摘要:
A semiconductor integrated circuit having a power supply terminal, ground terminal and a substrate bias terminal comprises a substrate voltage generating circuit connected to the power supply terminal and the ground terminal for generating a substrate bias voltage of a predetermined value and for applying the same to the substrate bias terminal, a MOS transistor provided between the substrate bias terminal and the ground terminal for bringing the substrate potential to the ground potential when the supply voltage of the power supply terminal exceeds a prescribed voltage value and a plurality of diode connected MOS transistors connected between the power supply terminal and the gate of the MOS transistor for deciding the prescribed voltage value.
摘要:
A memory cell array is divided into four blocks #1 to #4. The blocks #1 and #3 are operated when a row address signal RA.sub.8 equals "0". The blocks #2 and #4 are operated when the row address signal RA.sub.8 equals "1". A spare row sub-decoder is provided in each of the blocks. Spare row sub-decoders in the blocks #1 and #2 are connected to a spare row main decoder through a single spare decoder selecting line. The spare row sub-decoders in the blocks #2 and #4 are connected to the other spare row main decoder through another spare decoder selecting line. The spare main decoders are responsive to the row address signal RA.sub.8 and row address signals RA.sub.2, RA.sub.2, . . . , RA.sub.7, RA.sub.7 for operating a spare row sub-decoder in a block which is in the operating state.
摘要:
A dynamic random access memory device having common signal lines to transmit row address signals and column address signals, uses change-over switches to transfer those signals to a row decoder. Voltage suppression circuitry limits high voltage applied to decoupling transistors provided at decoder outputs. An MOS transistor used as a voltage suppression device between the decoupling transistor and a word line activating transistor transfers word line activating signals.
摘要:
A MOS dynamic type RAM comprises memory cells (10), dummy cells (11), bit line pairs (BL, BL), word lines (WL), dummy word lines (DWL) and sense amplifiers (12). In a non-active cycle, the potentials of each pair of bit lines (BL, BL) are precharged at 1/2 of a supply potential V.sub.CC. Each sense amplifier (12) operates in an active cycle following the non-active cycle, while each active pull-up circuit (13) pulls up the potential of a higher level one of the pair of bit lines to V.sub.CC. This active cycle is defined by an internal RAS internal signal, which is generated by a NAND circuit (27) in response to an external RAS signal and an RPW signal obtained by delaying the external RAS signal by a delay circuit (20) and having a trailing edge obtained by delaying the trailing edge of the external RAS signal by a prescribed period.
摘要:
A dummy word line driving circuit for a MOS dynamic RAM comprises a dummy word line controller connected to each end of a pair of dummy word lines. A sub-decode signal which is opposite to the one inputted to a dummy word driver and a dummy set signal for writing a bit line information into a not-selected dummy cell are inputted to the dummy word line controller. Means for applying a dummy equalizing signal is connected to two full-sized dummy cells, for equalizing the two before the dummy word line is driven. The two full-sized dummy cells are equalized by the signal, resulting in a charge amount, which is to be a reference value, of a half of a full-sized memory cell.
摘要:
A first precharging and equalizing circuit (7) precharges and equalizes I/O buses (10 and 10') in advance to selection of bit lines, and following thereto, a second precharging and equalizing circuit (12) precharges and equalizes the I/O buses (10 and 10') during driving operation of a sense amplifier (2). Thus, potential levels of the I/O Buses (10 and 10') are prevented from being changed by vibration of the output level of the sense amplifier (2) transmitted to the I/O buses (10 and 10') through parasitic capacitance (8) during driving operation of the sense amplifier (2).
摘要:
A dynamic memory device including 1-transistor, 1-capacitor type dynamic memory cell, wherein a half voltage of the writing voltage is applied to a cell plate, and a constant voltage is applied to the substrate.