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公开(公告)号：US07500029B2
公开(公告)日：2009-03-03
申请号：US10977230
申请日：2004-10-29
Applicant: Sivakumar Radhakrishnan , Siva Balasubramanian , Sin S. Tan , Suneeta Sah
Inventor： Sivakumar Radhakrishnan , Siva Balasubramanian , Sin S. Tan , Suneeta Sah
IPC: G06F3/00
CPC classification number: G06F13/385
Abstract: Detecting and flushing maximal length packets is set forth herein. In one embodiment, the method comprises receiving a flushing event and, in response to the flushing event, repeatedly detecting a maximum length packet of write data from a write combining storage area and flushing the detected maximum length packet to a target input/output (I/O) device over a bus. Each maximal length packet is a packet of maximum payload of write data that can be formulated within in the write combining storage area while adhering to packet protocol rules for the bus.
Abstract translation: 本文阐述了检测和刷新最大长度数据包。 在一个实施例中，该方法包括接收冲洗事件，并且响应于冲洗事件，重复地从写入组合存储区域检测写入数据的最大长度分组，并将检测到的最大长度分组刷新到目标输入/输出（I / O）设备。 每个最大长度分组是写入数据的最大有效载荷的分组，其可以在遵守用于总线的分组协议规则的情况下在写入组合存储区域中被表达。
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22.发明授权On-die temperature monitoring in semiconductor devices to limit activity overload 有权半导体器件中的管芯温度监控，以限制活动过载公开(公告)号：US07400945B2
公开(公告)日：2008-07-15
申请号：US11088445
申请日：2005-03-23
Applicant: Sivakumar Radhakrishnan , Michael Wiznerowicz , Jed D. Griffin , Kapilan Maheswaran , Scott Rushford , David J. Hotz
Inventor： Sivakumar Radhakrishnan , Michael Wiznerowicz , Jed D. Griffin , Kapilan Maheswaran , Scott Rushford , David J. Hotz
CPC classification number: G06F1/206 , G06F13/1668
Abstract: Thermal control for a controller in a data processing environment is described. In one embodiment, the invention includes detecting a temperature of a semiconductor device at a thermal sensor on the semiconductor device, comparing the detected temperature to a threshold, and generating a high interrupt if the temperature is above the threshold and a low interrupt if the temperature is below the threshold.
Abstract translation: 描述了数据处理环境中控制器的热控制。 在一个实施例中，本发明包括检测半导体器件上的热传感器上的半导体器件的温度，将检测到的温度与阈值进行比较，以及如果温度高于阈值则产生高中断，如果温度高于阈值则产生低中断 低于阈值。
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23.发明申请On-die temperature monitoring in semiconductor devices to limit activity overload 有权半导体器件中的管芯温度监控，以限制活动过载公开(公告)号：US20060242447A1
公开(公告)日：2006-10-26
申请号：US11088445
申请日：2005-03-23
Applicant: Sivakumar Radhakrishnan , Michael Wiznerowicz , Jed Griffin , Kapilan Maheswaran , Scott Rushford , David Hotz
Inventor： Sivakumar Radhakrishnan , Michael Wiznerowicz , Jed Griffin , Kapilan Maheswaran , Scott Rushford , David Hotz
IPC: G06F1/00
CPC classification number: G06F1/206 , G06F13/1668
Abstract: Thermal control for a controller in a data processing environment is described. In one embodiment, the invention includes detecting a temperature of a semiconductor device at a thermal sensor on the semiconductor device, comparing the detected temperature to a threshold, and generating a high interrupt if the temperature is above the threshold and a low interrupt if the temperature is below the threshold.
Abstract translation: 描述了数据处理环境中控制器的热控制。 在一个实施例中，本发明包括检测半导体器件上的热传感器上的半导体器件的温度，将检测到的温度与阈值进行比较，以及如果温度高于阈值则产生高中断，如果温度高于阈值则产生低中断 低于阈值。
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公开(公告)号：US20060136611A1
公开(公告)日：2006-06-22
申请号：US10750060
申请日：2003-12-30
Applicant: William Futral , Kenneth Creta , Sujoy Sen , Gregory Cummings , Sivakumar Radhakrishnan
Inventor： William Futral , Kenneth Creta , Sujoy Sen , Gregory Cummings , Sivakumar Radhakrishnan
IPC: G06F13/28
CPC classification number: G06F13/4027
Abstract: Apparatus and method for a first device to query a second device for the availability of a hardware feature within the second device, and for the second to receive and analyze the query to determine whether or not to respond, depending on the version of hardware feature sought, a code identifying a vendor, etc., and responding with a reply providing an indication of availability of the hardware feature and/or an address at which the hardware feature may be accessed, if the determination is made to reply.
Abstract translation: 用于第一设备的第二设备查询第二设备内的硬件特征的可用性的装置和方法，以及第二设备接收和分析查询以确定是否响应，取决于所寻求的硬件特征的版本 ，识别供应商等的代码，并且如果确定作出回复，则响应提供硬件特征的可用性的指示和/或可以访问硬件特征的地址。
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公开(公告)号：US20140189212A1
公开(公告)日：2014-07-03
申请号：US13976262
申请日：2011-09-30
Applicant: Thomas M. Slaight , Sivakumar Radhakrishnan , Mark Schmisseur , Pankaj Kumar , Saptarshi Mondal , Sin S. Tan , David C. Lee , Marc T. Jones , Geetani R. Edirisooriya , Bradley A. Burres , Brian M. Leitner , Kenneth C. Haren , Michael T. Klinglesmith , Matthew R. Wilcox , Eric J. Dahlen
Inventor： Thomas M. Slaight , Sivakumar Radhakrishnan , Mark Schmisseur , Pankaj Kumar , Saptarshi Mondal , Sin S. Tan , David C. Lee , Marc T. Jones , Geetani R. Edirisooriya , Bradley A. Burres , Brian M. Leitner , Kenneth C. Haren , Michael T. Klinglesmith , Matthew R. Wilcox , Eric J. Dahlen
CPC classification number: G06F13/28 , G06F3/061 , G06F3/0613 , G06F3/0619 , G06F3/0626 , G06F3/064 , G06F3/0646 , G06F3/065 , G06F3/0659 , G06F3/0688 , G06F3/0689 , G06F11/1068 , G06F12/0866 , G06F13/102 , G06F13/1668 , G06F13/4068 , G06F13/4282 , G06F2212/262 , G06F2213/0026 , G06F2213/0032
Abstract: In accordance with embodiments disclosed herein, there are provided methods, systems, mechanisms, techniques, and apparatuses for presentation of direct accessed storage under a logical drive model; for implementing a distributed architecture for cooperative NVM Data protection; data mirroring for consistent SSD latency; for boosting a controller's performance and RAS with DIF support via concurrent RAID processing; for implementing arbitration and resource schemes of a doorbell mechanism, including doorbell arbitration for fairness and prevention of attack congestion; and for implementing multiple interrupt generation using a messaging unit and NTB in a controller through use of an interrupt coalescing scheme.
Abstract translation: 根据本文公开的实施例，提供了用于在逻辑驱动器模型下呈现直接访问存储的方法，系统，机制，技术和装置; 实现用于协作NVM数据保护的分布式架构; 数据镜像，以保持一致的SSD延迟; 通过并发RAID处理来提升控制器的性能和支持DIF的RAS; 执行门铃机制的仲裁和资源计划，包括门铃仲裁以公平和防止冲突拥堵; 并且通过使用中断合并方案在控制器中实现使用消息传送单元和NTB的多个中断生成。
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Patent Agency Ranking
公开(公告)号：US08607129B2
公开(公告)日：2013-12-10
申请号：US13175500
申请日：2011-07-01
Applicant: Sivakumar Radhakrishnan , Mark A. Schmisseur , Sin S. Tan , Kenneth C. Haren , Thomas C. Brown , Pankaj Kumar , Vinodh Gopal , Wajdi K. Feghali
Inventor： Sivakumar Radhakrishnan , Mark A. Schmisseur , Sin S. Tan , Kenneth C. Haren , Thomas C. Brown , Pankaj Kumar , Vinodh Gopal , Wajdi K. Feghali
CPC classification number: G06F11/10 , G06F11/1076 , H03M1/1052 , H03M7/42 , H03M13/09 , H03M13/091 , H03M13/158 , H03M13/6575
Abstract: Embodiments of the present disclosure describe methods, apparatus, and system configurations for cyclic redundancy check circuits using Galois-field arithmetic.
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27.发明授权公开(公告)号：US08583984B2
公开(公告)日：2013-11-12
申请号：US12976247
申请日：2010-12-22
Applicant: Mark A. Schmisseur , Sivakumar Radhakrishnan , Pankaj Kumar , Marc A. Goldschmidt , Peter Molnar
Inventor： Mark A. Schmisseur , Sivakumar Radhakrishnan , Pankaj Kumar , Marc A. Goldschmidt , Peter Molnar
IPC: H03M13/00
CPC classification number: G06F11/1076
Abstract: A method and apparatus to enable data integrity checking of a block of data while the block of data is being transferred from a volatile memory to a non-volatile storage device is provided. The data integrity checking is performed in conjunction with Direct Memory Access operations and Redundant Array of Independent Disk (RAID) operations. In addition, data integrity checking of syndrome blocks in the RAID is performed during transfers to/from the storage devices in the RAID system and during RAID update and RAID data reconstruction operations.
Abstract translation: 提供了一种方法和装置，用于在数据块从易失性存储器传输到非易失性存储装置的同时使数据块的数据完整性检查得以实现。 数据完整性检查与直接内存访问操作和独立磁盘冗余阵列（RAID）操作一起执行。 此外，在向RAID系统的存储设备传输期间以及在RAID更新和RAID数据重建操作期间执行RAID中的校验块的数据完整性检查。
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28.发明申请EFFICIENT AND SCALABLE CYCLIC REDUNDANCY CHECK CIRCUIT USING GALOIS-FIELD ARITHMETIC 有权有效和可扩展的循环冗余使用GALOIS-FIELD ARTIMETIC检查电路公开(公告)号：US20130007573A1
公开(公告)日：2013-01-03
申请号：US13175500
申请日：2011-07-01
Applicant: Sivakumar Radhakrishnan , Mark A. Schmisseur , Sin S. Tan , Kenneth C. Haren , Thomas C. Brown , Pankaj Kumar , Vinodh Gopal , Wajdi K. Feghali
Inventor： Sivakumar Radhakrishnan , Mark A. Schmisseur , Sin S. Tan , Kenneth C. Haren , Thomas C. Brown , Pankaj Kumar , Vinodh Gopal , Wajdi K. Feghali
CPC classification number: G06F11/10 , G06F11/1076 , H03M1/1052 , H03M7/42 , H03M13/09 , H03M13/091 , H03M13/158 , H03M13/6575
Abstract: Embodiments of the present disclosure describe methods, apparatus, and system configurations for cyclic redundancy check circuits using Galois-field arithmetic.
Abstract translation: 本公开的实施例描述了使用伽罗瓦域算术的循环冗余校验电路的方法，装置和系统配置。
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公开(公告)号：US08275560B2
公开(公告)日：2012-09-25
申请号：US12557263
申请日：2009-09-10
Applicant: Sivakumar Radhakrishnan , Sin S. Tan , Stephan J. Jourdan , Lily P. Looi , Yi-Feng Liu
Inventor： Sivakumar Radhakrishnan , Sin S. Tan , Stephan J. Jourdan , Lily P. Looi , Yi-Feng Liu
CPC classification number: G06F1/3203 , G06F1/3237 , Y02D10/128 , Y02D50/20
Abstract: A method and system to enable power measurements of a system-on-chip in various modes. In one embodiment of the invention, the system-on-chip has full controllability of its logic and circuitry to facilitate configuration of the system-on-chip into a desired mode of operation. This allows hooks or interfaces to access the system-on-chip externally for measurements. For example, in one embodiment of the invention, the hooks in the system-on-chip allow a backend tester to configure the system-on-chip into various modes easily to perform power consumption measurements of one or more individual components of the system-on-chip. The power consumption measurement of the individual components in the system-on-chip can be performed faster and can be more accurate. In addition, the overall yield of the SOC can be increased as it is easier to detect failure parts.
Abstract translation: 一种能够以各种模式对片上系统进行功率测量的方法和系统。 在本发明的一个实施例中，片上系统具有其逻辑和电路的完全可控性，以便于将片上系统配置成期望的操作模式。 这允许钩子或接口在外部访问片上系统进行测量。 例如，在本发明的一个实施例中，片上系统中的钩子允许后端测试器将片上系统配置成各种模式，以便简单地执行系统级芯片的一个或多个单独部件的功耗测量， 片上 片上系统中各个组件的功耗测量可以更快地执行，并且可以更准确。 另外，由于易于检测故障部件，所以能够提高SOC的整体产量。
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30.发明申请公开(公告)号：US20120166909A1
公开(公告)日：2012-06-28
申请号：US12976247
申请日：2010-12-22
Applicant: Mark A. Schmisseur , Sivakumar Radhakrishnan , Pankaj Kumar , Marc A. Goldschmidt , Peter Molnar
Inventor： Mark A. Schmisseur , Sivakumar Radhakrishnan , Pankaj Kumar , Marc A. Goldschmidt , Peter Molnar
IPC: G11C29/00
CPC classification number: G06F11/1076
Abstract: A method and apparatus to enable data integrity checking of a block of data while the block of data is being transferred from a volatile memory to a non-volatile storage device is provided. The data integrity checking is performed in conjunction with Direct Memory Access operations and Redundant Array of Independent Disk (RAID) operations. In addition, data integrity checking of syndrome blocks in the RAID is performed during transfers to/from the storage devices in the RAID system and during RAID update and RAID data reconstruction operations.
Abstract translation: 提供了一种方法和装置，用于在数据块从易失性存储器传输到非易失性存储装置的同时使数据块的数据完整性检查得以实现。 数据完整性检查与直接内存访问操作和独立磁盘冗余阵列（RAID）操作一起执行。 此外，在向RAID系统的存储设备传输期间以及在RAID更新和RAID数据重建操作期间执行RAID中的校验块的数据完整性检查。
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