摘要:
Program disturb error logging and correction for a flash memory including a computer implemented method for storing data. The method includes receiving a write request that includes data and a write address of a target page in a memory. A previously programmed page at a specified offset from the target page is read from the memory. Contents of the previously programmed page are compared to an expected value of the previously programmed page. Error data is stored in an error log in response to contents of the previously programmed page being different than the expected value of the previously programmed page, the error data describing an error in the previously programmed page and the error data used by a next read operation to the previously programmed page to correct the error in the previously programmed page. The received data is written to the target page in the memory.
摘要:
Solid-state storage management for a system that includes a main board and a solid-state storage board separate from the main board is provided. The sold-state storage board includes a solid-state memory device and solid-state storage devices. The system is configured to perform a method that includes a correspondence being established, by a software module located on the main board, between a first logical address and a first physical address on the solid-state storage devices. The correspondence between the first logical address and the first physical address is stored in a location on the solid-state memory device. The method also includes translating the first logical address into the first physical address. The translating is performed by an address translator module located on the solid-state storage board and is based on the previously established correspondence between the first logical address and the first physical address.
摘要:
A method of manufacturing a phase change memory cell on a substrate. The method includes: etching a first trench in the substrate; depositing a first conductor layer in the first trench; depositing a first insulator layer over the first conductor layer in the first trench; etching a second trench in the substrate at an angle to the first trench; depositing a second insulator layer in the second trench; depositing a second conductor layer over the second insulator layer in the second trench; and depositing phase change material. The deposited phase change material is in contact with the first conductor layer and the second conductor layer.
摘要:
Bad block management for flash memory including a method for storing data. The method includes receiving a write request that includes write data. A block of memory is identified for storing the write data. The block of memory includes a plurality of pages. A bit error rate (BER) of the block of memory is determined and expanded write data is created from the write data in response to the BER exceeding a BER threshold. The expanded write data is characterized by an expected BER that is lower than the BER threshold. The expanded write data is encoded using an error correction code (ECC). The encoded expanded write data is written to the block of memory.
摘要:
A memory system that includes a plurality of memory arrays having memory cells characterized by a variable write time. The memory system also includes a memory bus configured to receive write commands, and a plurality of data buffers configured to communicate with the memory arrays. The memory system further includes an address buffer configured to communicate with the memory arrays to store the write addresses. A mechanism configured to receive a write command and to split a data line received with the write command into a number of parts is also included in the memory system. The parts of the data line are stored in different data buffers and the writing of the parts of the data line to memory arrays at the write address is initiated. The write command is completed when write completion signals specifying the write address have been received from all of the memory arrays.
摘要:
Selecting bins in a memory by receiving a target cost for performing writes at an analog memory that is capable of storing a range of values. Possible bins that may be created in the range of values and a cost associated with each possible bin are determined. Each possible bin includes one or more of the values. A group of bins are identified, the group of bins are among the possible bins with associated costs that are within a threshold of the target cost. A maximum number of bins are selected from the group of bins that have non-overlapping values. The selected bins are stored along with the values of the selected bins utilized to encode and decode contents of the analog memory.
摘要:
An analog memory having adjustable write bins including a system for writing to the memory. The system includes a write apparatus interpreting one or more write control signals, generating a write signal, and applying the write signal at a selected memory location to store a desired content. The selected memory location is subject to data dependent noise and is capable of storing a range of values grouped into “n” bins configured such that the average cost to write to at least “n-1” of the bins is within a threshold of a target cost for the selected analog memory location. The system also includes a read apparatus. The system further includes write control circuitry that includes a write signal selector selecting the one or more write control signals responsive to the desired content, current content of the selected memory location, and a bin associated with the desired content.
摘要:
Isolation of faulty links in a transmission medium including a method that includes receiving an atomic data unit via a multi-link transmission medium that has a plurality of transmission links An error condition is detected and it is determined that the error condition is isolated to a single transmission link. It is determined if the single transmission link has been isolated previously as a failing transmission link a specified number of times within an interval specified by a timer. If the single transmission link has been isolated previously as a failing transmission link a specified number of times within an interval specified by a timer then: identifying the single transmission link as a faulty transmission link; resetting the timer; and outputting an identifier of the single transmission link.
摘要:
A computer memory with dynamic cell density including a method that obtains a target size for a first memory region. The first memory region includes first memory units operating at a first density. The first memory units are includes in a memory in a memory system. The memory is operable at the first density and a second density. The method also includes: determining that a current size of the first memory region is not within a threshold of the target size and that the first memory region is smaller than the target size; identifying a second memory unit currently operating at the second density in a second memory region, the second memory unit included in the memory; and dynamically reassigning, during normal system operation, the second memory unit into the first memory region, the second memory unit operating at the first density after being reassigned to the first memory region.
摘要:
Systems, methods, and devices for iteratively writing contents to memory locations are provided. A statistical model is used to determine a sequence of pulses to write desired contents to a memory location. The contents can be expressed as a resistance value in a range to store one or more bits in a memory cell. For phase change memory, an adaptive reset pulse and one or more annealing pulses are selected based on a desired resistance range. Reading the resistance value of the memory cell can provide feedback to determine adjustments in an overall pulse application strategy. The statistical model and a look up table can be used to select and modify pulses. Adaptively updating the statistical model and look up table may reduce the number of looping iterations to shift the resistance value of the memory cell into the desired resistance range.