Method for delta-noise reduction
    36.
    发明授权
    Method for delta-noise reduction 失效
    减少降噪的方法

    公开(公告)号:US06774836B2

    公开(公告)日:2004-08-10

    申请号:US10462529

    申请日:2003-06-16

    IPC分类号: H04L1702

    CPC分类号: G05F1/46

    摘要: A method, digital circuit system and program product for reducing delta-I noise in a plurality of activity units connected to a common DC-supply voltage. In order to smooth the fluctuations (delta-I) of a total current demand I, and a respective resulting fluctuation of the supply voltage, a signalling scheme between said activity units and a supervisor unit which holds a system-specific “database” containing at least the current demand of each activity unit device when operating regularly. Dependent of the quantity of calculated, imminent delta-I a subset of said activity units with a respective current I demand is selected and controlled, for either temporarily delaying their beginning of activity in case of an imminent supply voltage drop, or temporarily continuing their activity with a predetermined, activity-specific NO-OP phase in case of an imminent supply voltage rise.

    摘要翻译: 一种用于减少连接到公共DC电源电压的多个活动单元中的Δ-I噪声的方法,数字电路系统和程序产品。 为了平滑总电流需求I的波动(Δ-I)和相应的电源电压波动,所述活动单元与保持包含在系统特定的“数据库”的管理单元之间的信令方案 最小化每个活动单位设备当定期运行时的当前需求。 选择和控制所计算的即将来临的Delta-I的量的所述活动单元的一个子集,以便在即将发生的电源电压下降的情况下暂时延迟其开始的活动,或者暂时继续其活动 在即将来临的电源电压升高的情况下具有预定的活动特定的NO-OP相。

    Circuit assembly and method for operating a high pressure discharge lamp
    37.
    发明授权
    Circuit assembly and method for operating a high pressure discharge lamp 失效
    用于操作高压放电灯的电路组件和方法

    公开(公告)号:US08593072B2

    公开(公告)日:2013-11-26

    申请号:US12742447

    申请日:2007-11-13

    IPC分类号: H05B37/02

    摘要: A circuit arrangement for operating a high-pressure discharge lamp with an operating circuit for the high-pressure discharge lamp with an input for receiving a switch-on/switch-off signal for the high-pressure discharge lamp and at least one output for providing an operating signal to the high-pressure discharge lamp, wherein the operating circuit is designed to reduce the power of the operating signal provided at the at least one output once a switch-off signal has been received at its input, wherein the operating circuit furthermore designed to provide the operating signal as an AC signal above a predeterminable power threshold value and as a quasi DC signal below the predeterminable power threshold value.

    摘要翻译: 一种用于操作具有用于高压放电灯的操作电路的高压放电灯的电路装置,具有用于接收高压放电灯的接通/关断信号的输入端和至少一个用于提供 操作信号到高压放电灯,其中所述操作电路被设计成一旦在其输入处接收到关断信号,就降低在所述至少一个输出处提供的操作信号的功率,其中所述操作电路进一步 旨在将操作信号提供为高于可预定功率阈值的AC信号,并将其作为低于可预定功率阈值的准DC信号。

    Operating device and method for the combined operation of gas discharge lamps and semiconductor light sources
    38.
    发明授权
    Operating device and method for the combined operation of gas discharge lamps and semiconductor light sources 失效
    气体放电灯和半导体光源组合操作的操作装置和方法

    公开(公告)号:US08502458B2

    公开(公告)日:2013-08-06

    申请号:US12532151

    申请日:2008-02-26

    IPC分类号: H05B37/00

    CPC分类号: H05B35/00

    摘要: In various embodiments, a dimmable operating device for the combined operation of a gas discharge lamp and a semiconductor light source is provided. The dimmable operating device may be configured such that only the semiconductor light source is operated in the lower dimming range and only the gas discharge lamp is operated in the upper dimming range, and at the changeover points at which one sort of light source out of the semiconductor light source and the gas discharge lamp is switched off or on, at the same time a jump in power is applied to the other light source out of the semiconductor light source and the gas discharge lamp, with the result that the human eye cannot perceive, or can only perceive with difficulty, the changeover point.

    摘要翻译: 在各种实施例中,提供了用于气体放电灯和半导体光源的组合操作的可调光操作装置。 可调光操作装置可以被配置为使得只有半导体光源在较低调光范围内操作,并且仅气体放电灯在上调光范围内操作,并且在转换点处,将一种光源从 半导体光源和气体放电灯关闭或接通,同时向半导体光源和气体放电灯中的另一个光源施加功率跳跃,结果人眼不能察觉 ,或者只能难以察觉转换点。

    Method and Apparatus For Examining A Semiconductor Wafer
    40.
    发明申请
    Method and Apparatus For Examining A Semiconductor Wafer 审中-公开
    用于检查半导体晶片的方法和装置

    公开(公告)号:US20120007978A1

    公开(公告)日:2012-01-12

    申请号:US13163932

    申请日:2011-06-20

    IPC分类号: G06K9/00 H04N7/18

    CPC分类号: G01N21/9503

    摘要: The edges of semiconductor wafers are examined by an imaging method and the positions and forms of defects on the edge are determined, and in addition, a ring-shaped region on the flat area of the semiconductor wafer, the outer margin of which is ≦10 mm from the edge, is examined by means of photoelastic stress measurement and the positions of stressed regions in the ring-shaped region are determined, wherein the positions of the defects and the positions of the stressed regions are compared with one another, and the defects are classified in classes on the basis of their form and the results of the photoelastic stress measurement.

    摘要翻译: 通过成像方法检查半导体晶片的边缘,确定边缘上的缺陷的位置和形式,并且确定半导体晶片的平坦区域上的环形区域,其外边缘为< 通过光弹应力测量来检查距离边缘10mm的位置,并且确定环形区域中的应力区域的位置,其中将缺陷位置和应力区域的位置彼此进行比较,并且 基于其形式和光弹应力测量的结果,将缺陷分类为类。