Patterning process and resist overcoat material
    35.
    发明申请
    Patterning process and resist overcoat material 有权
    图案过程和抗大衣材料

    公开(公告)号:US20050233254A1

    公开(公告)日:2005-10-20

    申请号:US11105510

    申请日:2005-04-14

    IPC分类号: G03F7/11 G03F7/20 G03C1/492

    CPC分类号: G03F7/11 G03F7/2041

    摘要: In an immersion lithography process, a pattern is formed by forming a photoresist layer on a wafer, forming a protective coating on the photoresist layer from a resist overcoat material, exposing the layer structure to light in water, and developing. A water-insoluble, alkali-soluble material is used as the resist overcoat material.

    摘要翻译: 在浸没式光刻工艺中,通过在晶片上形成光致抗蚀剂层形成图案,在抗蚀剂外涂层材料上在光致抗蚀剂层上形成保护涂层,将层结构暴露于水中并进行显影。 使用水不溶性碱溶性材料作为抗蚀剂外涂层材料。

    Polymers, chemical amplification resist compositions and patterning process
    38.
    发明授权
    Polymers, chemical amplification resist compositions and patterning process 有权
    聚合物,化学放大抗蚀剂组合物和图案化工艺

    公开(公告)号:US06730451B2

    公开(公告)日:2004-05-04

    申请号:US09735521

    申请日:2000-12-14

    IPC分类号: G03F7038

    摘要: Polymers comprising recurring units of an acrylic derivative of fluorinated backbone represented by formula (1) are novel. R1, R2 and R3 are independently H, F, C1-20 alkyl or fluorinated C1-20 alkyl, at least one of R1, R2 and R3 contains fluorine, and R4 is an acid labile group. Using such polymers, resist compositions featuring low absorption of F2 excimer laser light are obtained.

    摘要翻译: 包含由式(1)表示的氟化主链的丙烯酸衍生物的重复单元的聚合物是新颖的.R 1,R 2和R 3独立地是H,F,C 1-20烷基或氟化C 1-20烷基 ,R 1,R 2和R 3中的至少一个含有氟,R 4是酸不稳定基团。 使用这种聚合物,获得具有F2准分子激光的低吸收性的抗蚀剂组合物。