Abstract:
A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
Abstract:
Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.
Abstract:
An electronic switch includes a substrate and a rotator assembly. The rotator assembly is configured to prevent rotation between a first rotational configuration and a second rotational configuration in a first translational position of the rotator assembly, while the rotator assembly is configured to rotate between the first rotational configuration and the second rotational configuration in a second translational position of the rotator assembly. The second translational position of the rotator assembly is translationally offset from the first translational position of the rotator assembly. An electrical contact of the rotator assembly is configured to electrically connect an electronic input path of the substrate to an electronic output path of the substrate in the first rotational configuration and first translational position of the rotator assembly, but not to electrically connect the electronic input path to the electronic output path in the second rotational configuration of the rotator assembly or in the second translational position of the rotator assembly.
Abstract:
A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.
Abstract:
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Abstract:
A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal, a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal, a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers, and a linear time-periodic filter configured to receive the digitized mixed signal from each of the digitizers and output a time-interleaved signal. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from a sample rate of at least one of the digitizers.
Abstract:
A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal, a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal, a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers, and a linear time-periodic filter configured to receive the digitized mixed signal from each of the digitizers and output a time-interleaved signal. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from a sample rate of at least one of the digitizers.
Abstract:
A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers.
Abstract:
A test and measurement instrument, including an input configured to receive a signal-under-test, a user input configured to accept a first trigger event and a second trigger event from a user, a first trigger decoder configured to trigger on an occurrence of the first trigger event and generate a first trigger signal, a second trigger decoder configured to trigger on an occurrence of the second trigger event occurring after the first trigger event and generate a second trigger signal, and an acquisition system configured to acquire the signal-under-test in response to the first trigger signal and store the acquired signal-under-test based on whether the second trigger signal validates or invalidates the first trigger signal.
Abstract:
A ring oscillator timer circuit can include a plurality of electrical components arranged in a cascaded combination of delay stages connected in a closed loop chain. The timer circuit can begin oscillation a programmable number of gate delays after receiving a start signal. In some examples, the number of gate delays can be programmed to fractional values. In further examples, the ring oscillator timer circuit can include a counter having an input electrically coupled to an output of a reset component.