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    Standardization methods for correcting spectral differences across multiple spectroscopic instruments
    31.
    发明授权
    Standardization methods for correcting spectral differences across multiple spectroscopic instruments 有权
    用于校正多个光谱仪器的光谱差异的标准化方法

    公开(公告)号：US07881892B2

    公开(公告)日：2011-02-01

    申请号：US11337912

    申请日：2006-01-23

    Applicant: Olusola O. Soyemi ,  Babs R. Soller

    Inventor： Olusola O. Soyemi ,  Babs R. Soller

    IPC: G06F19/00 ,  G01D18/00 ,  G01J3/28

    CPC classification number: A61B5/0059 ,  A61B5/14532 ,  A61B5/14551 ,  A61B5/1495 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0232 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0278 ,  G01J3/10 ,  G01J3/28 ,  G01J2003/2866 ,  G01N21/274 ,  G01N21/31

    Abstract: The invention relates to systems and methods for measuring properties of samples with standardized spectroscopic systems. The methods can include (i) measuring, with a first spectroscopic system, spectra of at least three different reference targets; (ii) calibrating the first spectroscopic system; (iii) measuring, with the first spectroscopic system, a spectrum of a known reference specimen having a known value of the property; (iv) generating a model for the measured property using the spectrum of the known reference specimen; (v) measuring, with a second spectroscopic system, the spectra of at least three different reference targets; (vi) calibrating the second spectroscopic system; (vii) applying the model to the second spectroscopic system; (viii) measuring a spectrum of the sample using the second spectroscopic system; and (ix) determining a value of the property using the model.

    Abstract translation: 本发明涉及用标准化光谱系统测量样品性质的系统和方法。 所述方法可以包括（i）用第一光谱系统测量至少三个不同参考目标的光谱; （ii）校准第一光谱系统; （iii）用第一光谱系统测量具有该性质的已知值的已知参考样品的光谱; （iv）使用已知参考样本的光谱产生测量属性的模型; （v）用第二光谱系统测量至少三个不同参考目标的光谱; （vi）校准第二光谱系统; （vii）将模型应用于第二光谱系统; （viii）使用第二光谱系统测量样品的光谱; 和（ix）使用模型确定属性的值。

    Echelle spectometer with improved use of the detector by means of two spectrometer arrangements
    32.
    发明授权
    Echelle spectometer with improved use of the detector by means of two spectrometer arrangements 有权
    Echelle光谱仪通过两种光谱仪布置改进了检测器的使用

    公开(公告)号：US07804593B2

    公开(公告)日：2010-09-28

    申请号：US11629143

    申请日：2005-06-02

    Applicant: Helmut Becker-Roβ ,  Stefan Florek ,  Günter Wesemann ,  Michael Okruss

    Inventor： Helmut Becker-Roβ ,  Stefan Florek ,  Günter Wesemann ,  Michael Okruss

    IPC: G01J3/28

    CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/0237 ,  G01J3/0286 ,  G01J3/0294 ,  G01J3/08 ,  G01J3/12 ,  G01J3/2803

    Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterized in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.

    Abstract translation: 本发明涉及一种分光计装置（10），其包括用于产生来自检测器（42）上的辐射源的第一波长范围的光谱仪（14）。 所述布置还包括：用于在主色散方向（46）上穿透光谱仪装置（10）的辐射的光谱分解的梯形光栅（36）; 分散元件（34），用于通过在与梯形光栅（36）的主色散方向形成角度的横向色散方向（48）上的辐射的光谱分解来分离度数，使得两个 可以用多个分离的度数（52）产生维度谱（50）; 用于在图像平面（40）中将穿过入口间隙（20）的辐射成像到成像光学装置（10）中的成像光学元件（24,38）; 以及包括所述图像平面（40）中的多个检测器元件的二维排列的表面检测器（42）。 本发明的装置的特征在于，提供包括至少一个其它分散元件（64）和另一成像光学元件（60,66）的另一个光谱仪（12），以产生第二波长范围的辐射（68） ，其与第一波长范围不同，来自相同检测器（42）上的辐射源。 光谱可以在检测器上进行空间或时间分离。

    IMPROVED SIGNAL PROCESSING FOR OPTICAL COMPUTING SYSTEM
    33.
    发明申请
    IMPROVED SIGNAL PROCESSING FOR OPTICAL COMPUTING SYSTEM 有权
    改进光学计算系统的信号处理

    公开(公告)号：US20100149537A1

    公开(公告)日：2010-06-17

    申请号：US12447595

    申请日：2007-11-01

    Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

    Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

    IPC: G01N21/55 ,  G01N21/59

    CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

    Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

    Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

    Analysis apparatus and analysis method
    36.
    发明授权
    Analysis apparatus and analysis method 失效
    分析仪器及分析方法

    公开(公告)号：US07531804B2

    公开(公告)日：2009-05-12

    申请号：US11935180

    申请日：2007-11-05

    Applicant: Takeaki Itsuji

    Inventor： Takeaki Itsuji

    IPC: G01N21/00

    CPC classification number: G01J3/42 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0232 ,  G01N21/3581

    Abstract: An analysis apparatus and analysis method are provided for obtaining information on a sample from change in propagation state of a magnetic wave caused thereby, with less influence of frequency characteristics on the detection unit side. The analysis apparatus comprises a generating unit for generating a terahertz wave, a signal-making unit for making a code pattern, a delaying unit for delaying the code pattern produced by the signal-making unit, a band-diffusing unit for diffusing a band of the terahertz wave by modifying the phase of the terahertz wave generated by the generating unit in accordance with the code pattern produced by the signal-making unit, a detecting unit for detecting the terahertz wave, and a band-restoring unit for restoring the band by modulating the phase of the terahertz wave in accordance with the code pattern being output from the delaying unit before detection by the detecting unit.

    Abstract translation: 提供一种分析装置和分析方法，用于通过对检测单元侧的频率特性的影响较小来获得关于由此引起的磁波的传播状态的变化的样本的信息。 分析装置包括用于产生太赫兹波的产生单元，用于产生码型的信号制造单元，用于延迟由信号制造单元产生的码型的延迟单元，扩散带 通过根据由信号制造单元产生的编码模式来修正由发生单元生成的太赫兹波的相位的太赫兹波，用于检测太赫兹波的检测单元和用于恢复该频带的频带恢复单元 根据在由检测单元检测到之前从延迟单元输出的代码模式来调制太赫兹波的相位。

    RETRO-EMISSIVE MARKINGS
    38.
    发明申请
    RETRO-EMISSIVE MARKINGS 审中-公开
    改变标记

    公开(公告)号：US20090065583A1

    公开(公告)日：2009-03-12

    申请号：US11817974

    申请日：2006-03-10

    Applicant: Stephen P. McGrew

    Inventor： Stephen P. McGrew

    IPC: G06K7/10 ,  G06K19/06 ,  B05D5/06 ,  G01J3/30

    CPC classification number: G01J3/02 ,  G01J3/0232 ,  G01N21/643 ,  G01N21/6489 ,  G01N2021/6432 ,  G02B5/126

    Abstract: A retro-emissive marking system that returns a coded-spectrum optical signal to a source of an interrogation beam is described. The system is valuable for applications such track-and-trace systems, vehicle markings, anti-counterfeit/security, inventory control, animal ear tags, product authentication, identification cards, and security systems; and it also has value as a remotely readable sensor of chemical or biological agents.

    Abstract translation: 描述了将编码光谱光信号返回到询问光源的再发射标记系统。 该系统对于轨道跟踪系统，车辆标记，防伪/安全，库存控制，动物耳标，产品认证，身份证和安全系统等应用是有价值的。 它也具有作为化学或生物制剂的远程可读传感器的价值。

    Prism spectrometer
    39.
    发明授权
    Prism spectrometer 有权
    棱镜光谱仪

    公开(公告)号：US07485869B2

    公开(公告)日：2009-02-03

    申请号：US11711482

    申请日：2007-02-27

    Applicant: Dale A. Harrison ,  Anthony T. Hayes

    Inventor： Dale A. Harrison ,  Anthony T. Hayes

    IPC: G01N21/33

    CPC classification number: G01J3/14 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/2803 ,  G01J3/36

    Abstract: An optical spectroscopy tool is provided. In one embodiment a highly efficient means by which moderate resolution spectroscopy may be performed in the vacuum ultraviolet (VUV) is described. In one embodiment the techniques can be used as a high throughput spectrometer to spatially disperse wavelengths in and around the VUV in such a manner as to generate a substantially flat field focal plane, suitable for use in combination with an array detector. Some embodiments utilize prism based spectrometers. Some embodiments utilize detector elements that may be movable and/or located within the spectrometer. In some embodiments, collimated light may be provided as an input to the spectrometer.

    Abstract translation: 提供光谱仪。 在一个实施例中，描述了可以在真空紫外线（VUV）中进行中分辨光谱的高效手段。 在一个实施例中，该技术可以用作高通量光谱仪，以便以这样的方式空间分散VUV中和周围的波长，以便产生适合与阵列检测器组合使用的基本平坦的场焦平面。 一些实施例使用基于棱镜的光谱仪。 一些实施例利用可移动和/或位于分光计内的检测器元件。 在一些实施例中，准直光可以作为光谱仪的输入提供。

    Vacuum ultra-violet reflectometer with stray light correction
    40.
    发明授权
    Vacuum ultra-violet reflectometer with stray light correction 有权
    真空紫外线反射计，带杂散光校正

    公开(公告)号：US07446876B2

    公开(公告)日：2008-11-04

    申请号：US11517894

    申请日：2006-09-08

    Applicant: Dale A. Harrison

    Inventor： Dale A. Harrison

    IPC: G01N21/55

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/08 ,  G01J3/10 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/36 ,  G01J3/42 ,  G01J3/4531 ,  G01N21/211 ,  G01N21/274 ,  G01N21/33 ,  G01N21/47 ,  G01N21/55 ,  G01N21/9501 ,  G01N2021/335

    Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.

    Abstract translation: 提供了一种光谱系统，其被优化用于在VUV区域中的操作并且能够在DUV-NIR区域中表现良好。 此外，该系统还包含一个光学模块，该模块提供可用于VUV和DUV-NIR中优化的可选择的源和检测器。 同样，光学模块提供通用的传送和收集光学器件，以使得能够使用类似的光点特性来收集两个光谱区域中的测量。 该模块还提供了快速参考测量数据的方法，以确保实现高度可重复的结果。 该模块还在VUV源，样品室和VUV检测器之间提供受控的环境，其作用是以可重复的方式限制VUV光子的吸收。 除了DUV-NIR波长之外，使用包含VUV波长的宽带数据集使得可以有意义地表征更多种类的材料。 可以利用基于阵列的检测仪器来允许同时收集更大的波长区域。

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