公开(公告)号：US20070000119A1

公开(公告)日：2007-01-04

申请号：US11222918

申请日：2005-09-09

申请人： Kumio Masuda ,  Makoto Tabata ,  Taiji Futaoka

发明人： Kumio Masuda ,  Makoto Tabata ,  Taiji Futaoka

IPC分类号： H02K15/02

CPC分类号： G11B19/2009 ,  Y10T29/49012

摘要： A method of manufacturing a rotary driving device is disclosed. The method includes the steps of mounting a turntable, which is equipped with an anti-slipping section on a disc-placeable surface, to a rotary shaft; rotating the turntable; and shaving off a disc-contact surface, with which a disc contacts when the disc is placed, of the anti-slipping section with a cutting tool through a cutting off machining method from outside of the disc-placeable surface toward the rotary shaft. A cutting edge of the cutting tool is placed widthwise in parallel with an end face of the anti-slipping section and thickness-wise along an axial direction of the rotary shaft. The cutting edge is set such that the sections of the tool other than the cutting edge do not touch the anti-slipping section.

摘要翻译： 公开了一种制造旋转驱动装置的方法。 该方法包括以下步骤：在旋转轴上安装在盘可放置表面上装有防滑部分的转台; 旋转转盘; 并且通过切割加工方法从切割盘的外表面朝向旋转轴切削通过切割工具将防止滑动部分的盘与盘相接触的盘接触表面。 切削刀具的切削刃沿防旋转部的端面与旋转轴的轴向厚度方向宽度方向配置。 切削刃被设定为使切削刃以外的刀具部分不接触防滑部。

公开(公告)号：US07063458B1

公开(公告)日：2006-06-20

申请号：US10009595

申请日：2000-06-09

申请人： Makoto Tabata ,  Hiroyuki Ota ,  Tetsuya Sato

发明人： Makoto Tabata ,  Hiroyuki Ota ,  Tetsuya Sato

IPC分类号： G01J5/04 ,  G01K1/00 ,  A61B5/01

CPC分类号： G01J5/02 ,  G01J5/025 ,  G01J5/04 ,  G01J5/049 ,  G01J5/089

摘要： An object of the present invention is to provide an ear type clinical thermometer in which the main body can be held according to the position of the eardrum of the person whose temperature is being measured. There is provided an ear type clinical thermometer comprising: a main body to be held by hand at a time when an eardrum temperature is to be measured; and a probe fixed to the main body while protruding from the main body and to be inserted into an external auditory canal of a person whose eardrum temperature is to be measured at the time when the measurement is to be taken. The main body has a side at which the probe protrudes from the main body and a side opposite to this side, and the side opposite to the side at which the probe protrudes from the main body is constructed of a curved surface having a substantially constant curvature along a direction perpendicular to a reference plane containing the center axis of the probe. Further, the main body has an indicator for allowing a user to recognize a plurality of methods of holding the main body which differ according to directions in which the probe is to be inserted into the external auditory canal of the person whose temperature is to be measured.

摘要翻译： 本发明的目的是提供一种耳式体温计，其中主体可以根据正在测量温度的人的鼓膜的位置来保持。 提供了一种耳式体温计，其包括：在要测量鼓膜温度的时候用手握持的主体; 以及固定到主体的探针，同时从主体突出并插入到要测量鼓膜温度的人的外耳道中。 主体具有探针从主体突出的一侧和与该侧相反的一侧，并且与探头从主体突出的一侧相反的一侧由具有基本恒定曲率的曲面构成 沿垂直于包含探针的中心轴的参考平面的方向。 此外，主体具有指示器，用于使用户能够识别根据要测量的探针插入到要测量的人的外耳道的外耳道中的方向不同的多个保持方法 。

公开(公告)号：US06836863B2

公开(公告)日：2004-12-28

申请号：US09925138

申请日：2001-08-08

申请人： Makoto Tabata ,  Noboru Okino

发明人： Makoto Tabata ,  Noboru Okino

IPC分类号： G11C2900

CPC分类号： G11C16/3445 ,  G11C16/344 ,  G11C29/52

摘要： A memory block is subject to an erasure operation by a batch operation. Subsequently, a read-out test is conducted upon the memory block to count the number of unerased memory cells. If the count FN is equal to or greater than a given number TF, a plurality of erasure operations are conducted consecutively next. If FN

摘要翻译： 存储器块通过批处理操作进行擦除操作。 随后，对存储器块进行读出测试，以对未存储单元的数量进行计数。 如果计数FN等于或大于给定数量TF，则接下来进行多次擦除操作。 如果FN

公开(公告)号：US06513970B1

公开(公告)日：2003-02-04

申请号：US09807828

申请日：2001-04-19

申请人： Makoto Tabata ,  Tetsuya Sato ,  Hiroyuki Ota ,  Shigeru Tomioka

发明人： Makoto Tabata ,  Tetsuya Sato ,  Hiroyuki Ota ,  Shigeru Tomioka

IPC分类号： G01J500

CPC分类号： G01J5/04 ,  G01J5/0003 ,  G01J5/0011 ,  G01J5/0022 ,  G01J5/02 ,  G01J5/021 ,  G01J5/0235 ,  G01J5/046 ,  G01J5/049 ,  G01J5/06 ,  G01J5/08 ,  G01J5/0818 ,  G01J2005/068

摘要： An infrared sensor 20 is held in a housing 10 by a sensor holder 28 made of synthetic resin. A waveguide 30 for guiding infrared radiation, which is emitted from a target, to the infrared sensor 20 is supported by waveguide holders 31, 32 made of synthetic resin (or metal). An air layer (insulative layer, gap) 34 resides between an inner end (terminal end) 30b of the waveguide 30 and the infrared sensor 20. A probe 40 made of synthetic resin surrounding an externally protruding portion of the waveguide 30 is provided. An air layer (insulating layer, gap) 33 resides between the tip of the probe 40 and a tip (outer end) 30a of the waveguide 30. The tip of the waveguide 30 is covered by a cap 50.

摘要翻译： 红外传感器20通过由合成树脂制成的传感器保持器28保持在壳体10中。 用于将从目标射出的红外线引导到红外传感器20的波导管30由由合成树脂（或金属）制成的波导保持器31,32支撑。 在波导管30的内端（末端）30b和红外线传感器20之间设有空气层（绝缘层，间隙）34。设置由围绕波导管30的外部突出部分的合成树脂构成的探针40。 探针40的前端与波导管30的前端（外端）30a之间存在空气层（绝缘层，间隙）33。波导30的前端由盖50覆盖。

公开(公告)号：US06336742B2

公开(公告)日：2002-01-08

申请号：US09130730

申请日：1998-08-07

申请人： Masashi Fukura ,  Makoto Tabata

发明人： Masashi Fukura ,  Makoto Tabata

IPC分类号： G01K108

CPC分类号： G01J5/04 ,  G01J5/02 ,  G01J5/025 ,  G01J5/049 ,  G01J5/08 ,  G01J5/0818

摘要： This invention relates to an infrared clinical thermometer having a probe projecting forward from the main thermometer body. The probe is designed to be inserted into an ear canal and detect infrared radiation from a human eardrum in order to measure body temperature. A measurement start switch is located on the upper portion of the rear side of the thermometer main body, substantially in line with the probe. When the measurement start switch is pressed, the probe does not rotate or tilt, allowing a accurate temperature measurement to be obtained. The thermometer also has a display which shows the measurement results after the operation of the measurement start switch. The display is located on the upper portion of the rear side of the main body, so that it can be clearly seen as the thermometer is held by the operator.

摘要翻译： 本发明涉及具有从主温度计体向前突出的探针的红外线体温计。 探针被设计成插入耳道并检测来自人耳膜的红外线辐射以测量体温。 测量启动开关位于温度计主体的后侧的上部，基本与探针一致。 当按下测量启动开关时，探头不旋转或倾斜，从而可以获得准确的温度测量。 温度计还具有显示测量启动开关操作后的测量结果的显示。 显示器位于主体后侧的上部，从而可以清楚地看到温度计被操作者保持。

公开(公告)号：US08713382B2

公开(公告)日：2014-04-29

申请号：US13213054

申请日：2011-08-18

申请人： Makoto Tabata

发明人： Makoto Tabata

IPC分类号： G11C29/00

CPC分类号： G11C29/56 ,  G11C29/56008 ,  G11C29/808 ,  G11C29/81

摘要： A control apparatus controlling testing of a memory under test that includes one or more row repair memory blocks and column repair memory blocks. The control apparatus comprises a counting section that sequentially receives test results respectively indicating pass/fail of a plurality of test blocks of the memory under test, and sequentially counts, for each first-type memory block, which is a row-oriented memory block or a column-oriented memory block, a fail memory block number among second-type memory blocks; a selecting section that selects memory blocks first-type memory blocks for which the fail memory block number exceeds a reference value, such that the number of selected memory blocks is no greater than the number of first-type repair memory blocks of the memory under test; and a test control section that masks test blocks among the memory blocks selected by the selecting section and causes further testing of the memory under test.

摘要翻译： 控制装置，其控制包括一个或多个行修复存储器块和列修复存储器块的被测存储器的测试。 该控制装置包括计数部分，其依次接收分别指示被测存储器的多个测试块的通过/失败的测试结果，并且对于作为面向行的存储器块的每个第一类型存储器块， 一个面向列的存储器块，第二类型存储器块中的故障存储器块号; 选择部，其选择存储块，其中所述故障存储器块号超过参考值的第一类型存储块，使得所选存储块的数量不大于被测存储器的第一类型修复存储块的数量 ; 以及测试控制部分，其对由所述选择部分选择的所述存储器块中的测试块进行掩蔽，并且对被测试的存储器进行进一步测试。

公开(公告)号：US08627837B2

公开(公告)日：2014-01-14

申请号：US13524703

申请日：2012-06-15

申请人： Yusuke Kato ,  Takanobu Yamauchi ,  Kei Asai ,  Makoto Tabata ,  Yusaku Sakoda

发明人： Yusuke Kato ,  Takanobu Yamauchi ,  Kei Asai ,  Makoto Tabata ,  Yusaku Sakoda

IPC分类号： B08B3/12 ,  B08B6/00

摘要： In a thin plate member washing apparatus, when a rotary arm member supporting a mesh member holding portion is rotated using a rotary handle, tap water flows over the surface of a mesh member, and medicinal fluid residue deposited on the mesh member is removed.

公开(公告)号：US08072232B2

公开(公告)日：2011-12-06

申请号：US12618619

申请日：2009-11-13

申请人： Makoto Tabata

发明人： Makoto Tabata

IPC分类号： G01R31/26

CPC分类号： G11C29/56 ,  G11C29/48 ,  G11C2029/5602 ,  G11C2029/5606

摘要： Provided is a test apparatus that tests a device under test having a test function for sequentially outputting, from a single test terminal, signals that would be output from a plurality of terminals, the test apparatus comprising: a test section that supplies the device under test with a test signal and receives signals that are sequentially output from the test terminal in response to the test signal; an identifying section that identifies a correspondence between each signal sequentially received by the test section and a signal that would be output from one of the terminals of the device under test; and a counting section that counts a number of signals judged to be unacceptable from among the signals sequentially received by the test section for each terminal of the device under test, based on the correspondence identified by the identifying section.

摘要翻译： 提供了一种测试装置，其具有测试功能，用于从单个测试终端顺次地输出将从多个终端输出的信号，所述测试设备包括：测试部分，其供应被测设备 具有测试信号并接收响应于测试信号从测试终端顺序地输出的信号; 标识部分，其识别由测试部分顺序接收的每个信号与将从被测设备的一个终端输出的信号之间的对应关系; 以及计数部，其基于由识别部识别的对应关系，对从被测设备的每个终端按测试部分顺序接收的信号中判定为不可接受的信号数进行计数。

公开(公告)号：US07733721B2

公开(公告)日：2010-06-08

申请号：US11991368

申请日：2007-08-22

申请人： Makoto Tabata

发明人： Makoto Tabata

IPC分类号： G11C7/00

CPC分类号： G11C29/56 ,  G11C29/56004 ,  G11C29/56008 ,  G11C2029/1208 ,  G11C2029/5604 ,  G11C2029/5606

摘要： The disclosure concerns a semiconductor tester for testing a MUT, comprising a pattern generator; a pattern formatter; a comparator comparing a result signal from the MUT with an expectation value; a bad block memory; an AFM pre-storing pass/fail information of each of memory cells; a data compressor compressing data of pass/fail information in the AFM; a compression failure buffer memory storing data compressed; a good block register storing an address number of a good block prepared; and an address generator, wherein when the block to be compressed is a good one, the good block register sends a address number of the good block to the compress failure buffer memory.

公开(公告)号：US20100056027A1

公开(公告)日：2010-03-04

申请号：US12542920

申请日：2009-08-18

申请人： Clemens Zapilko ,  Thomas Jaeschke ,  Makoto Tabata ,  Klaus Roettger

发明人： Clemens Zapilko ,  Thomas Jaeschke ,  Makoto Tabata ,  Klaus Roettger

IPC分类号： B24B1/00 ,  B24B7/17

CPC分类号： B24B37/042 ,  H01L21/02024

摘要： Semiconductor wafers are CMP polished by polishing the rear side of the semiconductor wafer by means of CMP with a material removal with a profile along the diameter of the wafer wherein material removal is higher at the center than at the edge of the rear side; and polishing the front side of the wafer by means of CMP with a material removal with a profile along the diameter of the wafer wherein material removal is lower in the center of the front side than in an edge region of the front side.

摘要翻译： 半导体晶片通过CMP抛光半导体晶片的后侧，通过沿着晶片直径的轮廓去除材料进行抛光，其中材料去除在中心处比后侧的边缘更高; 并且通过CMP沿着沿着晶片直径的轮廓的材料除去材料抛光晶片的前侧，其中在前侧的中心处的材料去除比在前侧的边缘区域更低。