Bi-directional ball seat system and method

    公开(公告)号:US07150326B2

    公开(公告)日:2006-12-19

    申请号:US11390230

    申请日:2006-03-27

    IPC分类号: E21B34/14

    CPC分类号: E21B34/06 E21B34/14

    摘要: The present invention provides a bi-directional ball seat and method of use. In at least one embodiment, the present invention provides a fluid control system that includes a radial protrusion that can be selectively engaged and disengaged upstream and/or from a ball seat. For example, a ball can be placed in a passageway, engaged with a downstream ball seat, and the radial protrusion radially extended into the passageway distally from the seat relative to the ball. A reverse movement of the ball is restricted by the active radial movement of the radial protrusion into the passageway. The control system can be used to control a variety of tools associated with the well. Without limitation, the tools can include crossover tools, sleeves, packers, safety valves, separators, gravel packers, perforating guns, decoupling tools, valves, and other tools know to those with ordinary skills in the art.

    Apparatus and method for secondary electron emission microscope

    公开(公告)号:US06984822B2

    公开(公告)日:2006-01-10

    申请号:US10406339

    申请日:2003-04-02

    IPC分类号: G01N23/00 G21K7/00

    CPC分类号: H01J37/285

    摘要: An apparatus and method for inspecting a surface of a sample, particularly but not limited to a semiconductor device, using an electron beam is presented. The technique is called Secondary Electron Emission Microscopy (SEEM), and has significant advantages over both Scanning Electron Microscopy (SEM) and Low Energy Electron Microscopy (LEEM) techniques. In particular, the SEEM technique utilizes a beam of relatively high-energy primary electrons having a beam width appropriate for parallel, multi-pixel imaging. The electron energy is near a charge-stable condition to achieve faster imaging than was previously attainable with SEM, and charge neutrality unattainable with LEEM. The emitted electrons may be detected using a time delay integration detector.

    Bubble cap assembly
    43.
    发明授权
    Bubble cap assembly 失效
    泡罩组件

    公开(公告)号:US06868795B2

    公开(公告)日:2005-03-22

    申请号:US10447895

    申请日:2003-05-29

    CPC分类号: F23C10/20

    摘要: A bubble cap assembly for use in fluidized bed boilers, furnaces, or reactors, has a bubble cap, a stem, and at least one pin. One end of the stem is inserted into the bubble cap. The bubble cap has outlet holes for delivering a fluidizing medium, typically into a bed of granulated material, but which prevent backsifting of the granulated material into the bubble cap. The bubble cap also has at least one insertion hole, through which a pin may be inserted. When the pin is inserted through the bubble cap insertion hole, it also occupies a groove or indentation on the stem thereby preventing separation or disassembly of the bubble cap and stem combination. An elastic gasket may be provided between the bubble cap and stem to form a fluid tight connection.

    摘要翻译: 用于流化床锅炉,炉或反应器的泡罩组件具有气泡盖,杆和至少一个销。 杆的一端插入气泡盖。 气泡盖具有用于输送流化介质的出口孔,通常进入粒状材料床,但是这防止了颗粒状材料进入气泡盖。 气泡盖还具有至少一个插入孔,销可以穿过插入孔。 当销插入通过气泡盖插入孔时,它也占据阀杆上的凹槽或压痕,从而防止气泡盖和阀杆组合的分离或拆卸。 可以在气泡盖和杆之间设置弹性垫圈以形成流体密封连接。

    CFB with controllable in-bed heat exchanger
    46.
    发明授权
    CFB with controllable in-bed heat exchanger 有权
    CFB具有可控的床上热交换器

    公开(公告)号:US06532905B2

    公开(公告)日:2003-03-18

    申请号:US09906993

    申请日:2001-07-17

    IPC分类号: F28D1300

    CPC分类号: F22B31/0084 F22B31/0023

    摘要: A circulating fluidized bed (CFB) boiler has one or more bubbling fluidized bed enclosures containing heating surfaces and located within a lower portion of the CFB boiler to provide a compact, efficient design with a reduced footprint area. The heating surfaces are provided within the bubbling fluidized bed located above a CFB grid and/or in a moving packed bed below the CFB grid inside the lower portion of the CFB boiler. Solids in the bubbling fluidized bed are maintained in a slow bubbling fluidized bed state by separately controlled fluidization gas supplies. Separately controlled fluidization gas is used to control bed level in the bubbling fluidized beds or to control the throughput of solids through the bubbling fluidized beds. Solids ejected from the bubbling fluidized beds can be returned directly into the surrounding CFB environment of the CFB boiler, or purged from the system for disposal or recycle back into the CFB. Solids which are recycled back to the CFB have less heat and can be used to control the temperature of the fast moving bed in the CFB.

    摘要翻译: 循环流化床(CFB)锅炉具有一个或多个含有加热表面并且位于CFB锅炉的下部内的起泡流化床外壳,以提供紧凑,有效的设计,减少占地面积。 加热表面设置在位于CFB格栅上方的起泡流化床内和/或在CFB锅炉下部的CFB格栅下方的移动填充床中。 鼓泡流化床中的固体通过单独控制的流化气体供应维持在缓慢的起泡流化床状态。 单独控制的流化气体用于控制鼓泡流化床中的床层或控制通过鼓泡流化床的固体的通过量。 从起泡流化床喷出的固体可以直接返回到CFB锅炉的周围CFB环境中,或者从系统中清除,以便将其回收回CFB。 循环回CFB的固体具有较少的热量,可用于控制CFB中快速移动床的温度。

    Continuous movement scans of test structures on semiconductor integrated circuits
    47.
    发明授权
    Continuous movement scans of test structures on semiconductor integrated circuits 有权
    半导体集成电路测试结构的连续运动扫描

    公开(公告)号:US06524873B1

    公开(公告)日:2003-02-25

    申请号:US09648094

    申请日:2000-08-25

    IPC分类号: G01R3126

    摘要: Disclosed is, a method for detecting electrical defects on test structures of a semiconductor die. The semiconductor die includes a plurality of electrically-isolated test structures and a plurality of non-electrically-isolated test structures. Voltages are established for the plurality of electrically-isolated test structures. These voltages are different than the voltages of the plurality of non-electrically-isolated test structures. A region of the semiconductor die is continuously inspected in a first direction thereby obtaining voltage contrast data indicative of whether there are defective test structures. The voltage contrast data is analyzed to determine whether there are one or more defective test structures.

    摘要翻译: 公开了一种用于检测半导体管芯的测试结构上的电缺陷的方法。 半导体管芯包括多个电绝缘测试结构和多个非电隔离测试结构。 为多个电隔离测试结构建立电压。 这些电压不同于多个非电隔离测试结构的电压。 在第一方向上连续地检查半导体管芯的区域,从而获得表示是否存在缺陷的测试结构的电压对比度数据。 分析电压对比度数据以确定是否存在一个或多个有缺陷的测试结构。

    Non-welded support for internal impact type particle separator
    48.
    发明授权
    Non-welded support for internal impact type particle separator 失效
    内部冲击式颗粒分离器的非焊接支撑

    公开(公告)号:US06088990A

    公开(公告)日:2000-07-18

    申请号:US058102

    申请日:1998-04-09

    摘要: A weldless connection system for U-beam particle separators is provided in which one end of each U-beam is provided with sides and a back that are separated from each other forming tabs. The tabs may be bent, or folded, about 90.degree. inward toward the channel formed by the U-beam. The back tab may be twice as long as the side tabs, and the extra half length of the tab can be folded about 180.degree. back at the back of the U-beam in a double thickness. Each tab has a hole therethrough. The double-length back tab has two holes; one hole is provided through each half. When the tabs are bent inward, the holes align. A bolt and washer placed through the aligned holes may be used to secure the tabs, and thus the U-beam, to a furnace roof structure. An alternate embodiment of the invention is provided in which only the sides of the U-beam form tabs which extend past the bottom of the U-beam.

    摘要翻译: 提供了一种用于U形梁颗粒分离器的无焊接连接系统,其中每个U形梁的一端设置有彼此分开形成凸片的侧面和背面。 突片可以朝向由U形梁形成的通道向内弯曲或折叠约90度。 背部突片可以是侧翼片的两倍长,并且翼片的额外的半长度可以在双重厚度的U形梁的背面向后折叠180度左右。 每个突片都有一个穿过其中的孔。 双重长度的后盖有两个孔; 通过每一半提供一个孔。 当卡舌向内弯曲时,孔对齐。 通过对准的孔放置的螺栓和垫圈可以用于将突片(U形梁)固定到炉顶结构。 提供了本发明的替代实施例,其中只有U形梁的侧面形成延伸超过U形梁底部的突片。