Abstract:
Apparatus and associated methods relating to a switch leakage compensation delay circuit include a compensating transistor configured to passively bypass a leakage current around a capacitor that connects in series with a control transistor. In an illustrative example, the capacitor and the compensating transistor may be connected in parallel between a first node and a second node. The compensating transistor gate may be tied, for example, directly to its source and to the second node. The control transistor may connect its drain to the second node. When a control signal turns off the control transistor, a leakage current of the control transistor may be supplied from a leakage current of the compensating transistor such that the voltage across the capacitor may be maintained substantially constant. The delay circuit may advantageously mitigate the capacitor's voltage droop to reduce clock time skew, for example, in low speed interleaved ADC operation.
Abstract:
An integrated circuit is described. The integrated circuit comprises a first portion having programmable resources; a second portion having hardened circuits including an analog-to-digital converter circuit configured to receive an input signal and generate an output signal; and a monitor circuit configured to receive an output signal generated by the analog-to-digital converter circuit; wherein the monitor circuit is configurable to control a calibration of the analog-to-digital converter circuit based upon signal characteristics of the output signal generated by the analog-to-digital converter circuit. A method of receiving data in an integrated circuit is also described.
Abstract:
Examples of the present disclosure provide out-of-range voltage detection and protection in integrated circuits (ICs). In some examples, an IC includes an envelope detector, a comparator, and a switch. The envelope detector is configured to generate an envelope signal of a signal and output the envelope signal on an output node of the envelope detector. A first input node of the comparator is coupled to the output node of the envelope detector. The comparator is configured to compare respective signals provided on the first and second input nodes of the comparator and generate a comparison signal in response to the comparison. The comparator is further configured to output the comparison signal on the output node of the comparator. The switch is connected between a protected node and a protection node and is configured to be selectively opened or closed based, at least in part, on the comparison signal.
Abstract:
In one example, a current steering circuit for a digital-to-analog converter (DAC) includes a source-coupled transistor pair responsive to a differential gate voltage; a current source coupled to the source-coupled transistor pair operable to source a bias current; a load circuit coupled to the source-coupled transistor pair operable to provide a differential output voltage; a driver having a first input, a second input, and a differential output, the differential output providing the differential gate voltage; and combinatorial logic having a data input, a clock input, a true output, and a complement output, the true output and the complement output respectively coupled to the first input and the second input of the driver, the combinatorial logic operable to exclusively OR a data signal on the data input and a clock signal on the clock input.
Abstract:
An apparatus for calibration of a signal converter is disclosed. This apparatus includes a first digital-to-analog converter (“DAC”) and a calibration system coupled to an output port of the first DAC. The calibration system includes a second DAC. The calibration system is configured to provide an adjustment signal responsive to a spurious spectral performance parameter in an output of the first DAC. The spurious spectral performance parameter is sensitive to a timing error associated with the first DAC. The calibration system is coupled to provide the adjustment signal to the first DAC to correct the timing error of the first DAC.
Abstract:
An exemplary integrated circuit for performing time skew extraction includes a first subtractor, an array of subtractors separate from the first subtractor, and an array of averaging circuits. Inputs of the first subtractor are coupled to outputs of a plurality of channels of an interleaved analog-to-digital-converter and computes distances between samples of a signal that are measured consecutively by pairs of channels in the plurality of channels. At least some averaging circuits in the array of averaging circuits compute an average of those of the distances that correspond to a respective one of the pairs of channels; one averaging circuit in the array of averaging circuits computes an average of all of the distances. Each subtractor in the array of subtractors computes a difference between an average computed by one of the at least some of the averaging circuits and the average of all of the distances.