摘要:
Disclosed is a gate shift register, which can perform a bi-directional shift operation with a reduced number of switching devices. The gate shift register includes a plurality of stages to receive a plurality of gate shift clocks and sequentially output a scan pulse. A kth stage includes a scan direction controller including first and second forward TFTs and first and second reverse TFTs to convert a scan direction in response to carry signals of previous stages input through first and second input terminals and carry signals of next stages input through third and fourth input terminals, a node controller including first to eighteenth TFTs to control charging and discharge operations of Q1, Q2, QB1 and QB2 nodes, and an output unit including first and second pull-up TFTs and first to fourth pull-down TFTs to output two scan pulses based on voltage levels of the Q1, Q2, QB1 and QB2 nodes.
摘要:
A driving circuit of a liquid crystal display includes: a timing controller to output a gate control signal and a data control signal to control driving of a gate driving unit and a data driving unit and to output digital video data; a pair of gate driving units to be alternately driven by using at least one frame as a period to supply gate signals to gate lines of a liquid crystal panel in response to the gate control signal; and a data driving unit to supply pixel signals to data lines of the liquid crystal panel in response to the data control signal. Degradation of characteristics of transistors constituting each gate driver can be prevented.
摘要:
The semiconductor device includes a fuse structure disposed on a substrate. An interlayer dielectric disposed on the fuse structure. A first contact plug, a second contact plug, and a third contact plug penetrate the interlayer dielectric and wherein each of the first contact plug, the second contact plug and the third contact plug are connected to the fuse structure. A first conductive pattern and a second conductive pattern are disposed on the interlayer dielectric. The first conductive pattern and the second conductive pattern are electrically connected to the first contact plug and second contact plug, respectively.
摘要:
A method of manufacturing a semiconductor device, the method including providing a semiconductor substrate; forming a gate pattern on the semiconductor substrate such that the gate pattern includes a gate dielectric layer and a sacrificial gate electrode; forming an etch stop layer and a dielectric layer on the semiconductor substrate and the gate pattern; removing portions of the dielectric layer to expose the etch stop layer; performing an etch-back process on the etch stop layer to expose the sacrificial gate electrode; removing the sacrificial gate electrode to form a trench; forming a metal layer on the semiconductor substrate including the trench; removing portions of the metal layer to expose the dielectric layer; and performing an etch-back process on the metal layer to a predetermined target.
摘要:
A driving circuit of a liquid crystal display includes: a timing controller to output a gate control signal and a data control signal to control driving of a gate driving unit and a data driving unit and to output digital video data; a pair of gate driving units to be alternately driven by using at least one frame as a period to supply gate signals to gate lines of a liquid crystal panel in response to the gate control signal; and a data driving unit to supply pixel signals to data lines of the liquid crystal panel in response to the data control signal. Degradation of characteristics of transistors constituting each gate driver can be prevented.
摘要:
A test device, SRAM test device, semiconductor integrated circuit, and methods of fabricating the same are provided. The test device may include a first test active region extending in one direction on a semiconductor substrate, a second test active, apart from the first test active region, extending in one direction on a semiconductor substrate, a plurality of test gate lines crossing the test active regions, a plurality of test contacts on at least one of the test active regions and test gate lines, a plurality of conducting regions electrically connecting the test contacts, and a plurality of conductive wiring lines interconnecting the plurality of test contacts, wherein an open contact chain, which electrically connects the plurality of test contacts, is formed.
摘要:
The invention relates generally to a fuse device of a semiconductor device, and more particularly, to an electrical fuse device of a semiconductor device. Embodiments of the invention provide a fuse device that is capable of reducing programming error caused by non-uniform current densities in a fuse link. In one respect, there is provided an electrical fuse device that includes: an anode; a fuse link coupled to the anode on a first side of the fuse link; a cathode coupled to the fuse link on a second side of the fuse link; a first cathode contact coupled to the cathode; and a first anode contact coupled to the anode, at least one of the first cathode contact and the first anode contact being disposed across a virtual extending surface of the fuse link.
摘要:
A method of manufacturing a semiconductor device, the method including providing a semiconductor substrate; forming a gate pattern on the semiconductor substrate such that the gate pattern includes a gate dielectric layer and a sacrificial gate electrode; forming an etch stop layer and a dielectric layer on the semiconductor substrate and the gate pattern; removing portions of the dielectric layer to expose the etch stop layer; performing an etch-back process on the etch stop layer to expose the sacrificial gate electrode; removing the sacrificial gate electrode to form a trench; forming a metal layer on the semiconductor substrate including the trench; removing portions of the metal layer to expose the dielectric layer; and performing an etch-back process on the metal layer to a predetermined target.
摘要:
A gate drive circuit for a display device is disclosed, by which output states of scan pulses are identically maintained in a manner of minimizing load deviation between connecting units. The present disclosure includes at least two clock transmission lines transmitting at least two clock pulses having a phase difference in-between, a shift register outputting scan pulses sequentially based on the clock pulses transmitted from the clock transmission lines, and a plurality of connecting units connecting the clock transmission lines to the shift register, respectively, wherein at least one of the connecting units is zigzagged in part.
摘要:
A semiconductor substrate includes a first transistor area having a first gate electrode and first source/drain areas, a second transistor area having a second gate electrode and second source/drain areas, and an interface area provided at an interface of the first transistor area and the second transistor area and having a third gate electrode. A first stress film is on the first gate electrode and the first source/drain areas of the first transistor area and at least a portion of the third gate electrode of the interface area. A second stress film is on the second gate electrode and the second source/drain areas of the second transistor area and not overlapping the first stress film on the third gate electrode of the interface area or overlapping at least a portion of the first stress film. The second stress film overlapping at least the portion of the first stress film is thinner than the second stress film in the second transistor area. Related methods are also described.