TESTING BONDING PADS FOR CHIPLET SYSTEMS
    32.
    发明公开

    公开(公告)号:US20230343657A1

    公开(公告)日:2023-10-26

    申请号:US18341957

    申请日:2023-06-27

    Abstract: Systems, methods, circuits, and apparatus including computer-readable mediums for testing bonding pads in multi-die packages, e.g., chiplet systems. In one aspect, a chiplet system includes multiple integrated circuit devices electrically connected together. The integrated circuit devices include an integrated circuit device including: an integrated circuit, a plurality of first type bonding pads electrically connected to the integrated circuit and electrically connected to at least one other of the integrated circuit devices, and one or more second type bonding pads electrically isolated from the at least one other of the integrated circuit devices. At least one of the plurality of first type bonding pads is configured to be electrically connected to a corresponding one of the one or more second type bonding pads.

    Memory apparatus and associated control method for reducing erase disturb of non-volatile memory

    公开(公告)号:US11631464B2

    公开(公告)日:2023-04-18

    申请号:US17178313

    申请日:2021-02-18

    Abstract: A memory apparatus and a control method are provided. The memory apparatus includes a non-volatile memory array having plural memory groups, and the control method is applied to the non-volatile memory array. The memory groups jointly share a first well, and the control method is applied to the non-volatile memory array. A first memory group among the memory groups is erased according to a first erase command after the memory apparatus is power-on, and a first amount of the memory groups are recovered in a first erase-recover procedure after the first memory group is erased. A second memory group among the memory groups is erased according to a second erase command after the first erase-recover procedure, and a second amount of the memory groups are recovered in a second erase-recover procedure after the second memory group is erased. The first amount is greater than the second amount.

    THREE DIMENSION MEMORY DEVICE
    35.
    发明申请

    公开(公告)号:US20230085583A1

    公开(公告)日:2023-03-16

    申请号:US17477229

    申请日:2021-09-16

    Abstract: A three dimension memory device, such as a three dimensional AND flash memory is provided. The three dimension memory device includes a plurality of memory arrays, a plurality of bit line switches, and a plurality of source line switches. The memory array has a plurality of memory cell rows respectively coupled to a plurality of source lines and bit lines. The bit line switches and the source line switches are respectively implemented by a plurality of first transistors and second transistors. The first transistors are coupled to a common bit line and the bit line. The second transistors are coupled to a common source line and the source lines. The first transistors are P-type transistors or an N-type transistors with a triple-well substrate, and the second transistors are P-type transistor or an N-type transistors with a triple-well substrate.

    Method and system for enhanced read performance in low pin count interface

    公开(公告)号:US11302366B2

    公开(公告)日:2022-04-12

    申请号:US17070340

    申请日:2020-10-14

    Abstract: A memory device supporting multi-address read operations improves throughput on a bi-directional serial port. The device includes a memory array and an input/output port having an input mode and an output mode. The input/output port has at least one signal line used alternately in both the input and output modes. A controller includes logic configured to execute a multi-address read operation in response to receiving a read command on the input/output port in the input mode, the multi-address read operation including receiving a first address and a second address using the at least one signal line in the input mode before switching to the output mode, switching to the output mode and outputting data identified by the first address using the at least one signal line.

    TESTING BONDING PADS FOR CHIPLET SYSTEMS

    公开(公告)号:US20210366793A1

    公开(公告)日:2021-11-25

    申请号:US16877697

    申请日:2020-05-19

    Abstract: Systems, methods, circuits, and apparatus including computer-readable mediums for testing bonding pads in multi-die packages, e.g., chiplet systems. An example integrated circuit device includes an integrated circuit, first type bonding pads and second type bonding pads. Each of the first type bonding pads is electrically connected to the integrated circuit and configured to be electrically connected to a corresponding external integrated circuit device. Each of the second type bonding pads is configured to have no electrical connection with the corresponding external integrated circuit device. Each of the first type bonding pads is configured to be electrically connected to a corresponding one of the second type bonding pads. A number of the first type bonding pads can be larger than a number of the second type bonding pads. Each of the second type bonding pads can have a larger pad area for probing than each of the first type bonding pads.

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