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公开(公告)号:US20140068531A1
公开(公告)日:2014-03-06
申请号:US14076566
申请日:2013-11-11
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Yen-Huei Chen , Wei Min Chan , Hung-Jen Liao , Jonathan Tsung-Yung Chang
IPC: G06F17/50
CPC classification number: G06F17/50 , G06F17/5068 , G06F2217/12
Abstract: Some embodiments relate to a method for pre-coloring data within an integrated chip layout to avoid overlay errors that result from mask misalignment during multiple patterning lithography. The method may be performed by generating a graphical IC layout file containing an integrated chip layout having a plurality of IC shapes. The IC shapes within the graphical IC layout file are assigned a color during decomposition. The IC shapes are further pre-colored in a manner that deliberately assigns the pre-colored data to a same mask. During mask building data associated with IC shapes that have been pre-colored is automatically sent to a same mask, regardless of the colors that are assigned to the shapes. Therefore, the pre-colored shapes are not assigned to a masked based upon a decomposition, but rather based upon the pre-coloring. By assigning IC shapes to a same mask through pre-coloring, overlay errors can be reduced.
Abstract translation: 一些实施例涉及用于在集成芯片布局内预先着色数据的方法,以避免在多次图案化光刻期间由掩模未对准而产生的重叠误差。 该方法可以通过生成包含具有多个IC形状的集成芯片布局的图形IC布局文件来执行。 图形IC布局文件中的IC形状在分解过程中会分配一种颜色。 IC形状进一步预先着色,以故意将预色数据分配给相同的掩码。 在掩模建立过程中,与预先着色的IC形状相关联的数据将自动发送到相同的掩码,而不管分配给形状的颜色如何。 因此,预先着色的形状不是基于分解而分配给掩蔽的,而是基于预着色。 通过预先着色将IC形状分配给相同的掩模,可以减少重叠错误。
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公开(公告)号:US11423977B2
公开(公告)日:2022-08-23
申请号:US16983749
申请日:2020-08-03
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hidehiro Fujiwara , Chih-Yu Lin , Sahil Preet Singh , Hsien-Yu Pan , Yen-Huei Chen , Hung-Jen Liao
IPC: G11C11/419 , G11C7/12 , H03K19/013 , G11C5/14 , G11C11/4074 , G11C11/418 , G11C8/08
Abstract: The disclosed write assist circuit can include a control circuit and a voltage generator. The control circuit can be configured to receive memory address information associated with a memory write operation for memory cells. The voltage generator can be configured to provide a reference voltage to one or more bitlines coupled to the memory cells. The voltage generator can include two capacitive elements, where during the memory write operation, (i) one of the capacitive elements can be configured to couple the reference voltage to a first negative voltage, and (ii) based on the memory address information, both capacitive elements can be configured to cumulatively couple the reference voltage to a second negative voltage that is lower than the first negative voltage.
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公开(公告)号:US11176997B2
公开(公告)日:2021-11-16
申请号:US17186539
申请日:2021-02-26
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hidehiro Fujiwara , Hung-Jen Liao , Hsien-Yu Pan , Chih-Yu Lin , Yen-Huei Chen , Chien-Chen Lin
IPC: G11C15/00 , G11C15/04 , H01L27/02 , G11C11/412
Abstract: A cell structure is disclosed. The cell structure includes a first unit comprising a first group of transistors and a first data latch, a second unit comprising a second group of transistors and a second data latch a read port unit comprising a plurality of p-type transistors, a search line and a complementary search line, the search line and the complementary search line function as input of the cell structure, and a master line, the master line functions as an output of the cell structure, the first unit is coupled to the second unit, both the first and the second units are coupled to the read port unit. According to some embodiments, the first data latch comprises a first and a second p-type transistors, a first and a second n-type transistors.
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公开(公告)号:US20190237134A1
公开(公告)日:2019-08-01
申请号:US16376198
申请日:2019-04-05
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hidehiro Fujiwara , Hung-Jen Liao , Hsien-Yu Pan , Yen-Huei Chen , Mahmut Sinangil
IPC: G11C11/412 , G11C8/14 , H01L27/11 , G11C11/419 , G11C11/418
CPC classification number: G11C11/412 , G11C8/14 , G11C11/418 , G11C11/419 , H01L27/1104
Abstract: Some embodiments relate to an SRAM cell layout including upper and lower cell edges and left and right cell edges. A first power rail extends generally in parallel with and lies along the left cell edge or the right cell edge. The first power rail is coupled to a first power supply. A second power rail extends generally in parallel with the first power rail and is arranged equidistantly between the left and right cell edges. A first bitline extends in parallel with the first power rail and the second power rail and is arranged to a first side of the second power rail. A second bitline, which is complementary to the first bitline, extends in parallel with the first power rail and the second power rail and is arranged to a second side of the second power rail.
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公开(公告)号:US20190004718A1
公开(公告)日:2019-01-03
申请号:US15938502
申请日:2018-03-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Yu-Hao HSU , Cheng Hung Lee , Chen-Lin Yang , Chiting Cheng , Fu-An Wu , Hung-Jen Liao , Jung-Ping Yang , Jonathan Tsung-Yung Chang , Wei Min Chan , Yen-Huei Chen , Yangsyu Lin , Chien-Chen Lin
IPC: G06F3/06 , G11C11/4074 , G11C16/12 , G11C16/30 , G11C5/14
Abstract: Various embodiments for configurable memory storage systems are disclosed. The configurable memory storages selectively choose an operational voltage signal from among multiple operational voltage signals to dynamically control various operational parameters. For example, the configurable memory storages selectively choose a maximum operational voltage signal from among the multiple operational voltage signals to maximize read/write speed. As another example, the configurable memory storages selectively choose a minimum operational voltage signal from among the multiple operational voltage signals to control minimize power consumption.
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公开(公告)号:US09853035B2
公开(公告)日:2017-12-26
申请号:US14589009
申请日:2015-01-05
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Hsien-Yu Pan , Jung-Hsuan Chen , Shao-Yu Chou , Yen-Huei Chen , Hung-Jen Liao
IPC: H01L27/11 , H01L27/02 , H01L21/768 , H01L27/118
CPC classification number: H01L27/1116 , H01L21/768 , H01L27/0207 , H01L27/11 , H01L2027/11887
Abstract: A method and layout for forming word line decoder devices and other devices having word line decoder cells provides for forming metal interconnect layers using non-DPL photolithography operations and provides for stitching distally disposed transistors using a lower or intermediate metal layer or a subjacent conductive material. The transistors may be disposed in or adjacent longitudinally arranged word line decoder or other cells and the conductive coupling using the metal or conductive material lowers gate resistance between transistors and avoids RC signal delays.
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公开(公告)号:US20170345485A1
公开(公告)日:2017-11-30
申请号:US15162711
申请日:2016-05-24
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Mahmut Sinangil , Hidehiro Fujiwara , Hung-Jen Liao , Jonathan Tsung-Yung Chang , Yen-Huei Chen , Sahil Preet Singh
IPC: G11C11/419 , G11C8/12 , G11C7/16 , G11C7/18 , G11C11/412 , G11C8/16
CPC classification number: G11C11/419 , G11C7/16 , G11C7/18 , G11C8/12 , G11C8/16 , G11C11/412 , G11C2207/005
Abstract: In some embodiments, a semiconductor memory device includes an array of semiconductor memory cells arranged in rows and columns. The array includes a first segment of memory cells and a second segment of memory cells. A first pair of complementary local bit lines extend over the first segment of memory cells and is coupled to multiple memory cells along a first column within the first segment of memory cells. A second pair of complementary local bit lines extend over the second segment of memory cells and is coupled to multiple memory cells along the first column within the second segment of memory cells. A pair of switches is arranged between the first and second segments of memory cells. The pair of switches is configured to selectively couple the first pair of complementary local bit lines in series with the second pair of complementary local bit lines.
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公开(公告)号:US09741429B1
公开(公告)日:2017-08-22
申请号:US15099706
申请日:2016-04-15
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Yen-Huei Chen , Hidehiro Fujiwara , Hung-Jen Liao , Jonathan Tsung-Yung Chang
IPC: G11C11/00 , G11C11/419
CPC classification number: G11C11/419 , G11C7/12 , G11C11/413
Abstract: A memory device with an array of memory cells, a write driver circuit, and a write assist circuit is disclosed. The write driver circuit and the write assist circuit can be located opposite to one another relative to the array of memory cells. The write assist circuit can compensate for a parasitic element in bitlines by transferring write voltages to addressed memory cells located in a portion of a memory array opposite to the write driver circuit. The parasitic element can be, for example, a bitline path resistance that causes a voltage differential between a voltage at the output of the write driver circuit and another voltage at a bitline location associated with the addressed memory cell. The write assist circuit can compensate for the voltage differential at the bitline location associated with the addressed memory cell; thus improving the performance of memory write operations.
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39.
公开(公告)号:US09496026B1
公开(公告)日:2016-11-15
申请号:US14700135
申请日:2015-04-29
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Mohammed Hasan Taufique , Hidehiro Fujiwara , Hung-Jen Liao , Yen-Huei Chen
IPC: G11C11/00 , G11C11/419 , G11C7/12 , G11C11/412 , G11C7/22
CPC classification number: G11C11/419 , G11C7/12 , G11C7/22 , G11C11/412
Abstract: A memory device includes a first inverter, a second inverter cross-coupled with the first inverter, an accessing unit, and a switching unit. The accessing unit is configured to discharge an output of the first inverter and charge an output of the second inverter according to signals provided by a first word line and a second word line. The switching unit is configured to disconnect a power from the first inverter and the second inverter according to a signal provided by the first word line.
Abstract translation: 存储器件包括第一反相器,与第一反相器交叉耦合的第二反相器,存取单元和切换单元。 访问单元被配置为对第一反相器的输出进行放电,并根据由第一字线和第二字线提供的信号对第二反相器的输出进行充电。 开关单元被配置为根据由第一字线提供的信号来断开来自第一逆变器和第二逆变器的电力。
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公开(公告)号:US09281031B2
公开(公告)日:2016-03-08
申请号:US14603393
申请日:2015-01-23
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Jonathan Tsung-Yung Chang , Cheng Hung Lee , Chung-Cheng Chou , Hung-Jen Liao , Bin-Hau Lo
IPC: G11C17/00 , G11C7/12 , G11C7/06 , G11C11/419 , G11C11/412
CPC classification number: G11C7/12 , G11C7/067 , G11C11/412 , G11C11/419
Abstract: A memory assist apparatus includes a detection circuit and a compensation circuit. The detection circuit is configured to provide a detection signal indicating whether a bit line configured to provide read access to a data bit stored at a memory bit cell has a voltage below a predetermined threshold. The compensation circuit is configured to pull down the voltage of the bit line if the detection signal indicates that the voltage of the bit line is below the predetermined threshold.
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