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72 条记录 (耗时 0.03 秒)

    Locking Device
    32.
    发明申请
    Locking Device 有权
    锁定设备

    公开(公告)号：US20090015052A1

    公开(公告)日：2009-01-15

    申请号：US11578003

    申请日：2005-03-04

    申请人： Frank Weber ,  Karthikeyan Subramanian

    发明人： Frank Weber ,  Karthikeyan Subramanian

    IPC分类号： B60N2/235 ,  B60N2/02 ,  B23P11/00 ,  G05G1/00

    CPC分类号： B60N2/2352 ,  B60N2/20 ,  B60N2/42727 ,  B60N2/433 ,  Y10T29/49826 ,  Y10T74/20396

    摘要： A locking device, such as a pawl and sector latch for a vehicle seat, is provided. The locking device includes a first fitting part having a body portion and an insert form-fitted in a recess in an outer periphery of the body portion. The insert has an outer contour having a plurality of teeth. The locking device further includes a second fitting part configured to be moved into a releasable form-fitting engagement with the first fitting part.

    摘要翻译： 提供了一种锁定装置，例如用于车辆座椅的棘爪和扇形闩锁。 锁定装置包括具有本体部分的第一配合部分和嵌入在主体部分的外周中的凹部中的插入件。 插入件具有多个齿的外轮廓。 锁定装置还包括第二配合部件，其构造成被移动成与第一配件部件的可释放的形状配合接合。

    Method of fabricating semiconductor cleaners
    34.
    发明申请
    Method of fabricating semiconductor cleaners 有权
    制造半导体清洁剂的方法

    公开(公告)号：US20060100794A1

    公开(公告)日：2006-05-11

    申请号：US11126424

    申请日：2005-05-11

    申请人： Frank Weber

    发明人： Frank Weber

    IPC分类号： G06F19/00

    CPC分类号： G05D11/02 ,  C11D11/0047 ,  G06F19/704 ,  H01L21/0206

    摘要： A method of manufacturing cleaning solvents is provided. The method includes selecting a small plurality of test solvents from a large plurality of perspective solvents. The equilibrium composition of a multi-component solution is preferably described by the Hansen solubility model. A small plurality of test solvents is applied to solute samples and the degree of dissolution or swelling recorded. Based on the degree of dissolution or swelling, at least one solvent is selected from the large plurality of perspective solvents based on the Hansen parameters. In other embodiments, the three-parameter Hansen solubility model includes additional parameters that enable more accurate solubility predictions. In one embodiment, an additional parameter accounts for oxidizing solution components. In an alternative embodiment, an additional parameter accounts for the acidic/basic property of the solution. Still another embodiment accounts for temperature effects.

    摘要翻译： 提供了制造清洗溶剂的方法。 该方法包括从大量多个透视溶剂中选择少量的测试溶剂。 多组分溶液的平衡组成优选用Hansen溶解度模型描述。 施用少量测试溶剂来溶解样品，记录溶解或溶胀度。 基于溶解或溶胀的程度，基于Hansen参数从至少一种溶剂中选择大量的透视溶剂。 在其他实施例中，三参数汉森溶解度模型包括能够更准确地溶解度预测的附加参数。 在一个实施方案中，附加参数考虑氧化溶液组分。 在替代实施例中，附加参数解决了溶液的酸性/碱性。 另一个实施例解释了温度效应。

    Using polydentate ligands for sealing pores in low-K dielectrics
    35.
    发明申请
    Using polydentate ligands for sealing pores in low-K dielectrics 有权
    使用多齿配体密封低K电介质的孔隙

    公开(公告)号：US20060094256A1

    公开(公告)日：2006-05-04

    申请号：US10978540

    申请日：2004-11-01

    申请人： Frank Weber

    发明人： Frank Weber

    IPC分类号： H01L21/31

    CPC分类号： C23C16/56 ,  H01L21/02126 ,  H01L21/02203 ,  H01L21/02271 ,  H01L21/02304 ,  H01L21/02318 ,  H01L21/31058 ,  H01L21/31116 ,  H01L21/31695

    摘要： In preferred embodiments, a polydentate pore-sealing ligand is used to seal or repair pores damaged by plasma processing. The polydentate ligand includes bidentate ligands corresponding to the general formula X—CH2—(CH2)n—CH2—X or X—Si(CH3)2—(CH2)n—Si(CH3)2—X. The polydentate ligand also includes tridendate ligands corresponding to the general formula X—CH2—(CH2)m(CXH)(CH2)o—CH2—X or X—Si(CH3)2—(CH2)m(CXH)(CH2)o—Si(CH3)2—X. Alternative embodiments may include single or multiply branched polydentate ligands. Other embodiments include ligands that are cross-linked after attachment to the dielectric. Still other embodiments include a derivatization reaction wherein silanol groups formed by plasma damage are removed and favorable dielectric properties are restored.

    摘要翻译： 在优选的实施方案中，多齿孔密封配体用于密封或修复由等离子体处理损坏的孔。 多齿配体包括对应于通式X-CH 2 - （CH 2）n - CH 2 - 的二齿配体， SUB或-X-Si（CH 3）2 - （CH 2）n -Si（CH 3） CH 3）2 -X。 多齿配体还包括对应于通式X-CH 2 - （CH 2）m（CXH）（CH 2个-X或X-Si（CH 3 3）2 - - - - - - - - （CH 2 CH 2）m（CXH）（CH 2）2 -Si（CH 3） 2 2。 替代实施方案可以包括单支或多支支链多齿配体。 其它实施方案包括在附着到电介质之后交联的配体。 其它实施方案包括衍生化反应，其中除去由等离子体损伤形成的硅烷醇基团并恢复良好的介电性能。

    High efficiency combination direct/indirect water heater
    37.
    发明申请
    High efficiency combination direct/indirect water heater 审中-公开
    高效率组合直接/间接热水器

    公开(公告)号：US20050072378A1

    公开(公告)日：2005-04-07

    申请号：US10686238

    申请日：2003-10-15

    申请人： Frank Weber ,  Jeffrey Pruitt ,  Brian Walker

    发明人： Frank Weber ,  Jeffrey Pruitt ,  Brian Walker

    IPC分类号： F24H1/10 ,  F28C3/06 ,  F28D1/02 ,  F22B1/02

    CPC分类号： F28D1/0213 ,  F24H1/107 ,  F28C3/06

    摘要： A combination direct/indirect liquid heating heater comprises a tower, a cold water inlet conduit causing water to fall in said tower, a hot water reservoir in communication with said tower, a gas burner, a hot gas inlet manifold encased in the reservoir and, by means of a vertical section, directing the gas into the tower. The hot gas manifold vertical section is capped by a cap impeding water flow into the manifold. Also, the vertical section comprises a baffle impeding gas flow from the tower into the reservoir.

    摘要翻译： 一种组合的直接/间接液体加热加热器包括塔架，导致水在塔中落下的冷水入口导管，与塔相连的热水储存器，气体燃烧器，封装在储存器中的热气进口歧管， 通过垂直部分将气体引导到塔中。 热气体歧管垂直部分被帽盖住，阻止水流入歧管。 此外，垂直部分包括妨碍气体从塔进入储存器的挡板。

    Configuration for identifying contact faults during the testing of integrated circuits
    38.
    发明授权
    Configuration for identifying contact faults during the testing of integrated circuits 有权
    在集成电路测试期间识别接触故障的配置

    公开(公告)号：US06693447B1

    公开(公告)日：2004-02-17

    申请号：US09277281

    申请日：1999-03-26

    申请人： Dominique Savignac ,  Frank Weber ,  Norbert Wirth

    发明人： Dominique Savignac ,  Frank Weber ,  Norbert Wirth

    IPC分类号： G01R3126

    CPC分类号： G01R31/2884

    摘要： A configuration for identifying contact faults during the testing of integrated circuits with a multiplicity of pins which protrude from a housing and are connected to respective pads on a semiconductor body of the integrated circuit. Pull-up or pull-down devices are connected between respective pads and input buffers and in each case hold the pads at a high or low potential by impressing a holding current, if contact has not been made with a pin associated with the pad during testing, the result being that activation of the circuit section connected to the pin is avoided.

    摘要翻译： 用于在具有从壳体突出并且连接到集成电路的半导体主体上的相应焊盘的多个引脚的集成电路测试期间识别接触故障的配置。 上拉或下拉器件连接在相应的焊盘和输入缓冲器之间，并且在每种情况下，通过施加保持电流来将焊盘保持在高或低电位，如果在测试期间没有与焊盘相关联的引脚进行接触 结果是避免了与引脚连接的电路部分的激活。

    Burn-in test device
    39.
    发明授权
    Burn-in test device 有权
    老化测试设备

    公开(公告)号：US06268718B1

    公开(公告)日：2001-07-31

    申请号：US09401390

    申请日：1999-09-22

    申请人： Jens Lüpke ,  Frank Weber ,  Joseph Sillup

    发明人： Jens Lüpke ,  Frank Weber ,  Joseph Sillup

    IPC分类号： G01R3128

    CPC分类号： G11C29/48 ,  G01R31/31905 ,  G11C29/56 ,  H01L2924/0002 ,  H01L2924/00

    摘要： The burn-in test device has a multiplicity of test receptacles (101, 102, 103, 104 . . . ) in a test board for receiving semiconductor memories. The test board is wired alternately in such a way that burn-in pulses can be applied to the semiconductor modules in dependence on its organization, with the result that the burn-in pulses are applied in each case to the total number of input/output lines.

    摘要翻译： 老化测试装置在用于接收半导体存储器的测试板中具有多个测试插座（101,102,103,104 ...）。 测试板交替地布线，使得可以根据其组织将老化脉冲施加到半导体模块，结果是在每种情况下将老化脉冲施加到输入/输出的总数 线条。