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    Non-volatile semiconductor storage device having memory cells disposed three-dimensionally, and method of manufacturing the same
    35.
    发明授权
    Non-volatile semiconductor storage device having memory cells disposed three-dimensionally, and method of manufacturing the same 有权
    具有三维配置存储单元的非易失性半导体存储装置及其制造方法

    公开(公告)号：US08178917B2

    公开(公告)日：2012-05-15

    申请号：US12408249

    申请日：2009-03-20

    申请人： Hiroyasu Tanaka ,  Ryota Katsumata ,  Masaru Kito ,  Yoshiaki Fukuzumi ,  Masaru Kidoh ,  Yosuke Komori ,  Hideaki Aochi ,  Megumi Ishiduki ,  Yasuyuki Matsuoka

    发明人： Hiroyasu Tanaka ,  Ryota Katsumata ,  Masaru Kito ,  Yoshiaki Fukuzumi ,  Masaru Kidoh ,  Yosuke Komori ,  Hideaki Aochi ,  Megumi Ishiduki ,  Yasuyuki Matsuoka

    IPC分类号： H01L29/792

    CPC分类号： H01L27/11578 ,  H01L27/105 ,  H01L27/115 ,  H01L27/11573 ,  H01L27/11582

    摘要： A non-volatile semiconductor storage device includes a first layer and a second layer. The first layer includes: a plurality of first conductive layers extending in parallel to a substrate and laminated in a direction perpendicular to the substrate; a first insulation layer formed on an upper layer of the plurality of first conductive layers; a first semiconductor layer formed to penetrate the plurality of first conductive layers; and a charge accumulation layer formed between the first conductive layers and the first semiconductor layer. Respective ends of the first conductive layers are formed in a stepwise manner in relation to each other in a first direction. The second layer includes: a plurality of second conductive layers extending in parallel to the substrate and laminated in a direction perpendicular to the substrate, the second conductive layers being formed in the same layer as the plurality of first conductive layers; and a second insulation layer formed on an upper layer of the plurality of second conductive layers. Respective ends of the second conductive layers are formed to align along a straight line extending in a direction substantially perpendicular to the substrate at a predetermined area.

    摘要翻译： 非易失性半导体存储装置包括第一层和第二层。 第一层包括：多个第一导电层，其平行于衬底延伸并且在垂直于衬底的方向上层压; 形成在所述多个第一导电层的上层上的第一绝缘层; 形成为穿透所述多个第一导电层的第一半导体层; 以及形成在第一导电层和第一半导体层之间的电荷累积层。 第一导电层的相应端部在第一方向上相对于彼此以逐步的方式形成。 第二层包括：多个第二导电层，其平行于衬底延伸并且在垂直于衬底的方向上层叠，第二导电层形成在与多个第一导电层相同的层中; 以及形成在所述多个第二导电层的上层上的第二绝缘层。 形成第二导电层的相应端，沿着在预定区域上基本上垂直于衬底的方向延伸的直线对齐。

    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
    37.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME 失效
    非易失性半导体存储器件及其制造方法

    公开(公告)号：US20120043599A1

    公开(公告)日：2012-02-23

    申请号：US12943349

    申请日：2010-11-10

    申请人： Ryota Katsumata ,  Hideaki Aochi ,  Masaru Kito ,  Masaru Kidoh ,  Ryouhei Kirisawa

    发明人： Ryota Katsumata ,  Hideaki Aochi ,  Masaru Kito ,  Masaru Kidoh ,  Ryouhei Kirisawa

    IPC分类号： H01L29/78 ,  H01L21/28

    CPC分类号： H01L27/11582 ,  H01L27/1157 ,  H01L27/11573

    摘要： According to one embodiment, a nonvolatile semiconductor memory device includes a first and a second stacked structure, a first and a second semiconductor pillar, a semiconductor connection portion, a first and a second connection portion conductive layer, a first and a second pillar portion memory layer, a first and a second connection portion memory layer. The first and second stacked structures include electrode films and inter-electrode insulating films alternately stacked in a first direction. The second stacked structure is adjacent to the first stacked structure. The first and second semiconductor pillars pierce the first and second stacked structures, respectively. The semiconductor connection portion connects the first and second semiconductor pillars. The first and second pillar portion memory layers are provided between the electrode films and the semiconductor pillar. The first and second connection portion memory layers are provided between the connection portion conductive layers and the semiconductor connection portion.

    摘要翻译： 根据一个实施例，非易失性半导体存储器件包括第一和第二堆叠结构，第一和第二半导体柱，半导体连接部分，第一和第二连接部分导电层，第一和第二柱部存储器 层，第一和第二连接部分存储层。 第一和第二堆叠结构包括在第一方向上交替堆叠的电极膜和电极间绝缘膜。 第二堆叠结构与第一堆叠结构相邻。 第一和第二半导体柱分别刺穿第一和第二堆叠结构。 半导体连接部分连接第一和第二半导体柱。 第一和第二柱部存储层设置在电极膜和半导体柱之间。 第一和第二连接部分存储层设置在连接部分导电层和半导体连接部分之间。

    Semiconductor memory device
    38.
    发明授权
    Semiconductor memory device 有权
    半导体存储器件

    公开(公告)号：US08089120B2

    公开(公告)日：2012-01-03

    申请号：US12562781

    申请日：2009-09-18

    申请人： Hiroyasu Tanaka ,  Masaru Kidoh ,  Ryota Katsumata ,  Masaru Kito ,  Yosuke Komori ,  Megumi Ishiduki ,  Hideaki Aochi ,  Yoshiaki Fukuzumi

    发明人： Hiroyasu Tanaka ,  Masaru Kidoh ,  Ryota Katsumata ,  Masaru Kito ,  Yosuke Komori ,  Megumi Ishiduki ,  Hideaki Aochi ,  Yoshiaki Fukuzumi

    IPC分类号： H01L29/792 ,  H01L29/76 ,  H01L29/94 ,  H01L31/062 ,  H01L31/113

    CPC分类号： H01L27/11578 ,  H01L27/11582

    摘要： A semiconductor memory device includes: a semiconductor substrate; a stacked body with a plurality of conductive layers and a plurality of dielectric layers alternately stacked, the stacked body being provided on the semiconductor substrate; a semiconductor layer provided inside a hole formed through the stacked body, the semiconductor layer extending in stacking direction of the conductive layers and the dielectric layers; and a charge storage layer provided between the conductive layers and the semiconductor layer. The stacked body in a memory cell array region including a plurality of memory strings is divided into a plurality of blocks by slits with an interlayer dielectric film buried therein, the memory string including as many memory cells series-connected in the stacking direction as the conductive layers, the memory cell including the conductive layer, the semiconductor layer, and the charge storage layer provided between the conductive layer and the semiconductor layer, and each of the block is surrounded by the slits formed in a closed pattern.

    摘要翻译： 半导体存储器件包括：半导体衬底; 具有交替堆叠的多个导电层和多个电介质层的层叠体，所述层叠体设置在所述半导体基板上; 设置在通过所述层叠体形成的孔内的半导体层，所述半导体层沿所述导电层和所述电介质层的堆叠方向延伸; 以及设置在导电层和半导体层之间的电荷存储层。 包含多个存储器串的存储单元阵列区域中的堆叠体被埋置在其中的层间电介质膜的狭缝分成多个块，该存储串包括在堆叠方向上串联连接的存储单元作为导电 存储单元包括导电层，半导体层和设置在导电层和半导体层之间的电荷存储层，并且每个块被形成为封闭图案的狭缝包围。