HYBRID ELECTROSTATIC CHUCK
    41.
    发明申请
    HYBRID ELECTROSTATIC CHUCK 有权
    混合静电卡盘

    公开(公告)号:US20110164343A1

    公开(公告)日:2011-07-07

    申请号:US12652669

    申请日:2010-01-05

    申请人: Michael Sogard

    发明人: Michael Sogard

    IPC分类号: H01L21/683

    摘要: An electrostatic chuck (230) for holding a device (200) includes a chuck body (244), a Coulomb electrode assembly (246), a Johnsen-Rahbek (J-R) electrode assembly (248), and a control system (224). The chuck body (244) includes a chucking surface (250) that engages the device (200), and the chuck body (244) is made of a dielectric having a relatively high resistance. The J-R electrode assembly (248) is positioned spaced apart from the chucking surface (250). The Coulomb electrode assembly (246) is also positioned spaced apart from the chucking surface (250). The control system (224) selectively directs a first voltage to the J-R electrode assembly (248) to generate a J-R type force that attracts the device (200) towards the chucking surface (250), and selectively directs a second voltage to the Coulomb electrode assembly (246) to generate a Coulomb type force that also attracts the device (200) towards the chucking surface (250). With this design, both the J-R type force and the Coulomb type force are used to concurrently attract the device (200) against the chucking surface (2500. As a result thereof, the electrostatic chuck (230) is better able to reduce non-flatness of the device (200), and/or crush any particles positioned between the device (200) and the chucking surface (250).

    摘要翻译: 用于保持装置(200)的静电卡盘(230)包括卡盘主体(244),库仑电极组件(246),约翰 - 拉贝克(J·R)电极组件(248)和控制系统(224))。 卡盘主体(244)包括与装置(200)接合的卡盘表面(250),卡盘主体(244)由具有较高阻力的电介质制成。 J-R电极组件(248)定位成与夹紧表面(250)间隔开。 库仑电极组件(246)也位于与夹紧表面(250)间隔开的位置。 所述控制系统(224)选择性地将第一电压引导到所述JR电极组件(248)以产生将所述装置(200)吸引到所述夹紧表面(250)的JR型力,并且选择性地将第二电压引导到所述库仑电极 组件(246)以产生也吸引装置(200)朝向夹紧表面(250)的库仑型力。 通过这种设计,JR型力和库仑型力均被用于同时将装置(200)吸引在卡盘表面(2500)上。因此,静电卡盘(230)能够更好地降低非平坦度 的装置(200),和/或压缩位于装置(200)和夹紧表面(250)之间的任何颗粒。

    Immersion fluid containment system and method for immersion lithogtraphy
    42.
    发明申请
    Immersion fluid containment system and method for immersion lithogtraphy 审中-公开
    浸入式流体容纳系统和浸渍岩石的方法

    公开(公告)号:US20090021706A1

    公开(公告)日:2009-01-22

    申请号:US11921228

    申请日:2006-05-16

    申请人: Michael Sogard

    发明人: Michael Sogard

    IPC分类号: G03B27/42 G03B27/52

    摘要: A ferrofluid is provided adjacent to the immersion area between a projection optical system (PL) and substrate and receives a magnetic force so as to form a ferrofluidic seal (100) adjacent to the immersion area so as to inhibit immersion liquid from escaping from the gap between the projection optical system and substrate. The ferrofluid can be a fluid having a colloidal suspension of ferromagnetic particles in it.

    摘要翻译: 在投影光学系统(PL)和基板之间的浸没区域附近提供铁磁流体,并且接收磁力以形成与浸没区域相邻的铁磁流体密封件(100),以便抑制浸没液体从间隙逸出 在投影光学系统和基板之间。 铁磁流体可以是其中具有铁磁性颗粒的胶体悬浮液的流体。

    Dynamic fluid control system for immersion lithography
    43.
    发明申请
    Dynamic fluid control system for immersion lithography 有权
    用于浸没式光刻的动态流体控制系统

    公开(公告)号:US20080309895A1

    公开(公告)日:2008-12-18

    申请号:US12222421

    申请日:2008-08-08

    申请人: Michael Sogard

    发明人: Michael Sogard

    IPC分类号: G03B27/42 G03B27/52

    摘要: An apparatus includes a stage that supports a substrate, an optical system having a last optical element, that projects an image onto the substrate that is positioned spaced apart from the last optical element by a gap at least partly filled with an immersion liquid, and a pressure control system having an actuator, that controls pressure of the immersion liquid in the gap using the actuator.

    摘要翻译: 一种装置包括支撑基板的台,具有最后光学元件的光学系统,其将图像投影到基板上,该基板与最后的光学元件间隔开至少部分地填充有浸没液体的间隙,以及 压力控制系统具有致动器,其使用致动器来控制间隙中的浸没液体的压力。

    Environmental system including vacuum scavenge for an immersion lithography apparatus

    公开(公告)号:US07456930B2

    公开(公告)日:2008-11-25

    申请号:US11819089

    申请日:2007-06-25

    IPC分类号: G03B27/42 G03B27/58

    摘要: An environmental system controls an environment in a gap between an optical assembly and a device and includes a fluid barrier and an immersion fluid system. The fluid barrier is positioned near the device. The immersion fluid system delivers an immersion fluid that fills the gap and collects the immersion fluid that is directly between the fluid barrier and the device. The fluid barrier can include a scavenge inlet that is positioned near the device, and the immersion fluid system can include a low pressure source that is in fluid communication with the scavenge inlet. The fluid barrier confines any vapor of the immersion fluid and prevents it from perturbing a measurement system. Additionally, the environmental system can include a bearing fluid source that directs a bearing fluid between the fluid barrier and the device to support the fluid barrier relative to the device.

    Measurement of EUV intensity
    45.
    发明申请
    Measurement of EUV intensity 有权
    EUV强度测量

    公开(公告)号:US20080151221A1

    公开(公告)日:2008-06-26

    申请号:US11588643

    申请日:2006-10-27

    申请人: Michael Sogard

    发明人: Michael Sogard

    IPC分类号: G01J3/00

    摘要: A monitoring system for an lithographic system is disclosed. In particular, the monitoring system can be utilized in an extreme ultraviolet lithographic system. In a monitoring system according to the present invention, a plurality of detectors are positioned to receive radiation from a pattern of positions on a mirror that is part of the lithographic system. In some embodiments, the plurality of detectors may be positioned on the mirror. In some embodiments, the plurality of detectors may be positioned behind the mirror and receive radiation through holes formed in the mirror. In some embodiments, radiation from the pattern of positions may be reflected by facets into the detectors.

    摘要翻译: 公开了一种用于光刻系统的监视系统。 特别地,监测系统可以用于极紫外光刻系统中。 在根据本发明的监视系统中,多个检测器被定位成接收来自作为光刻系统的一部分的反射镜上的位置图案的辐射。 在一些实施例中,多个检测器可以位于反射镜上。 在一些实施例中,多个检测器可以位于反射镜后面并且接收通过形成在反射镜中的孔的辐射。 在一些实施例中,来自位置图案的辐射可以被小平面反射到检测器中。

    Environmental system including vacuum scavenge for an immersion lithography apparatus

    公开(公告)号:US07355676B2

    公开(公告)日:2008-04-08

    申请号:US11329269

    申请日:2006-01-11

    申请人: Michael Sogard

    发明人: Michael Sogard

    IPC分类号: G03B27/32 G03B27/42 G03B27/58

    摘要: An environmental system controls an environment in a gap between an optical assembly and a device and includes a fluid barrier and an immersion fluid system. The fluid barrier is positioned near the device. The immersion fluid system delivers an immersion fluid that fills the gap and collects the immersion fluid that is directly between the fluid barrier and the device. The fluid barrier can include a scavenge inlet that is positioned near the device, and the immersion fluid system can include a low pressure source that is in fluid communication with the scavenge inlet. The fluid barrier confines any vapor of the immersion fluid and prevents it from perturbing a measurement system. Additionally, the environmental system can include a bearing fluid source that directs a bearing fluid between the fluid barrier and the device to support the fluid barrier relative to the device.

    Thermally insulated thermophoretic plate
    47.
    发明授权
    Thermally insulated thermophoretic plate 失效
    热绝缘热泳板

    公开(公告)号:US07323698B2

    公开(公告)日:2008-01-29

    申请号:US10967123

    申请日:2004-10-19

    申请人: Michael Sogard

    发明人: Michael Sogard

    IPC分类号: G03F7/20

    CPC分类号: G03F7/70866 G03F7/70916

    摘要: A subsystem for an exposure apparatus has a thermophoretic plate and at least one shielding layer covering a first surface of the thermophoretic plate. The at least one shielding layer controls thermally induced distortions of the exposure apparatus by reducing heat transfer between the exposure apparatus and the thermophoretic plate. The shielding layer includes an insulation layer and a reflective layer, where the reflective layer has a surface with a low emissivity. In one implementation, the reflective surface may be a surface of the thermophoretic plate. The reflective surface should be facing the exposure apparatus, but is not a requirement. More than one shielding layer may be used, in which each outermost shielding layer will have a higher temperature.

    摘要翻译: 用于曝光装置的子系统具有热泳板和覆盖热泳板的第一表面的至少一个屏蔽层。 所述至少一个屏蔽层通过减少曝光装置和热泳板之间的热传导来控制曝光装置的热诱导失真。 屏蔽层包括绝缘层和反射层,其中反射层具有低发射率的表面。 在一个实施方案中,反射表面可以是热泳板的表面。 反射面应面向曝光装置,但不是要求。 可以使用多于一个屏蔽层,其中每个最外面的屏蔽层将具有较高的温度。

    Thermophoretic Techniques for Protecting Reticles from Contaminants
    48.
    发明申请
    Thermophoretic Techniques for Protecting Reticles from Contaminants 审中-公开
    用于保护网状物免受污染物的热解技术

    公开(公告)号:US20070211232A1

    公开(公告)日:2007-09-13

    申请号:US10578752

    申请日:2004-11-10

    IPC分类号: G03B27/52

    摘要: Thermophoresis within lithography systems for protecting reticles from contaminants (e.g., floating particles). Generally, thermophoretic protection is implemented by maintaining the reticle at a higher temperature than its surrounding environment. Thermophoretic protection can be maintained throughout a reticle's use in a lithography system. For example, a reticle can be thermophoretically protected while in storage, through various stages of transportation via a reticle handler (also referred to as an end-effector), to its period of use while attached to a reticle chuck.

    摘要翻译: 在光刻系统内进行热电泳以保护掩模版免受污染物(例如浮动颗粒)的影响。 通常,通过将掩模版保持在比周围环境更高的温度下来实现热保护。 在光刻系统中使用的掩模版可以保持热保护。 例如,在通过分划板处理器(也称为末端执行器)的各种运输阶段到存储期间,在将光罩保持在其使用期间,同时附着于标线盘卡盘上,可以对掩模版进行热保护。

    Radiantly heated cathode for an electron gun and heating assembly
    49.
    发明授权
    Radiantly heated cathode for an electron gun and heating assembly 失效
    用于电子枪和加热组件的辐射加热阴极

    公开(公告)号:US07250618B2

    公开(公告)日:2007-07-31

    申请号:US11050394

    申请日:2005-02-02

    IPC分类号: G21K5/10 G01N23/04

    CPC分类号: H01J37/242 H01J2237/3175

    摘要: A heating assembly (36) for heating a cathode (38) of an electron gun (30) of an exposure apparatus (10) includes a radiation source (42) and a beam shaper (44). The radiation source (42) generates a source beam (46). The beam shaper (44) receives the source beam (46) and selectively shapes the source beam (46) into a shaped beam (48) that is directed to the cathode (38). In certain embodiments, the beam shaper (44) can readily change the shape and intensity profile of the shaped beam (48) to achieve a desired electron beam (32) from the electron gun (30). In one embodiment, the radiation source (42) generates a pulsed source beam (46).

    摘要翻译: 用于加热曝光装置(10)的电子枪(30)的阴极(38)的加热组件(36)包括辐射源(42)和光束整形器(44)。 辐射源(42)产生源光束(46)。 光束整形器(44)接收源光束(46)并且选择性地将源光束(46)成形为被引导到阴极(38)的成形光束(48)。 在某些实施例中,光束整形器(44)可以容易地改变成形光束(48)的形状和强度分布,以实现来自电子枪(30)的期望的电子束(32)。 在一个实施例中,辐射源(42)产生脉冲源光束(46)。

    Cooled optical filters and optical systems comprising same
    50.
    发明申请
    Cooled optical filters and optical systems comprising same 审中-公开
    冷却的光学滤波器和包括它们的光学系统

    公开(公告)号:US20070170379A1

    公开(公告)日:2007-07-26

    申请号:US11338951

    申请日:2006-01-24

    IPC分类号: G21F3/00

    摘要: An exemplary apparatus for filtering electromagnetic radiation includes a filter element, an actuator, and a filter-cooler. The filter element has multiple selectable regions situated so that electromagnetic radiation impinges on a selected filter region to transmit therethrough a first wavelength while limiting transmission of a second wavelength. Absorption of impinging radiation heats the filter element, but the actuator moves the filter element to select a particular filter region for impingement by the radiation while moving another region away from impingement by the radiation. The filter-cooler directs a heat-conduction medium (e.g., a gas) at, and thus cools, the moved-away region. By such ongoing refreshment of portions of the filter element being irradiated and portions being cooled, the filter element can be irradiated for extended periods without thermal damage. An important use is in optical systems for EUV lithography.

    摘要翻译: 用于过滤电磁辐射的示例性装置包括过滤元件,致动器和过滤器 - 冷却器。 滤波器元件具有多个可选择区域,其位置使得电磁辐射照射到所选择的滤波器区域上,以便透射第一波长,同时限制第二波长的透射。 冲击辐射的吸收加热过滤元件,但是致动器移动过滤器元件以选择特定的过滤器区域,以便通过辐射冲击另一区域而远离辐射的冲击。 过滤器 - 冷却器将导热介质(例如,气体)引导到移动的区域,并且因此冷却移动的区域。 通过正在照射的过滤元件的部分和正在冷却的部分的这种持续更新,可以长时间地对过滤元件进行照射,而不会发生热损伤。 一个重要的用途是用于EUV光刻的光学系统。