Abstract:
A device for measuring a spectrum of a light beam, in a wavelength range chosen beforehand, the spectrum being generated by a sample to be analyzed, the optical measuring device including at least one light source, a measurement cell and a measurement detector placed on a measurement optical pathway, the measurement optical pathway being taken by a measurement optical beam emitted by the light source, and encountering the measurement cell, a self-calibration unit allowing any drift of the light sources, due to environmental conditions or conditions of use, to be taken into account independently of whether a sample to be analyzed is present in or absent from the measurement cell, the self-calibration unit including elements for creating a reference optical pathway, taken by a reference optical beam emitted by the light source, and not encountering the measurement cell, and a reference detector.
Abstract:
Disclosed is a system and methodologies for providing self-calibration in an optical analysis system. Illumination light is directed toward a material to be sampled while provisions are made to modify the characteristics of at least a portion of the illumination light falling on a reference detector. The modified characteristics may include light presence and/or spectral characteristics. Light presence may be modified by rotating or moving mirror assemblies to cause light to fall on either a sample detector or a reference detector while spectral characteristics may be modified by placing materials having known spectral characteristics in the path of the illumination light.
Abstract:
This invention is to make the detection sensitivities as even as possible among a plurality of specimens to be inspected in an analyzer that leads light transmitted from the plurality of specimens to be inspected to a single spectrometer via optical fibers, the analyzer includes first and second light guide members provided for every first and second specimen to be inspected so as to lead the light obtained from each of the specimens to be inspected to a photo-detecting part, and light projection side end portions of a plurality of optical fiber elements composing the first and second light guide members are arranged in mixture.
Abstract:
A digital imaging device comprising a light source, a pixel array detector having a rolling shutter functionality, a spatial light modulator configured to produce one or more modulation patterns during a frame exposure of the pixel array detector, and at least one timing signal configured to control a spatial-temporal relationship between a rolling shutter of the pixel array detector and the one or more modulation patterns provided by the spatial light modulator.
Abstract:
The present invention relates to an arrangement for a selection of a wavelength including a wavelength source for providing a plurality of wavelengths, a wavelength selector for allowing a selection of a desired wavelength from the wavelength source, and a wavelength detector to detect a selected wavelength for subsequent use.
Abstract:
A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.
Abstract:
A cartridge and cartridge system for use in an apparatus for analyzing a sample are provided. The system has a plurality of cartridges for different applications for a multimode instrument. The cartridges are removably engaged with a cartridge support of the apparatus in a “plug-in” format such that one cartridge may be removed from the apparatus and another cartridge may be easily installed. The cartridge support includes a plurality of cartridge positions that receive cartridges concurrently. One of the cartridges may be a luminescence cartridge that includes an integrated detector that is movable toward and away from a sample carrier of the apparatus, and thus toward and away from a sample located at the sample carrier.
Abstract:
A device for measuring a spectrum of a light beam, in a wavelength range chosen beforehand, the spectrum being generated by a sample to be analyzed, the optical measuring device including at least one light source, a measurement cell and a measurement detector placed on a measurement optical pathway, the measurement optical pathway being taken by a measurement optical beam emitted by the light source, and encountering the measurement cell, a self-calibration unit allowing any drift of the light sources, due to environmental conditions or conditions of use, to be taken into account independently of whether a sample to be analyzed is present in or absent from the measurement cell, the self-calibration unit including elements for creating a reference optical pathway, taken by a reference optical beam emitted by the light source, and not encountering the measurement cell, and a reference detector.
Abstract:
The apparatus for reading spectral information out of image patterns includes a solid-state image sensor for taking pictures of image patterns, a unit for making one-dimensional images out of lights having reflected at the image patterns, a spectroscope introducing the one-dimensional images into the solid-state image sensor, a shutter unit located in front of the solid-state image sensor, and a synchronizer turning the shutter unit on or off in synchronization with movement of the image patterns, the spectroscope disperses lights having entered thereinto into each of wavelengths, and makes three-dimensional image spectrum which is wavelength dispersive for each of pixels in association with each of locations of the image patterns.
Abstract:
The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.