摘要:
The present invention provides a bi-directional ball seat and method of use. In at least one embodiment, the present invention provides a fluid control system that includes a radial protrusion that can be selectively engaged and disengaged upstream and/or from a ball seat. For example, a ball can be placed in a passageway, engaged with a downstream ball seat, and the radial protrusion radially extended into the passageway distally from the seat relative to the ball. A reverse movement of the ball is restricted by the active radial movement of the radial protrusion into the passageway. The control system can be used to control a variety of tools associated with the well. Without limitation, the tools can include crossover tools, sleeves, packers, safety valves, separators, gravel packers, perforating guns, decoupling tools, valves, and other tools know to those with ordinary skills in the art.
摘要:
An apparatus and method for inspecting a surface of a sample, particularly but not limited to a semiconductor device, using an electron beam is presented. The technique is called Secondary Electron Emission Microscopy (SEEM), and has significant advantages over both Scanning Electron Microscopy (SEM) and Low Energy Electron Microscopy (LEEM) techniques. In particular, the SEEM technique utilizes a beam of relatively high-energy primary electrons having a beam width appropriate for parallel, multi-pixel imaging. The electron energy is near a charge-stable condition to achieve faster imaging than was previously attainable with SEM, and charge neutrality unattainable with LEEM. The emitted electrons may be detected using a time delay integration detector.
摘要:
A bubble cap assembly for use in fluidized bed boilers, furnaces, or reactors, has a bubble cap, a stem, and at least one pin. One end of the stem is inserted into the bubble cap. The bubble cap has outlet holes for delivering a fluidizing medium, typically into a bed of granulated material, but which prevent backsifting of the granulated material into the bubble cap. The bubble cap also has at least one insertion hole, through which a pin may be inserted. When the pin is inserted through the bubble cap insertion hole, it also occupies a groove or indentation on the stem thereby preventing separation or disassembly of the bubble cap and stem combination. An elastic gasket may be provided between the bubble cap and stem to form a fluid tight connection.
摘要:
Disclosed is a method of inspecting a sample. The sample is scanned in a first direction with at least one particle beam. The sample is scanned in a second direction with at least one particle beam. The second direction is at an angle to the first direction. The number of defects per an area of the sample are found as a result of the first scan, and the position of one or more of the found defects is determined from the second scan. In a specific embodiment, the sample includes a test structure having a plurality of test elements thereon. A first portion of the test elements is exposed to the beam during the first scan to identify test elements having defects, and a second portion of the test elements is exposed during the second scan to isolate and characterize the defect.
摘要:
Disclosed is a method of inspecting a sample. The method includes moving to a first field associated with a first group of test structures. The first group of test structures are partially within the first field. The method further includes scanning the first field to determine whether there are any defects present within the first group of test structures. When it is determined that there are defects within the first group of test structures, the method further includes repeatedly stepping to areas and scanning such areas so as to determine a specific defect location within the first group of test structures. A suitable test structure for performing this method is also disclosed.
摘要:
A circulating fluidized bed (CFB) boiler has one or more bubbling fluidized bed enclosures containing heating surfaces and located within a lower portion of the CFB boiler to provide a compact, efficient design with a reduced footprint area. The heating surfaces are provided within the bubbling fluidized bed located above a CFB grid and/or in a moving packed bed below the CFB grid inside the lower portion of the CFB boiler. Solids in the bubbling fluidized bed are maintained in a slow bubbling fluidized bed state by separately controlled fluidization gas supplies. Separately controlled fluidization gas is used to control bed level in the bubbling fluidized beds or to control the throughput of solids through the bubbling fluidized beds. Solids ejected from the bubbling fluidized beds can be returned directly into the surrounding CFB environment of the CFB boiler, or purged from the system for disposal or recycle back into the CFB. Solids which are recycled back to the CFB have less heat and can be used to control the temperature of the fast moving bed in the CFB.
摘要:
Disclosed is, a method for detecting electrical defects on test structures of a semiconductor die. The semiconductor die includes a plurality of electrically-isolated test structures and a plurality of non-electrically-isolated test structures. Voltages are established for the plurality of electrically-isolated test structures. These voltages are different than the voltages of the plurality of non-electrically-isolated test structures. A region of the semiconductor die is continuously inspected in a first direction thereby obtaining voltage contrast data indicative of whether there are defective test structures. The voltage contrast data is analyzed to determine whether there are one or more defective test structures.
摘要:
A weldless connection system for U-beam particle separators is provided in which one end of each U-beam is provided with sides and a back that are separated from each other forming tabs. The tabs may be bent, or folded, about 90.degree. inward toward the channel formed by the U-beam. The back tab may be twice as long as the side tabs, and the extra half length of the tab can be folded about 180.degree. back at the back of the U-beam in a double thickness. Each tab has a hole therethrough. The double-length back tab has two holes; one hole is provided through each half. When the tabs are bent inward, the holes align. A bolt and washer placed through the aligned holes may be used to secure the tabs, and thus the U-beam, to a furnace roof structure. An alternate embodiment of the invention is provided in which only the sides of the U-beam form tabs which extend past the bottom of the U-beam.
摘要:
An apparatus and method for inspecting a surface of a sample, particularly but not limited to a semiconductor device, using an electron beam is presented. The technique is called Secondary Electron Emission Microscopy (SEEM), and has significant advantages over both Scanning Electron Microscopy (SEM) and Low Energy Electron Microscopy (LEEM) techniques. In particular, the SEEM technique utilizes a beam of relatively high-energy primary electrons having a beam width appropriate for parallel, multi-pixel imaging. The electron energy is near a charge-stable condition to achieve faster imaging than was previously attainable with SEM, and charge neutrality unattainable with LEEM. The emitted electrons may be detected using a time delay integration detector.
摘要:
A water tube wall or heat transfer surface for use in a circulating fluidized bed combustor or reactor having reduced erosion at a transition between a protective refractory material and the upper wall.