公开(公告)号：US09230791B2

公开(公告)日：2016-01-05

申请号：US14358809

申请日：2011-11-28

Applicant: Hyun Sik Kim ,  Seung Young Kim ,  Mo Yang

Inventor： Hyun Sik Kim ,  Seung Young Kim ,  Mo Yang

IPC: H01J49/08 ,  H01J49/10 ,  H01J43/04 ,  H01J49/00 ,  H01J49/42 ,  H01J27/02 ,  H01J49/14 ,  H01J43/24 ,  H01J49/38

CPC classification number: H01J49/08 ,  H01J27/028 ,  H01J43/04 ,  H01J43/246 ,  H01J49/0045 ,  H01J49/0054 ,  H01J49/10 ,  H01J49/147 ,  H01J49/38 ,  H01J49/426

Abstract: An anion generating and electron capture dissociation apparatus using cold electrons, which comprises a cold electron generation module configured to generate a large quantity of cold electrons from ultraviolet photons radiated into a mass spectrometer vacuum chamber which is in a high vacuum state has a plurality of ultraviolet diodes configured to emit the ultraviolet photons in the mass spectrometer vacuum chamber. Micro-channel plate (MCP) electron multiplier plates induce and amplify initial electron emissions of the ultraviolet photons from the ultraviolet diodes, and generate a large quantity of electron beams from a rear plate. An electron focusing lens is configured to focus the electron beams amplified through the MCP electron multiplier plates. A grid is configured to adjust energy and an electric current of the electron beams together with the electron focusing lens.

Abstract translation: 使用冷电子的阴离子产生和电子捕获解离装置，其包括被配置为从辐射到处于高真空状态的质谱仪真空室的紫外光子产生大量冷电子的冷电子发生模块，具有多个紫外线 配置为在质谱仪真空室中发射紫外光子的二极管。 微通道板（MCP）电子倍增板诱导和放大来自紫外二极管的紫外光子的初始电子发射，并从背板产生大量的电子束。 电子聚焦透镜被配置为聚焦通过MCP电子倍增器板放大的电子束。 栅格被配置为与电子聚焦透镜一起调节电子束的能量和电流。

公开(公告)号：US5477046A

公开(公告)日：1995-12-19

申请号：US427326

申请日：1995-04-24

Applicant: Daniel D. Dietrich ,  Robert F. Keville

Inventor： Daniel D. Dietrich ,  Robert F. Keville

IPC: H01J49/08 ,  H01J49/38 ,  H01J49/42

CPC classification number: H01J49/08 ,  H01J49/0013 ,  H01J49/38

Abstract: An ion trap which operates in the regime between research ion traps which can detect ions with a mass resolution of better than 1:10.sup.9 and commercial mass spectrometers requiring 10.sup.4 ions with resolutions of a few hundred. The power consumption is kept to a minimum by the use of permanent magnets and a novel electron gun design. By Fourier analyzing the ion cyclotron resonance signals induced in the trap electrodes, a complete mass spectra in a single combined structure can be detected. An attribute of the ion trap mass spectrometer is that overall system size is drastically reduced due to combining a unique electron source and mass analyzer/detector in a single device. This enables portable low power mass spectrometers for the detection of environmental pollutants or illicit substances, as well as sensors for on board diagnostics to monitor engine performance or for active feedback in any process involving exhausting waste products.

Abstract translation: 离子阱可以在能够以大于1：109的质量分辨率检测离子的研究离子阱之间进行操作，并且需要具有几百分辨率的104个离子的商用质谱仪。 通过使用永磁体和新颖的电子枪设计将功耗保持在最低限度。 通过傅里叶分析在陷阱电极中诱导的离子回旋共振信号，可以检测单个组合结构中的完整质谱。 离子阱质谱仪的属性是由于在单个器件中组合独特的电子源和质量分析仪/检测器，因此整体系统尺寸大大降低。 这使得便携式低功率质谱仪能够检测环境污染物质或非法物质，以及用于车载诊断的传感器来监控发动机性能，或者在任何涉及排放废物的过程中进行主动反馈。

公开(公告)号：US5451781A

公开(公告)日：1995-09-19

申请号：US330766

申请日：1994-10-28

Applicant: Daniel D. Dietrich ,  Robert F. Keville

Inventor： Daniel D. Dietrich ,  Robert F. Keville

IPC: H01J49/08 ,  H01J49/38 ,  H01J49/42

CPC classification number: H01J49/08 ,  H01J49/0013 ,  H01J49/38

Abstract: An ion trap which operates in the regime between research ion traps which can detect ions with a mass resolution of better than 1:10.sup.9 and commercial mass spectrometers requiring 10.sup.4 ions with resolutions of a few hundred. The power consumption is kept to a minimum by the use of permanent magnets and a novel electron gun design. By Fourier analyzing the ion cyclotron resonance signals induced in the trap electrodes, a complete mass spectra in a single combined structure can be detected. An attribute of the ion trap mass spectrometer is that overall system size is drastically reduced due to combining a unique electron source and mass analyzer/detector in a single device. This enables portable low power mass spectrometers for the detection of environmental pollutants or illicit substances, as well as sensors for on board diagnostics to monitor engine performance or for active feedback in any process involving exhausting waste products.

Abstract translation: 离子阱可以在能够以大于1：109的质量分辨率检测离子的研究离子阱之间进行操作，并且需要具有几百分辨率的104个离子的商用质谱仪。 通过使用永磁体和新颖的电子枪设计将功耗保持在最低限度。 通过傅里叶分析在陷阱电极中诱导的离子回旋共振信号，可以检测单个组合结构中的完整质谱。 离子阱质谱仪的属性是由于在单个器件中组合独特的电子源和质量分析仪/检测器，因此整体系统尺寸大大降低。 这使得便携式低功率质谱仪能够检测环境污染物质或非法物质，以及用于车载诊断的传感器来监控发动机性能，或者在任何涉及排放废物的过程中进行主动反馈。

公开(公告)号：US4924136A

公开(公告)日：1990-05-08

申请号：US219580

申请日：1988-07-15

Applicant: Burkhard Lischke ,  Dieter Winkler

Inventor： Burkhard Lischke ,  Dieter Winkler

IPC: H01J37/06 ,  H01J1/18 ,  H01J37/07 ,  H01J49/08

CPC classification number: H01J37/07 ,  H01J1/18

Abstract: Beam generating system for electron beam measuring instruments. In prior art beam generators, the life expectancy of directly heated boride cathodes is limited by their thermally disadvantageous mount. The present invention provides a cathode not clamped at the lower end of the crystal shank as was previously standard, but clamped immediately below the cathode tip. The inventive mount of the boride cathode results in the crystal being only insignificantly hotter in the region of the clamping plane than at the electron-emitting tip.

Abstract translation: 用于电子束测量仪器的光束发生系统。 在现有技术的光束发生器中，直接加热的硼化物阴极的寿命受其不利的安装限制。 本发明提供了一个阴极，不像以前标准那样夹在晶体柄的下端，而是紧紧地夹在阴极尖端的正下方。 本发明的硼化阴极的安装导致晶体在夹持平面的区域中比在电子发射尖端处仅显着更热。

公开(公告)号：US4680467A

公开(公告)日：1987-07-14

申请号：US849478

申请日：1986-04-08

Applicant: Charles E. Bryson, III ,  Douglas L. Jones

Inventor： Charles E. Bryson, III ,  Douglas L. Jones

IPC: G01N23/227 ,  G01Q30/02 ,  H01J49/08 ,  H01J49/48

CPC classification number: H01J49/48 ,  G01N23/227 ,  H01J49/08

Abstract: An electron spectroscopy system is disclosed which is specially suited for chemical analysis of electrically isolated specimens. X-rays or other ionizing radiation is focused to a relatively small spot on the surface of the electrically isolated sample to be analyzed. An electron energy analyzer has its input optics focused such that the input field of view of the electron energy analyzer is coincident with the beam spot produced by the focused beam of ionizing radiation on the specimen so as to capture secondary photoelectrons emitted from the surface of the sample under analysis. The energies of the secondary photoelectrons are analyzed to obtain a spectrum of the constituents of the surface of the sample under analysis. A flood beam of relatively low energy electrons is directed onto the surface of the sample for neutralizing the positive surface charge in the region of the beam spot. An electrically conductive grid is positioned in closely spaced relationship to the surface of the sample for smoothing the gradients in the electrical potential in the region of the beam spot, thereby improving the resolution of the secondary photoelectron energy spectrum obtained from the sample under analysis.

Abstract translation: 公开了一种特别适用于电隔离样品化学分析的电子能谱系统。 X射线或其他电离辐射被聚焦到要分析的电隔离样品的表面上的相对小的斑点。 电子能量分析仪的输入光学器件被聚焦，使得电子能量分析仪的输入视场与由样品上的聚焦电离辐射束产生的束斑重合，以便捕获从样品表面发射的第二光电子 分析样本。 分析次级光电子的能量，得到分析样品表面成分的光谱。 相对较低能量的电子的泛光束被引导到样品的表面上，以中和束斑区域中的正表面电荷。 导电栅格被定位成与样品表面紧密间隔的关系，用于平滑束斑区域中的电位梯度，从而提高从分析中得到的样品获得的次级光电子能谱的分辨率。

公开(公告)号：US11670496B2

公开(公告)日：2023-06-06

申请号：US17233610

申请日：2021-04-19

Applicant: PERKINELMER HEALTH SCIENCES, INC.

Inventor： Adam Patkin

IPC: H01J49/00 ,  H01J49/08

CPC classification number: H01J49/08 ,  H01J49/0027

Abstract: Certain configurations of an ionization source comprising a multipolar rod assembly are described. In some examples, the multipolar rod assembly can be configured to provide a magnetic field and a radio frequency field into an ion volume formed by a substantially parallel arrangement of rods of the multipolar rod assembly. The ionization source may also comprise an electron source configured to provide electrons into the ion volume of the multipolar rod assembly to ionize analyte introduced into the ion volume. Systems and methods using the ionization source are also described.

公开(公告)号：US20230084351A1

公开(公告)日：2023-03-16

申请号：US17785728

申请日：2020-12-16

Applicant: Leybold GmbH

Inventor： Niklas Pengemann ,  Yessica Brachthaeuser ,  Thorsten Benter

IPC: H01K1/18 ,  H01J49/14 ,  H01J49/08

Abstract: The invention relates to a holding device for at least one filament, comprising: at least one filament receptacle for receiving the at least one filament. The holding device is designed for the detachable attachment, in particular clamping attachment, of the at least one filament receptacle to a container of an ionization device. The invention also relates to a mass spectrometer comprising: an ionization device having a container in which an ionization space for ionizing a gas is formed, at least one holding device which is designed for the detachable attachment, in particular clamping attachment, of the at least one filament receptacle to the container, and a vacuum housing to which the holding device, in particular a base body of the holding device, is detachably connected.

公开(公告)号：US20210116428A1

公开(公告)日：2021-04-22

申请号：US17047606

申请日：2019-04-16

Applicant: SHARP KABUSHIKI KAISHA

Inventor： SHOHEI KOMARU ,  TADASHI IWAMATSU

IPC: G01N30/70 ,  G01N27/66 ,  H01J49/08

Abstract: The electron capture detector (100) is a device for detecting a sample (α1). The electron capture detector (100) includes a detection cell (1), a sample inlet (2), and an electron emitting element (20). The detection cell (1) forms a reaction chamber (6). The sample inlet (2) introduces a first carrier gas containing the sample (α1) into the reaction chamber (6). The electron emitting element (20) emits electrons (β) into the reaction chamber (6). An ion (α2) derived from the sample component is generated as a result of the electron emitting element (20) emitting electrons (β) into the reaction chamber (6).

公开(公告)号：US10971347B2

公开(公告)日：2021-04-06

申请号：US16306911

申请日：2016-06-23

Applicant: Hitachi High-Technologies Corporation

Inventor： Mitsuhiro Nakamura ,  Hironori Itabashi ,  Hirofumi Satou ,  Tsutomu Saito ,  Masahiro Sasajima ,  Natsuki Tsuno ,  Yohei Nakamura

IPC: H01J49/08 ,  H01J3/26 ,  H01J3/36 ,  H01J37/147 ,  H01J49/10

Abstract: In order to provide a charged particle beam apparatus capable of stably detecting secondary particles and electromagnetic waves even for a non-conductive sample under high vacuum environment and enabling excellent observation and analysis, the charged particle beam apparatus includes a charged particle gun (12), scanning deflectors (17 and 18) configured to scan a charged particle beam (20) emitted from the charged particle gun (12) onto a sample (21), detectors (40 and 41) configured to detect a scanning control voltage input from an outside into the scanning deflectors, an arithmetic unit (42) configured to calculate, based on the detected scanning control voltage, irradiation pixel coordinates for the charged particle beam; and an irradiation controller (45) configured to control irradiation of the sample with the charged particle beam according to the irradiation pixel coordinates.

公开(公告)号：US20210020422A1

公开(公告)日：2021-01-21

申请号：US16306911

申请日：2016-06-23

Applicant: Hitachi High-Technologies Corporation

Inventor： Mitsuhiro NAKAMURA ,  Hironori ITABASHI ,  Hirofumi SATOU ,  Tsutomu SAITO ,  Masahiro SASAJIMA ,  Natsuki TSUNO ,  Yohei NAKAMURA

IPC: H01J49/08 ,  H01J37/147 ,  H01J49/10 ,  H01J3/36 ,  H01J3/26

Abstract: In order to provide a charged particle beam apparatus capable of stably detecting secondary particles and electromagnetic waves even for a non-conductive sample under high vacuum environment and enabling excellent observation and analysis, the charged particle beam apparatus includes a charged particle gun (12), scanning deflectors (17 and 18) configured to scan a charged particle beam (20) emitted from the charged particle gun (12) onto a sample (21), detectors (40 and 41) configured to detect a scanning control voltage input from an outside into the scanning deflectors, an arithmetic unit (42) configured to calculate, based on the detected scanning control voltage, irradiation pixel coordinates for the charged particle beam; and an irradiation controller (45) configured to control irradiation of the sample with the charged particle beam according to the irradiation pixel coordinates.