公开(公告)号：US20090015818A1

公开(公告)日：2009-01-15

申请号：US11913301

申请日：2006-05-02

Applicant: Seiichi Ikeda ,  Toshio Fukuda ,  Ikuo Takahashi

Inventor： Seiichi Ikeda ,  Toshio Fukuda ,  Ikuo Takahashi

IPC: G01B11/16

CPC classification number: G01L1/241 ,  A61B2017/00725 ,  B33Y80/00 ,  G09B23/28 ,  G09B23/285 ,  G09B23/30

Abstract: It is possible to observe a state of stress applied to a region around a cavity replicating a body cavity such as a blood vessel and the like in a three-dimensional model. In catheter insert simulation, when stress is applied to the region around the cavity in the three-dimensional model, it is possible to observe the catheter state together with a photoelastic effect corresponding to the stress state in the surrounding region caused by the catheter.

Abstract translation: 可以观察在三维模型中施加到复制诸如血管等体腔的空腔周围的区域的应力状态。 在导管插入模拟中，当对三维模型中的腔周围的应力施加应力时，可以观察导管状态以及对应于由导管引起的周围区域的应力状态的光弹性效应。

公开(公告)号：US20090012431A1

公开(公告)日：2009-01-08

申请号：US11814450

申请日：2006-01-11

Applicant: Koji Hyodo ,  Chao-Nan Xu

Inventor： Koji Hyodo ,  Chao-Nan Xu

IPC: A61B5/103 ,  A61B19/00 ,  A61H33/00

CPC classification number: A61F2/4657 ,  A61B5/4504 ,  A61B5/4528 ,  A61F2/36 ,  A61F2/3662 ,  A61F2002/3631 ,  A61F2002/4632 ,  A61F2002/4666 ,  G01L1/241 ,  G09B23/30 ,  G09B23/32

Abstract: When visualizing the stress distribution of natural bone, synthetic bone, or a member attached to either thereof without omitted points, in order to measure accurately in a variety of modes using an inexpensive system, a mechanoluminescence material thin film 6 is formed in advance on a bone material peripheral surface 5 in an appropriate area thereof including the portion where an insertion support portion 4 of an artificial hip prosthesis 2 is inserted into a hollow inside 3 of a damaged femur 1 or a synthetic bone simulating the damaged femur. The mechanoluminescence material thin film 6 portion is photographed over its entire circumference with an IICCD camera 7 from the external peripheral side thereof as or after the artificial hip prosthesis 2 is inserted. The obtained image is fed to a computer 11 to obtain a luminescence image 8. The computer 11 outputs the intensities of the received light in the form of an image as is, so that the luminescence image 8 can be obtained easily. Particularly, the data about the intensities of the received light can be used as stress/strain data virtually as is. Such method is also suitable for dynamic analysis.

Abstract translation: 当可视化天然骨骼，合成骨骼或附着于其中的部件的应力分布而不省略时，为了使用廉价的系统以各种模式精确地测量，机械发光材料薄膜6预先形成在 骨材料周边表面5在其适当的区域中，包括将人造髋假体2的插入支撑部分4插入损伤股骨1的中空内侧3中的部分或模拟受损股骨的合成骨。 机械发光材料薄膜6部分在其人造髋假体2插入之后或之后，利用来自其外周侧的IICCD照相机7在其整个圆周上进行拍照。 所获得的图像被馈送到计算机11以获得发光图像8.计算机11原样输出图像形式的接收光的强度，使得可以容易地获得发光图像8。 特别地，关于接收光的强度的数据可以被虚拟地用作应力/应变数据。 这种方法也适用于动态分析。

公开(公告)号：US20070273865A1

公开(公告)日：2007-11-29

申请号：US10586148

申请日：2004-03-05

Applicant: Yasushi Niitsu ,  Kensuke Ichinose ,  Kenji Gomi

Inventor： Yasushi Niitsu ,  Kensuke Ichinose ,  Kenji Gomi

IPC: G01B11/16

CPC classification number: G01L5/0047 ,  G01L1/241

Abstract: The stress of a sample semiconductor wafer is detected with high accuracy in the form of an absolute value without rotating the sample or the entire optical system. A laser light R is subjected to photoelastic modulation in a PEM 6 to generate a birefringence phase difference and then it is passed through first and second quarter wavelength plates and detected. This reference signal data is stored in a signal processor. The laser light R of polarized wave subjected to photoelastic modulation in the PEM 6 and passed through the quarter wavelength plate has a birefringence phase difference and passes through a semiconductor wafer D having residual stress. When it is passed through a test piece, the direction of the stress of the test piece is detected when the angle between the laser light R and a linear polarization light is 0 and 90 degrees. The transmitted electric signal is delivered to an analog/digital converter 16, and the signal from which is input to a signal processor thus generating transmission signal data. The signal processor reads out the stored reference signal data and the transmission signal data and calculates there from a reference birefringence phase difference and the absolute values of the birefringence phase difference.

Abstract translation: 以绝对值的形式高精度地检测样品半导体晶片的应力，而不旋转样品或整个光学系统。 激光R在PEM6中进行光弹性调制以产生双折射相位差，然后通过第一和第二四分之一波长板并检测。 该参考信号数据存储在信号处理器中。 在PEM6中经过光弹性调制并通过四分之一波长板的偏振波的激光R具有双折射相位差并通过具有残余应力的半导体晶片D. 当通过试片时，当激光R和线偏振光之间的角度为0度和90度时，检测试片的应力方向。 发送的电信号被传送到模拟/数字转换器16，并且其信号被输入到信号处理器，从而产生发送信号数据。 信号处理器读出存储的参考信号数据和发送信号数据，并从参考双折射相位差和双折射相位差的绝对值计算出。

公开(公告)号：US20060253942A1

公开(公告)日：2006-11-09

申请号：US10542697

申请日：2004-01-23

Applicant: Enrique Barrera ,  Satish Nagarajaiah ,  Prasad Dharap ,  Li Zhiling ,  Jong Kim

Inventor： Enrique Barrera ,  Satish Nagarajaiah ,  Prasad Dharap ,  Li Zhiling ,  Jong Kim

IPC: G21K7/00

CPC classification number: G01D5/12 ,  B82Y15/00 ,  G01K11/20 ,  G01L1/005 ,  G01L1/2287 ,  G01L1/2293 ,  G01L1/241

Abstract: The present invention is directed toward devices comprising carbon nanotubes that are capable of detecting displacement, impact, stress, and/or strain in materials, methods of making such devices, methods for sensing/detecting/monitoring displacement, impact, stress, and/or strain via carbon nanotubes, and various applications for such methods and devices. The devices and methods of the present invention all rely on mechanically-induced electronic perturbations within the carbon nanotubes to detect and quantify such stress/strain. Such detection and quantification can rely on techniques which include, but are not limited to, electrical conductivity/conductance and/or resistivity/resistance detection/measurements, thermal conductivity detection/measurements, electroluminescence detection/measurements, photoluminescence detection/measurements, and combinations thereof. All such techniques rely on an understanding of how such properties change in response to mechanical stress and/or strain.

Abstract translation: 本发明涉及包括能够检测材料中的位移，冲击，应力和/或应变的碳纳米管的装置，制造这种装置的方法，用于感测/检测/监测位移，冲击，应力和/或 通过碳纳米管的应变，以及用于这种方法和装置的各种应用。 本发明的装置和方法都依赖于碳纳米管内机械诱导的电子扰动来检测和量化这种应力/应变。 这种检测和定量可以依赖于包括但不限于导电性/电导性和/或电阻率/电阻检测/测量，热导率检测/测量，电致发光检测/测量，光致发光检测/测量及其组合的技术 。 所有这些技术都依赖于对这些性质如何响应于机械应力和/或应变而变化的理解。

公开(公告)号：US07022988B2

公开(公告)日：2006-04-04

申请号：US10467303

申请日：2001-02-28

Applicant: Yoshifumi Taniguchi ,  Mikio Ichihashi ,  Masanari Kouguchi

Inventor： Yoshifumi Taniguchi ,  Mikio Ichihashi ,  Masanari Kouguchi

IPC: H01J37/26

CPC classification number: H01J37/28 ,  G01L1/241 ,  G01L5/0047 ,  G01N23/20 ,  G01N23/20058 ,  G01N23/2251 ,  H01J37/2955 ,  H01J2237/24585 ,  H01J2237/2544 ,  H01J2237/2813 ,  H01L22/12 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A method and apparatus for measuring the physical properties of a micro region measures the two-dimensional distribution of stress/strain in real time at high resolution and sensitivity and with a high level of measuring position matching. A sample is scanned and irradiated with a finely focused electron beam (23, 26), and the displacement of position of a diffraction spot (32, 33) is measured by a two-dimensional position-sensitive electron detector (13). The displacement amount is outputted as a voltage value that is then converted into the magnitude of the stress/strain according to the principle of a nano diffraction method, and the magnitude is displayed in synchronism with a sample position signal.

Abstract translation: 用于测量微区物理特性的方法和装置以高分辨率和灵敏度实时测量应力/应变的二维分布以及高水平的测量位置匹配。 扫描样品并用精细聚焦的电子束（23,26）照射，并且通过二维位置敏感电子检测器（13）测量衍射光斑（32,33）的位置位移。 将位移量作为电压值输出，然后根据纳米衍射方法的原理将其转换为应力/应变的大小，并且与样本位置信号同步地显示幅度。

公开(公告)号：US20050087021A1

公开(公告)日：2005-04-28

申请号：US10764263

申请日：2004-01-23

Applicant: Gregory Crawford ,  Darran Cairns ,  Christopher Bowley ,  Sorasak Danworaphong ,  Adam Fontecchio ,  Sadeg Faris ,  Le Li

Inventor： Gregory Crawford ,  Darran Cairns ,  Christopher Bowley ,  Sorasak Danworaphong ,  Adam Fontecchio ,  Sadeg Faris ,  Le Li

IPC: G01B11/16 ,  G01L1/24 ,  G02F1/1334

CPC classification number: G01B11/165 ,  G01B11/18 ,  G01L1/241 ,  G02F1/13342

Abstract: A reflective strain gauge includes an holographically-formed polymer dispersed liquid crystal (H-PDLC) film comprising layers of liquid crystal (LC) droplets in a matrix polymer, the H-PDLC film having a reflection or transmission grating capable of reflecting or transmitting light of a selected wavelength, and means for adhering the film to a surface of a workpiece for monitoring the strain at said surface. A change in the nature of the reflected light is an indication of strain. Also included is a polarizing material having an holographically-formed polymer dispersed liquid crystal (H-PDLC) film comprising layers of liquid crystal (LC) droplets in a matrix polymer, the H-PDLC film having a reflection grating capable of reflecting light of a selected wavelength, wherein the reflection grating of the H-PDLC film is oriented, such that the refractive index parallel to said axis of orientation (ne) is greater than the refractive index perpendicular to said axis (no).

Abstract translation: 反射应变计包括在基质聚合物中包含液晶（LC）液滴层的全息形成的聚合物分散液晶（H-PDLC）膜，该H-PDLC膜具有能够反射或透射光的反射或透射光栅 以及用于将膜粘附到工件的表面以用于监测所述表面处的应变的装置。 反射光的性质的变化表明了应变。 还包括具有在基体聚合物中包含液晶（LC）液滴层的全息形成的聚合物分散液晶（H-PDLC）膜的偏振材料，该H-PDLC膜具有能够反射光的反射光栅 选择的波长，其中所述H-PDLC膜的反射光栅被取向，使得平行于所述取向轴（n）的折射率大于垂直于所述轴线的折射率（n ）。

公开(公告)号：US06710882B2

公开(公告)日：2004-03-23

申请号：US09903999

申请日：2001-07-12

Applicant: Tomiichi Hasegawa

Inventor： Tomiichi Hasegawa

IPC: G01B902

CPC classification number: G01L1/241 ,  G01N21/21 ,  G01N21/45

Abstract: A light beam from a laser source is divided into two light beams at a half mirror, and the plane of polarization of one of the two divided light beams is rotated by 90 degrees at a half-wave plate so as to be orthogonal to that of the other of the two divided light beams. The two divided light beams are superimposed and introduced into a sample to be measured in anisotropy. After passing through the sample, the superimposed light beam is split at a polarized light beam splitter into the above two light beams, and the plane of polarization of the other of the two light beam is rotated by 90 degrees at a half-wave plate so as to correspond to that of the one of the two light beams. Then, the two light beams is superimposed again at a half mirror, and an interference pattern of the superimposed light beam is projected on a screen.

Abstract translation: 来自激光源的光束被分成半反射镜的两个光束，两个分开的光束中的一个的偏振平面在半波片上旋转90度，以与 另外两个分开的光束。 将两个分开的光束叠加并引入到各向异性测量的样品中。 在通过样本之后，将叠加的光束在偏振光分束器处分裂成上述两个光束，并且两个光束中另一个的另一个的偏振面在半波片处旋转90度，因此 对应于两个光束中的一个。 然后，两个光束再次叠加在半反射镜上，并且叠加的光束的干涉图案被投影在屏幕上。

公开(公告)号：US06219139B1

公开(公告)日：2001-04-17

申请号：US09412254

申请日：1999-10-05

Applicant: Jon R. Lesniak

Inventor： Jon R. Lesniak

IPC: G01J400

CPC classification number: G01L1/241

Abstract: A structural specimen coated with or constructed of photoelastic material, when illuminated with circularly polarized light will, when stressed; reflect or transmit elliptically polarized light, the direction of the axes of the ellipse and variation of the elliptically light from illuminating circular light will correspond to and indicate the direction and magnitude of the shear stresses for each illuminated point on the specimen. The principles of this invention allow for several embodiments of stress analyzing apparatus, ranging from those involving multiple rotating optical elements, to those which require no moving parts at all. A simple polariscope may be constructed having two polarizing filters with a single one-quarter waveplate placed between the polarizing filters. Light is projected through the first polarizing filter and the one-quarter waveplate and is reflected from a sub-fringe birefringent coating on a structure under load. Reflected light from the structure is analyzed with a polarizing filter. The two polarizing filters and the one-quarter waveplate may be rotated together or the analyzer alone may be rotated. Computer analysis of the variation in light intensity yields shear stress magnitude and direction.

Abstract translation: 用光弹性材料涂覆或构造的结构试样，当用圆偏振光照射时，会受到压力; 反射或透射椭圆偏振光，椭圆轴的方向和照明圆形光的椭圆偏振将对应于并指示样品上每个照明点的剪切应力的方向和大小。 本发明的原理允许应力分析装置的几个实施例，从涉及多个旋转光学元件的那些到完全不需要移动部件的那些。 可以构造简单的偏振器，其具有两个偏振滤光器，其中放置有偏振滤光片之间的单个四分之一波片。 光通过第一偏振滤光器和四分之一波片投影，并且在负载下的结构上的副边缘双折射涂层反射。 用偏振滤光片分析来自结构的反射光。 两个偏振滤光器和四分之一波片可以一起旋转，或者单独的分析仪可以旋转。 光强变化的计算机分析产生剪切应力的大小和方向。

公开(公告)号：US06173091B2

公开(公告)日：2001-01-09

申请号：US09482446

申请日：2000-01-11

Applicant: Stanley M. Reich

Inventor： Stanley M. Reich

IPC: G01L124

CPC classification number: G01L1/241 ,  G01B11/161 ,  G01L1/242

Abstract: Absolute strain is measured by providing a coherent beam of light and separating the coherent beam of light into first and second beams which are in quadrature with one another and which have different polarization angles. The first and second beams are combined in a manner which maintains the different polarization angles thereof, so as to form a combined beam. The combined beam is then applied to a Fabry-Perot strain sensor so as to form a reflected combined beam. The reflected combined beam is then separated into first and second reflected beams having different polarization angles. The intensity of the first and second reflected beams is then sensed, so as to determine a change in the etalon length of the Fabry-Perot sensor. The change in etalon length is indicative of the absolute strain sensed.

Abstract translation: 通过提供相干的光束并将相干光束分离成彼此正交且具有不同偏振角的第一和第二光束来测量绝对应变。 第一和第二光束以维持其不同偏振角的方式组合，以便形成组合光束。 然后将组合的光束施加到法布里 - 珀罗应变传感器，以形成反射的组合光束。 然后将反射的组合光束分离成具有不同偏振角的第一和第二反射光束。 然后感测第一和第二反射光束的强度，以便确定法布里 - 珀罗传感器的标准具长度的变化。 标准具长度的变化表示感测到的绝对应变。

公开(公告)号：US5589931A

公开(公告)日：1996-12-31

申请号：US406331

申请日：1995-03-17

Applicant: William R. Rapoport ,  Janpu Hou

Inventor： William R. Rapoport ,  Janpu Hou

IPC: G01L1/24 ,  G01L11/02 ,  G01B11/16

CPC classification number: G01L1/241 ,  G01L11/02

Abstract: A cladded birefringent pressure sensor for use in a pressure-sensing system. The sensor is a single composite plate consisting of two plates each with different indices of refraction. One surface of the sensor is exposed to the environmental pressure under measurement. A collimated broad band light source is transmitted via a fiber optic cable, a polarizer and a birefringent bias element which transmits a wavelength/polarization component of light through the sensor. An external force applied to the sensor adds a stress-induced component to the polarized lightwave. The lightwave exits the sensor and is captured by a second polarizer producing a modulated light spectrum. A focusing element collects the light and transmits it down another fiber optic cable. The cable transmits the light to an opto-electronic interface where the fringe pattern is extracted and a computer compatible signal is generated for a CPU. The CPU performs a Fourier transform on the fringe pattern, where the phase term for a selected frequency is the measure of the externally applied pressure on the sensor.

Abstract translation: 用于压力感测系统的包层双折射压力传感器。 传感器是由两个板组成的单个复合板，每个板具有不同的折射率。 传感器的一个表面暴露于测量下的环境压力。 准直的宽带光源通过光纤电缆，偏振器和透射通过传感器的光的波长/偏振分量的双折射偏置元件传输。 施加到传感器的外力对偏振光波增加应力诱导分量。 光波出射传感器，并由第二偏振器捕获，产生调制光谱。 聚焦元件收集光并将其传输到另一根光纤电缆上。 电缆将光线传输到提取条纹图案的光电接口，并为CPU生成计算机兼容信号。 CPU对条纹图案执行傅里叶变换，其中所选频率的相位项是传感器上外部施加的压力的量度。