摘要:
A redundancy circuit for a semiconductor memory device of the byte configuration type, in which data is read out for each bit, is comprised of a main memory having a plurality of main memory cells arrayed in a matrix fashion, the matrix array being divided into memory sections in the column direction; a spare memory for saving defective memory cells contained in the main memory, the spare memory comprising spare rows of a plurality of spare memory cells arranged in the row direction, the spare row being provided for each of the main memory sections; programmable spare row decoders provided for each row of spare memory cells and for independently selecting each row of the spare memory cell; and main-decoder-disable signal-generating circuits provided for each of the memory sections and for placing all of the row main decoders of the corresponding memory section in non-select state in response to a signal derived from the programmed spare row decoder of the corresponding memory section.
摘要:
A semiconductor device having a semiconductor substrate, wherein first and second insulating gate FET transistor connected, respectively, in series with first and second polycrystalline silicon layers acting as loads of first and second inverters are formed. The first polycrystalline silicon layer is provided above a gate electrode of the second insulation gate FET transistor, and the second polycrystalline silicon layer is provided above a gate electrode of the first insulation gate FET transistor.
摘要:
A control system for an internal combustion engine having a plurality of cylinders and a switching mechanism for switching between an all-cylinder operation in which all of the plurality of cylinders are operated and a partial-cylinder operation in which at least one of the plurality of cylinders is halted. A condition for performing the partial-cylinder operation is determined, based on the detected operating parameters of the vehicle driven by the engine. A result of the determination is modified so that the partial-cylinder operation may be continued, when the detected operating parameters satisfy a predetermined continuation condition within a predetermined time period from the time a vehicle operating state where the condition for performing the partial-cylinder operation is satisfied, has changed to another vehicle operating state where the condition for performing the partial-cylinder operation is not satisfied.
摘要:
A control system for an internal combustion engine having a plurality of cylinders and a switching mechanism for switching between an all-cylinder operation in which all of the plurality of cylinders are operated and a partial-cylinder operation in which at least one of the plurality of cylinders is halted. A condition for performing the partial-cylinder operation is determined, based on the detected operating parameters of the vehicle driven by the engine. A result of the determination is modified so that the partial-cylinder operation may be continued, when the detected operating parameters satisfy a predetermined continuation condition within a predetermined time period from the time a vehicle operating state where the condition for performing the partial-cylinder operation is satisfied, has changed to another vehicle operating state where the condition for performing the partial-cylinder operation is not satisfied.
摘要:
There is provided a semiconductor memory device capable of preventing the deterioration of access characteristics between output signal lines. The semiconductor memory device comprises: first and second cell arrays, each of which has the same number of memory cells; first through (2n−1)-th (n≧1) output selection control circuits; first through (2n−1)-th output transistor circuits which are provided so as to correspond to the first through (2n−1)-th output selection control circuits, and each of which receives the output of a corresponding one of the output transistor circuits; and first through (4n−2)-th output signal lines, each of the first and second cell arrays being divided into k (k≧2) first through k-th section parts, each of which has 2n−1 first through (2n−1)-th output parts and at least one auxiliary input/output part, the i-th (i=1, . . . , n−1) output selection control part receiving the output of the (2i−1)-th input/output part of each of the first through k-th section parts of the first cell array via the (2i−1)-th output signal line and receiving the output of the 2i-th input/output part of each of the first through k-th section parts of the first cell array via the 2i-th output signal line, the n-th output selection control part receiving the output of the (2n−1)-th input/output part of each of the first through k-th section parts of the first cell array via the (2n−1)-th output signal line and receiving the output of the auxiliary input/output part of each of the section parts of the first cell array via the 2n-th output signal line, and the (n+i)-th (i=1, . . . , n−1) output control circuit receiving the output of the (2i−1)-th input/output part of each of the first through k-th section parts of the second cell array via the (2n+2i−1)-th output signal line and receiving the output of the 2i-th input/output part of each of the first through k-th section parts of the second cell array via the (2n+2i)-th output signal line.
摘要:
The gates 31, 32, 33 and 34 of a pair of driver transistors Q1, Q2 and a pair of address-selecting transistors Q3, Q4 are arranged so as to be perpendicular to bit lines BL, /BL. The drain regions of the driver transistors Q1, Q2 forming a flip-flop are arranged point-symmetrically around an element isolating region. The source regions of the driver transistors Q1, Q2 are arranged point-symmetrically. Similarly, the address-selecting transistors Q3, Q4 are arranged point-symmetrically. An upper wiring layer connected to two gates of the transistors are arranged so as to be perpendicular to the bit lines BL, /BL. Two Vss lines are formed in the same layer as that for the bit lines BL, /BL and arranged on both sides of the bit lines BL, /BL in parallel thereto. The Vss lines are connected to the source regions of the driver transistors. With this construction, the bi-stability of a memory cell used for a semiconductor memory device, such as a SRAM, is improved, so that the low-voltage operation and the hold characteristic are improved and software errors are removed. In addition, the aspect ratio of the cell is changed from the aspect ratio of a conventional, longitudinally extending cell to the aspect ratio of a laterally extending cell, so that the lengths of the bit lines are decreased to achieve a high speed operation.
摘要:
A semiconductor memory device includes an address input circuit for receiving an address signal and outputting an internal address signal corresponding to the received address signal; an address decoder for decoding the internal address signal and outputting a decoded signal; a memory cell array having a plurality of memory cells each capable of storing data, as selected by the decoded signal, the selected memory cell outputting memory cell data; and an output circuit for outputting a truth data and false data at the same time in accordance with the output memory cell data of the selected memory cell.
摘要:
A semiconductor memory device having an internal circuit which is powered from a first power source terminal and outputs an output drive signal corresponding to a stored data in a selected memory cell of a memory cell array; and output buffer unit which is powered from a second power source terminal and operates in such a manner that a gate is closed or opened in accordance with whether the output drive signal is low level or high level, and an output signal of low level or high level corresponding to closed gate or opened gate is outputted via an external output terminal to the external; and a level change suppressing circuit for suppressing a level change of the output drive signal as viewed from the output buffer, by connecting the output terminal of the internal circuit to one of the second power source terminal and the external output terminal, when the potential at the second power source terminal changes relatively with respect to the potential at the first power source terminal as the output signal at the external output terminal changes its level between low level and high level.
摘要:
A semiconductor memory device includes a memory cell array having a plurality of memory cells, each of the cells being capable of storing a data and being selected by an address; a pair of data lines to which a pair of complementary data from a selected memory cell are imputted; an equalizer for short-circuiting and equalizing the pair of data lines when an equalizing signal is applied; an output circuit for outputting a single signal corresponding to the pair of complementary data from the pair of data lines; a pair of latch circuits provided between the output circuit and the equalizer for the pair of data lines, the pair of latch circuits holding the pair of complementary data; a pair of output buffer circuit provided between the pair of latch circuits and the equalizer for the pair of data lines, the pair of output buffer circuits capable of taking a low impedance state wherein the potentials per se of the pair of data lines are outputted, and a high impedance state wherein the potential change of the pair of data lines is not transmitted to the output side of the pair of output buffer circuits; and a controller for generating a first control signal which makes the pair of output buffer circuits to enter the high impedance state before the equalizing signal is applied to the equalizer and a second control signal which makes the pair of output buffer circuits to enter the low impedance state after the equalizing signal is turned off.
摘要:
A semiconductor circuit has first and second MOS transistors which are connected between an output terminal and a positive and a reference power source terminal, respectively, a bootstrap capacitor connected between the output terminal and the gate of the first MOS transistor, an inverter which inverts the input signal and which supplies the inverted signal to the gate of the second MOS transistor after a predetermined delay timne, and a switching MOS transistor having a current path connected between the input terminal and the gate of the first MOS transistor. The switching MOS transistor has a threshold voltage greater than that of the second MOS transistor.