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31.发明申请公开(公告)号：US20180024167A1
公开(公告)日：2018-01-25
申请号：US15718561
申请日：2017-09-28
Applicant: TECHNOPROBE S.p.A.
Inventor： Flavio Maggioni
IPC: G01R1/073
CPC classification number: G01R1/07378 , G01R1/06766 , G01R1/07342 , G01R31/2889 , H05K1/0231
Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head housing a plurality of contact probes, each contact probe having at least one contact tip abutting onto contact pads of a device under test, as well as at least one space transformer realizing a spatial transformation of the distances between contact pads made on its opposite sides and connected by means of suitable conductive tracks or planes, as well as a plurality of filtering capacitors provided between the space transformer and a PCB, which comprises direct conductive tracks or planes contacting conductive portions of the filtering capacitors.
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公开(公告)号：US20180003767A1
公开(公告)日：2018-01-04
申请号：US15703614
申请日：2017-09-13
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto Crippa , Raffaele Vallauri , Emanuele Bertarelli , Daniele Perego
CPC classification number: G01R31/2891 , G01R1/06733 , G01R1/0675 , G01R1/07314 , G01R1/07357 , H01R13/2435 , H01R13/42
Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.
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公开(公告)号：US20170307657A1
公开(公告)日：2017-10-26
申请号：US15640097
申请日：2017-06-30
Applicant: Technoprobe S.p.A.
Inventor： Giuseppe Crippa
CPC classification number: G01R1/06761 , G01R1/06716 , G01R1/06738 , G01R3/00 , H01R13/03 , H01R13/2464
Abstract: It is described a contact probe for a testing head of an apparatus for testing electronic devices including a body essentially extended along a longitudinal direction between a contact tip and a contact head, that contact probe comprising at least one multilayer structure, in turn including a superposition of at least one inner layer or core and a first inner coating layer, and an outer coating layer that completely covers the multilayer structure and made of a material having a higher hardness than a material realizing the core.
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34.发明申请公开(公告)号：US20160377655A1
公开(公告)日：2016-12-29
申请号：US15257424
申请日：2016-09-06
Applicant: Technoprobe S.p.A.
Inventor： Riccardo Liberini , Filippo Dell'Orto , Roberto Crippa
IPC: G01R1/073
CPC classification number: G01R1/07314 , G01R1/07378
Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on the opposite sides thereof. Conveniently, the probe card comprises a support element which is joined to the intermediate support, this support element being made by means of a material having a greater stiffness than the intermediate support, thereby being able to provide local micro rectifications of the intermediate support.
Abstract translation: 用于电子设备测试装置的探针卡包括容纳多个接触探针的至少一个测试头，每个接触探针具有至少一个适于邻接被测器件的接触垫的接触尖端，以及支撑板 与加强件和中间支撑件相关联的测试头连接到支撑板并且适于提供在其相对侧上形成的接触垫之间的距离的空间变换。 方便地，探针卡包括与中间支撑件连接的支撑元件，该支撑元件通过具有比中间支撑件更大的刚度的材料制成，由此能够提供中间支撑件的局部微整流。
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35.发明授权公开(公告)号：US11971449B2
公开(公告)日：2024-04-30
申请号：US17502600
申请日：2021-10-15
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
IPC: G01R31/319 , G01R1/073 , G01R1/18 , G01R3/00 , G01R1/067
CPC classification number: G01R31/31905 , G01R1/07357 , G01R1/07364 , G01R1/07371 , G01R1/07392 , G01R3/00 , G01R1/06772 , G01R1/18
Abstract: A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.
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Patent Agency Ranking
36.发明公开公开(公告)号：US20240012027A1
公开(公告)日：2024-01-11
申请号：US18252142
申请日：2021-11-10
Applicant: TECHNOPROBE S.P.A.
Inventor： Raffaele VALLAURI
IPC: G01R1/073
CPC classification number: G01R1/07314 , G01R1/07357
Abstract: A probe head for testing the operation of a device under test is disclosed. The probe head has a plurality of contact probes including a body extending along a longitudinal axis adapted to contact respective contact pads and having a substantially square or rectangular-shaped cross section, and a guide lying in a plane and provided with guide holes having a substantially square or rectangular-shaped cross section for slidingly housing the contact probes. In the plane of the guide the cross section of the guide holes and the cross section of the contact probes are rotated relative to each other around the longitudinal axis and have respective different orientations with respect to a reference system in the plane, so that an edge of the body is mechanically interfering with a corresponding wall of the guide holes The probe head also has a conductive portion formed at the guide and/or formed at another guide of the probe head being adapted to contact and short-circuit a corresponding group of contact probes.
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公开(公告)号：US20230408548A1
公开(公告)日：2023-12-21
申请号：US18254044
申请日：2021-11-18
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio MAGGIONI
CPC classification number: G01R1/0735 , G01R1/06772 , H05K1/147 , H05K3/326 , H05K3/4007 , H05K2201/0367
Abstract: A flexible membrane adapted to carry high-frequency power signals is described having a plurality of contact pads in a central portion of the flexible membrane connected to a plurality of micro contact probes and a plurality of contact structures connected to a support plate in a peripheral portion of the flexible membrane, as well as a plurality of conductive tracks connecting the contact pads with the contact structures. The flexible membrane further includes an intermediate portion between the central and peripheral portions. The elastic membrane is divided into a first area having a first total thickness and into a second area having a second total thickness. The first area is contiguous and adjacent to the second area. The first total thickness is less than or equal to 75 μm and the second total thickness is greater than the first total thickness.
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公开(公告)号：US20230333142A1
公开(公告)日：2023-10-19
申请号：US18329475
申请日：2023-06-05
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio MAGGIONI
CPC classification number: G01R1/07378 , G01R1/07357 , G01R1/07371 , G01R1/06772 , G01R1/07328
Abstract: A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer includes a plurality of contact elements, each including a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house the contact elements. The guide includes a conductive portion that includes and electrically connects the holes of a group of guide holes to each other and is apt to contact a corresponding group of contact elements apt to carry a same type of signal.
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公开(公告)号：US20220155349A1
公开(公告)日：2022-05-19
申请号：US17591374
申请日：2022-02-02
Applicant: Technoprobe, S.p.A.
Inventor： Flavio MAGGIONI
Abstract: A probe head adapted to verify the operation of a device to be tested integrated on a semiconductor wafer comprises at least one guide provided with a plurality of guide holes adapted to house a plurality of contact probes. Conveniently, the guide is made of a material suitable for manufacturing integrated circuits and comprises circuit components integrated therein, such guide being an electronically active element of the probe head.
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公开(公告)号：US20220155348A1
公开(公告)日：2022-05-19
申请号：US17591363
申请日：2022-02-02
Applicant: Technoprobe, S.p.A.
Inventor： Roberto CRIPPA
Abstract: A probe head for a test equipment of electronic devices comprises a plurality of contact probes inserted in guide holes provided in at least one upper guide and one lower guide, a bending area for the contact probes being defined between the upper and lower guides, each contact probe having at least one first terminal portion which protrudes of a first length from the lower guide and ends with a contact tip (22A) adapted to abut onto a respective contact pad of a device to be tested, as well as a second terminal portion which protrudes of a second length from the upper guide and ends with a contact head adapted to abut onto a contact pad of a board for connecting or interfacing with the test equipment, suitably comprising at least one protection structure projecting from the upper guide in direction of a longitudinal development axis of the contact probes towards the board, the protection structure thus extending in correspondence of the contact heads of the contact probes.
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