ISOLATED AND BULK SEMICONDUCTOR DEVICES FORMED ON A SAME BULK SUBSTRATE
    33.
    发明申请
    ISOLATED AND BULK SEMICONDUCTOR DEVICES FORMED ON A SAME BULK SUBSTRATE 有权
    在相同的大块基板上形成的隔离和大块半导体器件

    公开(公告)号:US20140001560A1

    公开(公告)日:2014-01-02

    申请号:US13538822

    申请日:2012-06-29

    IPC分类号: H01L27/088 H01L21/76

    摘要: Isolated and bulk semiconductor devices formed on a same bulk substrate and methods to form such devices are described. For example, a semiconductor structure includes a first semiconductor device having a first semiconductor body disposed on a bulk substrate. The first semiconductor body has an uppermost surface with a first horizontal plane. The semiconductor structure also includes a second semiconductor device having a second semiconductor body disposed on an isolation pedestal. The isolation pedestal is disposed on the bulk substrate. The second semiconductor body has an uppermost surface with a second horizontal plane. The first and second horizontal planes are co-planar.

    摘要翻译: 描述了形成在相同体积基板上的隔离和体半导体器件以及形成这种器件的方法。 例如,半导体结构包括具有设置在体基板上的第一半导体本体的第一半导体器件。 第一半导体本体具有带有第一水平面的最上表面。 半导体结构还包括具有设置在隔离基座上的第二半导体本体的第二半导体器件。 隔离基座设置在主体基板上。 第二半导体本体具有带有第二水平面的最上表面。 第一和第二水平面是共面的。

    COPPER-FILLED TRENCH CONTACT FOR TRANSISTOR PERFORMANCE IMPROVEMENT
    34.
    发明申请
    COPPER-FILLED TRENCH CONTACT FOR TRANSISTOR PERFORMANCE IMPROVEMENT 有权
    铜箔填充触头用于晶体管性能改进

    公开(公告)号:US20120299069A1

    公开(公告)日:2012-11-29

    申请号:US13569150

    申请日:2012-08-07

    IPC分类号: H01L23/48 H01L29/78

    摘要: Methods of fabricating a first contact to a semiconductor device, which fundamentally comprises providing a semiconductor device formed on a substrate. The substrate further includes a conductive surface. A dielectric layer is formed over the substrate and has an opening exposing the conductive surface. The opening extends an entire length of the semiconductor device, partway down the entire length of the device, extending from the device onto adjacent field of the device, or and a combination thereof. A barrier layer is formed within the opening. A copper containing material fills the opening to form a first contact to the semiconductor device.

    摘要翻译: 制造半导体器件的第一接触的方法,其基本上包括提供形成在衬底上的半导体器件。 基板还包括导电表面。 介电层形成在衬底上并具有暴露导电表面的开口。 开口延伸半导体器件的整个长度,从设备的整个长度的一部分延伸到器件的相邻的场上,或其组合。 在开口内形成阻挡层。 含铜材料填充开口以形成与半导体器件的第一接触。

    Copper-filled trench contact for transistor performance improvement
    35.
    发明授权
    Copper-filled trench contact for transistor performance improvement 有权
    用于晶体管性能改善的铜填充沟槽接触

    公开(公告)号:US08258057B2

    公开(公告)日:2012-09-04

    申请号:US11396201

    申请日:2006-05-23

    IPC分类号: H01L21/4763

    摘要: Methods of fabricating a first contact to a semiconductor device, which fundamentally comprises providing a semiconductor device formed on a substrate. The substrate further includes a conductive surface. A dielectric layer is formed over the substrate and has an opening exposing the conductive surface. The opening extends an entire length of the semiconductor device, partway down the entire length of the device, extending from the device onto adjacent field of the device, or and a combination thereof. A barrier layer is formed within the opening. A copper containing material fills the opening to form a first contact to the semiconductor device.

    摘要翻译: 制造半导体器件的第一接触的方法,其基本上包括提供形成在衬底上的半导体器件。 基板还包括导电表面。 介电层形成在衬底上并具有暴露导电表面的开口。 开口延伸半导体器件的整个长度,从设备的整个长度的一部分延伸到器件的相邻的场上,或其组合。 在开口内形成阻挡层。 含铜材料填充开口以形成与半导体器件的第一接触。

    Thin tensile layers in shallow trench isolation and method of making same

    公开(公告)号:US06627506B2

    公开(公告)日:2003-09-30

    申请号:US09908277

    申请日:2001-07-18

    IPC分类号: H01L21331

    CPC分类号: H01L21/3144 H01L21/76232

    摘要: The present invention relates to a method of forming an isolation trench that comprises forming a recess in a substrate and forming a film upon the sidewall under conditions that cause the film to have a tensile load. The method includes filling the recess with a material that imparts a compressive load upon the film under conditions that oppose the tensile load. The present invention is particularly well suited for shallow isolation trench filling in the 0.13 micron geometry range, and smaller.