Abstract:
A memory includes a memory cell, one bitline coupled to the memory cell, a sense amplifier coupled to the one bitline, a timing circuit configured to enable the sense amplifier during a read operation, a control circuit configured to enable the sense amplifier independent of the timing circuit, and a pull-up circuit configured to pull up the one bitline while the sense amplifier is enabled by the control circuit. The method includes enabling a sense amplifier in a read operation by a timing circuit. The sense amplifier is coupled to at least one bitline, and the at least one bitline is coupled to a memory cell. The method further includes enabling the sense amplifier independent of the timing circuit in a second operation and pulling up the at least one bitline by a pull-up circuit while the sense amplifier is enabled in the second operation.
Abstract:
A system may be provided that provides redundancy for a plurality of embedded memories such as SRAMs. The system may include one or more decoders, each capable of decoding a selection address to identify a defective one of the embedded memories.
Abstract:
A memory and a method to operate the memory are provided. The memory includes a plurality of memory cells and a wordline driver configured to output a wordline. The memory cells are coupled to the wordline. A control circuit is configured to supply an operating voltage to the memory cells and to the wordline driver. A voltage-adjustment circuit is configured to adjust the operating voltage supplied to the memory cells during the control circuit supplying the operating voltage to the memory cells and to the wordline driver. The method includes supplying an operating voltage to at least one memory cells and to a wordline coupled to the at least one memory cells and adjusting the operating voltage supplied to the at least one memory cells during the supplying the operating voltage to the at least one memory cells and to the wordline.
Abstract:
A memory is provided that includes a row decoder that decodes an address into a plurality of decoded signals for selecting a word line to be asserted from a plurality of word lines. Each word line is driven through a decoder level-shifter that processes the decoded signals. Each decoder level-shifter corresponds to a unique combination of the decoded signals. The row decoder is in a logic power domain such that the decoded signals are asserted to a logic power supply voltage. When a decoder level-shifter's unique combination of decoded signals are asserted by the row decoder, the decoder level-shifter drives the corresponding word line with a memory power supply voltage for a memory power domain.
Abstract:
A system may be provided that provides redundancy for a plurality of embedded memories such as SRAMs. The system may include one or more decoders, each capable of decoding a selection address to identify a defective one of the embedded memories.
Abstract:
A semiconductor apparatus is provided herein for reducing power when transmitting data between a first device and a second device in the semiconductor apparatus. Additional circuitry is added to the semiconductor apparatus to create a communication system that decreases a number of state changes for each signal line of a data bus between the first device and the second device for all communications. The additional circuitry includes a decoder coupled to receive and convert a value from the first device for transmission over the data bus to an encoder that provides a recovered (i.e., re-encoded) version of the value to the second device. One or more multiplexers may also be included in the additional circuitry to support any number of devices.
Abstract:
A memory is provided that is configured to practice a sleep mode without retention in which a both bitcell array and a memory periphery are powered down responsive to an assertion of sleep mode without retention control signal. The sleep mode without retention control signal is also asserted during a DVS scan to power down the bitcell array. The memory includes a power management circuit that responds to an assertion of a DVS scan control signal to prevent the assertion of the sleep mode without retention control signal from causing a power down of the memory periphery during the DVS scan. The memory periphery may thus be thoroughly tested by the DVS scan because leakage current from the bitcell array is prevented by the powering down of the bitcell array.
Abstract:
A pseudo-triple-port memory is provided with read datapaths and write datapaths. The pseudo-triple-port memory includes a plurality of pseudo-triple-port bitcells, each pseudo-triple-port first bitcell having a first read port coupled to a first bit line, a second read port coupled to a second bit line, and a write port coupled to the first bit line and to the second bit line.
Abstract:
Certain aspects of the present disclosure are directed to a memory system. The memory system generally includes a word line (WL) driver circuit comprising a transistor coupled between a WL of a memory and a reference potential node. The memory system also includes a clamping circuit having logic configured to generate a control signal to drive a gate of the transistor such that the control signal is floating when the first head switch is open, and a first head switch coupled between a voltage rail and a supply input of the logic.
Abstract:
A memory is provided that is configured to practice both a normal read operation and also a burst mode read operation. A burst mode address comparator compares a current row address to a previous row address to determine whether a read operation is a normal read operation or a burst mode read operation.