摘要:
In a method or apparatus such as an integrated circuit (IC) chip including a plurality of circuits for executing a plurality of testmodes, a testmode entry code specifying one of the plurality of testmodes and one of an unrestricted private testmode category and a restricted public testmode category is received. Execution of only a public testmode of the plurality of testmodes is enabled when the testmode entry code specifies the restricted public testmode category. Execution of all of the plurality of testmodes is enabled when the testmode entry code specifies the unrestricted private testmode category.
摘要:
A memory device includes a memory array containing a plurality of memory addresses. An input terminal receives a requested one of the memory addresses and a memory controller is configured to refresh a first refresh address in response to a comparison of the received memory address and the first refresh address. In certain embodiments, the first refresh address is refreshed if it does not conflict with the received memory. If the first refresh address and the received memory address conflict, a second refresh address is refreshed. The received memory address is accessed simultaneously with the refresh in exemplary embodiments.
摘要:
A memory circuit comprises a memory including a memory array, a twin cell mode predecoder, and a row address predecoder. The memory array comprises word lines. The twin cell mode predecoder is configured for selecting one of four word line activation configurations for the memory array. The four word line activation configurations include three twin cell word line activation configurations and a single cell word line activation configuration. The row address predecoder is configured for selecting one of four word lines if the single cell word line activation configuration is selected.
摘要:
An integrated circuit device including a plurality of MOSFETs of similar type and geometry is formed on a substrate with an ohmic contact, and an adjustable voltage source on the die utilizing clearable fuses is coupled between the ohmic contact and the sources of the MOSFETs. After die processing, a post-processing test is performed to measure an operating characteristic of the die such as leakage current or switching speed, and an external voltage source is applied and adjusted to control the operating characteristic. The on-die fuses are then cleared to adjust the on-die voltage source to match the externally applied voltage. The operating characteristic may be determined by including a test circuit on the die to exhibit the operating characteristic such as a ring oscillator frequency. This approach to controlling manufacturing-induced device performance variations is well suited to efficient manufacture of small feature-size circuits such as DRAMs.
摘要:
A clock filter for use in filtering an external clock signal to create an internal clock signal for use by an electronic device is provided. The clock filter receives the external clock signal and sets the internal clock signal high when the external clock signal is above a first threshold and sets the internal clock signal low when the external clock signal is below a second threshold. The clock filter holds the internal clock signal constant for a period of time after the clock transitions.
摘要:
A logic circuit implementing a logic function and method of manufacture thereof. The logic circuit includes a series connection of two or more CMOS devices, at least one CMOS device having a threshold voltage at an input lower than a threshold voltage at an input of another of the CMOS devices. The CMOS logic circuit exhibits enhanced switching speed for logic operations and reduced leakage current when operating in an off-state. A logic family is built around the series connection of two or more devices having mixed voltage threshold inputs for enhanced switching speed and reduced off-current leakage.
摘要:
A configuration for crosstalk attenuation in substantially mutually parallel word lines of DRAM circuits, includes a decoder provided at a first end of a word line, and a holding transistor. A pull-down device is provided as a "noise killer" at a second end of the word line, which opposite the first end. The pull-down device pulls down the potential of the word line in a standby and hold mode in the event of an active adjacent word line.
摘要:
An insulating layer is grown on a principal face of a substrate that comprises a source terminal region. A first opening wherein the surface of the source terminal region is partially uncovered is provided in the insulating layer. A vertical layer sequence that comprises at least a channel region and a drain region for the MOS transistor is produced in the first opening by epitaxial growth of semiconductor material within situ doping. A second opening that is at least of a depth corresponding to the sum of the thicknesses of drain region and channel region is produced in the layer structure, a gate dielectric is applied on the surface thereof and a gate-electrode is applied on said gate dielectric.
摘要:
Described are dynamic, random-access memories (DRAM) architectures and methods for subdividing memory activation into fractions of a page. Circuitry in support of sub-page activation is placed in the intersections of local wordline drivers and sense-amplifier stripes to allow independent control of adjacent arrays of memory cells without significant area overhead.
摘要:
A memory system includes wordlines and pairs of complementary bitlines that provide access to memory storage elements. Capacitive and resistive loads associated with wordlines and bitlines are driven relatively slowly between voltage levels to reduce peak current, and thus power dissipation. Power dissipation is further reduced by charging complementary bitlines at substantially different rates.