Abstract:
An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.
Abstract:
Embodiments include apparatuses, methods, and systems for generation of an encryption key. In various embodiments, an authentication circuit may include a first bank of spin-torque nano-oscillators (STNOs) including a plurality of STNOs to generate respective oscillation signals and a second bank of STNOs including a plurality of STNOs to generate respective oscillation signals. The authentication circuit may further include a key generation circuit to select a first oscillation signal from the plurality of oscillation signals associated with the first bank of STNOs and a second oscillation signal from the plurality of oscillation signals associated with the second bank of STNOs. The key generation circuit may generate an encryption key based on a frequency of the first oscillation signal and a frequency of the second oscillation signal.
Abstract:
An all-digital voltage monitor (ADVM) generates a multi-bit output code that changes in proportion to a voltage being monitored, by leveraging the voltage impact on a gate delay. ADVM utilizes a simple delay chain, which receives a clock-cycle-long pulse every clock cycle, such that the monitored supply voltage is sampled for one full cycle every cycle. The outputs of all delay cells of the delay chain collectively represents a current voltage state as a digital thermometer code. In AVDM, a voltage droop event thus results in a decrease in the output code from a nominal value, while an overshoot results in an increase in the output code.
Abstract:
Embodiments include apparatuses, methods, and systems to implement a multi-read and/or multi-write process with a set of memory cells. The set of memory cells may be multiplexed with a same sense amplifier. As part of a multi-read process, a memory controller coupled to a memory circuit may precharge the bit lines associated with the set of memory cells, provide a single assertion of a word line signal on the word line, and then sequentially read data from the set of memory cells (using the sense amplifier) based on the precharge and the single assertion of the word line signal. Additionally, or alternatively, a multi-write process may be performed to sequentially write data to the set of memory cells based on one precharge of the associated bit lines. Other embodiments may be described and claimed.
Abstract:
A distributed and scalable all-digital LDO (D-DLDO) voltage regulator allowing rapid scaling across technology nodes. The distributed DLDO includes many tillable DLDO units regulating a single supply voltage with a shared power distribution network (PDN). The D-DLDO includes an all-digital proportional-integral-derivative (PID) controller that receives a first code indicative of a voltage behavior on a power supply rail. A droop detector is provided to compare the first code with a threshold to determine a droop event, wherein information about the droop event is provided to the PID controller, wherein the PID controller generates a second code according to the first code and the information about the droop event. The DLDO includes a plurality of power gates that receive the second code.
Abstract:
An all-digital voltage monitor (ADVM) generates a multi-bit output code that changes in proportion to a voltage being monitored, by leveraging the voltage impact on a gate delay. ADVM utilizes a simple delay chain, which receives a clock-cycle-long pulse every clock cycle, such that the monitored supply voltage is sampled for one full cycle every cycle. The outputs of all delay cells of the delay chain collectively represents a current voltage state as a digital thermometer code. In AVDM, a voltage droop event thus results in a decrease in the output code from a nominal value, while an overshoot results in an increase in the output code.
Abstract:
A processor or integrated circuit includes a memory to store weight values for a plurality neuromorphic states and a circuitry coupled to the memory. The circuitry is to detect an incoming data signal for a pre-synaptic neuromorphic state and initiate a time window for the pre-synaptic neuromorphic state in response to detecting the incoming data signal. The circuitry is further to, responsive to detecting an end of the time window: retrieve, from the memory, a weight value for a post-synaptic neuromorphic state for which an outgoing data signal is generated during the time window, the post-synaptic neuromorphic state being a fan-out connection of the pre-synaptic neuromorphic state; perform a causal update to the weight value, according to a learning function, to generate an updated weight value; and store the updated weight value back to the memory.
Abstract:
An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.
Abstract:
A spike sent from a first artificial neuron in a spiking neural network (SNN) to a second artificial neuron in the SNN is identified, with the spike sent over a particular artificial synapse in the SNN. The membrane potential of the second artificial neuron at a particular time step, corresponding to sending of the spike, is compared to a threshold potential, where the threshold potential is set lower than a firing potential of the second artificial neuron. A change to the synaptic weight of the particular artificial synapse is determined based on the spike, where the synaptic weight is to be decreased if the membrane potential of the second artificial neuron is lower than the threshold potential at the particular time step and the synaptic weight is to be increased if the membrane potential of the second artificial neuron is higher than the threshold potential at the particular time step.
Abstract:
Embodiments include apparatuses, systems, and methods including a memory apparatus including a plurality of bit cells, wherein each of the plurality of bit cells correspond to a respective weight value and include a switch device that has a magnetic tunnel junction (MTJ) or other suitable resistive memory element to produce stochastic switching. In embodiments, the switch device may produce a switching output according to a stochastic switching probability of the switch device. In embodiments, a bit line or a source line passes a current across the MTJ for a switching time associated with the stochastic switching probability to produce the switching output which enables a determination of whether the respective weight value is to be updated. Other embodiments may also be described and claimed.