the ECC engine circuit to skip an ECC encoding and an ECC decoding on a selected memory cell row of the first memory cell row and the second memory cell row based on the error information.
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公开(公告)号:US20210194508A1
公开(公告)日:2021-06-24
申请号:US16987554
申请日:2020-08-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Kijun Lee , Myungkyu Lee , Sunghye Cho , Chanki Kim , Yeonggeol Song
Abstract: A memory controller includes an error correction circuit and a central processing unit (CPU) to control the error correction circuit. The error correction circuit includes an error correction code (ECC) decoder and a memory to store a parity check matrix. The ECC decoder performs an ECC decoding on a codeword read from the memory module to: (i) generate a first syndrome and a second syndrome, (ii) generate a decoding mode flag associated with a type of errors in the codeword based on the second syndrome and a decision syndrome, (iii) operate in one of a first decoding mode and a second decoding mode based on the decoding mode flag, and (iv) selectively correct one of a chip error associated with one of the data chips and one or more symbol errors in the codeword.
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25.
公开(公告)号:US20210191810A1
公开(公告)日:2021-06-24
申请号:US16934677
申请日:2020-07-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sunghye Cho , Chanki Kim , Kijun Lee , Sanguhn Cha , Myungkyu Lee
IPC: G06F11/10 , H03M13/00 , H01L25/065 , H01L25/18
Abstract: A semiconductor memory device includes a memory cell array, an error correction circuit, an input/output (I/O) gating circuit and a control logic circuit. The memory cell array is coupled to word-line and bit-lines and is divided into sub array blocks. The error correction circuit generates parity data based on main data using an error correction code (ECC). The control logic circuit controls the error correction circuit and the I/O gating circuit based on a command and address. The control logic circuit stores the main data and the parity data in (k+1) target sub array blocks in the second direction among the sub array blocks, and controls the I/O gating circuit such that a portion of the (k+1) target sub array blocks store both of a portion of the main data and a portion of the parity data.
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26.
公开(公告)号:US20240233798A9
公开(公告)日:2024-07-11
申请号:US18327335
申请日:2023-06-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myungkyu Lee , Eunae Lee , Sunghye Cho , Kyomin Sohn , Kijun Lee
IPC: G11C11/406 , G06F12/02
CPC classification number: G11C11/406 , G06F12/0223
Abstract: A semiconductor memory device includes a memory cell array with a plurality of rows of memory cells therein, and a row hammer management (RHM) circuit including a hammer address queue. The RHM circuit is configured to: (i) receive first access row addresses from an external memory controller during a reference time interval, (ii) store a first row address randomly selected from the first access row addresses and second row addresses consecutively received from the memory controller after selecting the first row address, in the hammer address queue as candidate hammer addresses, and (iii) sequentially output the candidate hammer addresses as a hammer address. A refresh control circuit is provided to receive the hammer address and to perform a hammer refresh operation on one or more victim memory cell rows, which are physically adjacent to a memory cell row corresponding to the hammer address.
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27.
公开(公告)号:US20240185942A1
公开(公告)日:2024-06-06
申请号:US18482300
申请日:2023-10-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myungkyu Lee , Seongmuk Kang , Sunghye Cho , Daehyun Kim , Kyomin Sohn , Kijun Lee
Abstract: A memory device includes a memory cell array and an error correction code (ECC) circuit. The ECC circuit, which is configured to correct an error in a data code read out from the memory cell array, includes: (i) a syndrome calculating unit configured to operate a plurality of syndromes based on the data code and an H-matrix, (ii) an error location detecting unit configured to generate an error vector based on the plurality of syndromes, and (iii) an error correcting unit configured to correct an error within the data code based on the error vector, and output corrected data.
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28.
公开(公告)号:US20240135980A1
公开(公告)日:2024-04-25
申请号:US18327335
申请日:2023-05-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myungkyu Lee , Eunae Lee , Sunghye Cho , Kyomin Sohn , Kijun Lee
IPC: G11C11/406 , G06F12/02
CPC classification number: G11C11/406 , G06F12/0223
Abstract: A semiconductor memory device includes a memory cell array with a plurality of rows of memory cells therein, and a row hammer management (RHM) circuit including a hammer address queue. The RHM circuit is configured to: (i) receive first access row addresses from an external memory controller during a reference time interval, (ii) store a first row address randomly selected from the first access row addresses and second row addresses consecutively received from the memory controller after selecting the first row address, in the hammer address queue as candidate hammer addresses, and (iii) sequentially output the candidate hammer addresses as a hammer address. A refresh control circuit is provided to receive the hammer address and to perform a hammer refresh operation on one or more victim memory cell rows, which are physically adjacent to a memory cell row corresponding to the hammer address.
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公开(公告)号:US20240096395A1
公开(公告)日:2024-03-21
申请号:US18470471
申请日:2023-09-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sunghye Cho , Eunae Lee , Jungmin You , Yeonggeol Song , Kyomin Sohn , Kijun Lee , Myungkyu Lee
IPC: G11C11/406 , G11C11/4078
CPC classification number: G11C11/40622 , G11C11/40611 , G11C11/4078
Abstract: A device, an operating method of a memory controller, a memory device, and a compute express link (CXL) memory expansion device all for managing a row hammer are provided. The device includes a volatile memory and a memory controller that is configured to detect, based on input row addresses, a pattern size of a row hammer attack pattern and a row distribution of row hammer addresses, to determine, according to a type of the row distribution, whether to perform refresh management, and for every L access corresponding to the pattern size, to provide, to the volatile memory, a refresh management command and a target row address, where L is an integer greater than or equal to 1.
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公开(公告)号:US11881277B2
公开(公告)日:2024-01-23
申请号:US17718422
申请日:2022-04-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sungrae Kim , Myungkyu Lee , Kijun Lee , Sunghye Cho
CPC classification number: G11C29/44 , G06F11/1016 , G11C15/04 , G11C17/165 , H03M13/1108 , H03M13/1168 , H03M13/1575
Abstract: An operating method of a memory device includes storing position information regarding a codeword including an erasure and erasure information including position information regarding the erasure in a memory region, loading the position information regarding the codeword to a row decoder and a column decoder, determining whether a read address corresponding to a read instruction is identical to the position information regarding the codeword including the erasure, in response to the read instruction from a host, transmitting the position information of the erasure to an error correction code (ECC) decoder, when the read address is identical to the position information regarding the codeword including the erasure, and correcting, by the ECC decoder, an error in a codeword received from a memory cell array using the position information regarding the erasure.
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