Spin-orbit-torque magnetization rotational element, spin-orbit-torque magnetoresistance effect element, and magnetic memory

    公开(公告)号:US11056641B2

    公开(公告)日:2021-07-06

    申请号:US16578714

    申请日:2019-09-23

    Abstract: A spin-orbit-torque magnetization rotational element includes: a first ferromagnetic layer; and a spin-orbit torque wiring in which a first surface faces the first ferromagnetic layer and a long axis extends in a first direction when viewed in plan view from a lamination direction of the first ferromagnetic layer, wherein the first surface spreads along a reference plane orthogonal to the lamination direction of the first ferromagnetic layer, the spin-orbit torque wiring contains a first virtual cross-section which passes through a first end of the first ferromagnetic layer in the first direction and is orthogonal to the first direction and a second virtual cross-section which passes through a second end of the first ferromagnetic layer in the first direction and is orthogonal to the first direction, and an area of the first virtual cross-section is different from an area of the second virtual cross-section.

    Spin current magnetization rotation magnetoresistance effect element, and magnetic memory

    公开(公告)号:US10923649B2

    公开(公告)日:2021-02-16

    申请号:US16413066

    申请日:2019-05-15

    Abstract: There is provided a spin current magnetization rotation magnetoresistance effect element that can reduce generation of a magnetic field influencing other elements.
    The spin current magnetization rotation magnetoresistance effect element in which a spin-orbit torque wiring layer, a first ferromagnetic layer, an antiferromagnetic coupling layer, a second ferromagnetic layer, a nonmagnetic layer, and a magnetization reference layer are disposed in an order, wherein a magnitude of the product of the saturation magnetization of the first ferromagnetic layer and the film thickness of the first ferromagnetic layer is larger than a magnitude of the product of the saturation magnetization of the second ferromagnetic layer and the film thickness of the second ferromagnetic layer.

    Magnetic memory
    35.
    发明授权

    公开(公告)号:US10205088B2

    公开(公告)日:2019-02-12

    申请号:US15711506

    申请日:2017-09-21

    Abstract: A magnetic memory including a plurality of magnetoresistance effect elements that hold information, each including a first ferromagnetic metal layer with a fixed magnetization direction, a second ferromagnetic metal layer with a varying magnetization direction, and a non-magnetic layer sandwiched between the first and second ferromagnetic metal layers; a plurality of first control elements that control reading of the information, wherein each of the plurality of first ferromagnetic metal layers is connected to a first control element; a plurality of spin-orbit torque wiring lines that extend in a second direction intersecting with a first direction which is a stacking direction of the magnetoresistance effect elements, wherein each of the second ferromagnetic metal layers is joined to one spin-orbit torque wiring line; a plurality of second control elements that control electric current flowing through the spin-orbit torque wiring lines.

    Spin element and reservoir element
    39.
    发明授权

    公开(公告)号:US11751488B2

    公开(公告)日:2023-09-05

    申请号:US16981310

    申请日:2020-01-24

    CPC classification number: H10N52/80 H10B61/00 H10N50/85 H10N52/00

    Abstract: A spin element according to the present embodiment includes a wiring, a laminate including a first ferromagnetic layer laminated on the wiring, a first conductive part and a second conductive part with the first ferromagnetic layer therebetween in a plan view in a lamination direction, and an intermediate layer which is in contact with the wiring and is between the first conductive part and the wiring, wherein a diffusion coefficient of a second element including the intermediate layer with respect to a first element including the wiring is smaller than a diffusion coefficient of a third element constituting the first conductive part with respect to the first element or a diffusion coefficient of the third element including the first conductive part with respect to the second element constituting the wiring is smaller than a diffusion coefficient of the third element with respect to the first element constituting the intermediate layer.

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