公开(公告)号：US20060098494A1

公开(公告)日：2006-05-11

申请号：US11316119

申请日：2005-12-21

申请人： Dat Tran ,  Kiran Ponnuru ,  Jian Chen ,  Jeffrey Lutze ,  Jun Wan

发明人： Dat Tran ,  Kiran Ponnuru ,  Jian Chen ,  Jeffrey Lutze ,  Jun Wan

IPC分类号： G11C16/04

CPC分类号： G11C16/3468

摘要： Systems and methods in accordance with various embodiments can provide for comprehensive erase verification and defect detection in non-volatile semiconductor memory. In one embodiment, the results of erasing a group of storage elements is verified using a plurality of test conditions to better detect defective and/or insufficiently erased storage elements of the group. For example, the results of erasing a NAND string can be verified by testing charging of the string in a plurality of directions with the storage elements biased to turn on if in an erased state. If a string of storage elements passes a first test process or operation but fails a second test process or operation, the string can be determined to have failed the erase process and possibly be defective. By testing charging or conduction of the string in a plurality of directions, defects in any transistors of the string that are masked under one set of conditions may be exposed under a second set of bias conditions. For example, a string may pass an erase verification operation but then be read as including one or more programmed storage elements. Such a string can be defective and mapped out of the memory device.

公开(公告)号：US20050180186A1

公开(公告)日：2005-08-18

申请号：US10778634

申请日：2004-02-13

申请人： Jeffrey Lutze ,  Nima Mokhlesi

发明人： Jeffrey Lutze ,  Nima Mokhlesi

IPC分类号： G11C11/56 ,  G11C16/04 ,  H01L21/8247 ,  H01L27/115 ,  G11C7/02

CPC分类号： G11C11/5642 ,  G11C11/5628 ,  G11C2211/5621 ,  H01L27/115 ,  H01L27/11521 ,  H01L29/7887

摘要： A memory system is disclosed that includes a set of non-volatile storage elements. Each of said non-volatile storage elements includes source/drain regions at opposite sides of a channel in a substrate and a floating gate stack above the channel. The memory system also includes a set of shield plates positioned between adjacent floating gate stacks and electrically connected to the source/drain regions for reducing coupling between adjacent floating gates. The shield plates are selectively grown on the active areas of the memory without being grown on the inactive areas. In one embodiment, the shield plates are epitaxially grown silicon positioned above the source/drain regions.

摘要翻译： 公开了一种包括一组非易失性存储元件的存储器系统。 每个所述非易失性存储元件包括在衬底中的通道的相对侧处的源极/漏极区域和在沟道上方的浮动栅极堆叠。 存储器系统还包括位于相邻浮动栅极堆叠之间并电连接到源极/漏极区域的一组屏蔽板，用于减少相邻浮动栅极之间的耦合。 屏蔽板选择性地生长在存储器的有效区域上，而不会在非活动区域上生长。 在一个实施例中，屏蔽板是位于源/漏区上方的外延生长的硅。

公开(公告)号：US20050057968A1

公开(公告)日：2005-03-17

申请号：US10665685

申请日：2003-09-17

申请人： Jeffrey Lutze ,  Jian Chen ,  Yan Li ,  Kazunori Kanebako ,  Tomoharu Tanaka

发明人： Jeffrey Lutze ,  Jian Chen ,  Yan Li ,  Kazunori Kanebako ,  Tomoharu Tanaka

IPC分类号： G01R31/28 ,  G11C16/02 ,  G11C16/04 ,  G11C16/34 ,  G11C29/50 ,  G11C29/56 ,  H01L21/8247 ,  H01L27/115 ,  H01L29/788 ,  H01L29/792

CPC分类号： G11C16/3495 ,  G11C16/04 ,  G11C16/349 ,  G11C29/50 ,  G11C29/50004

摘要： The present invention presents a number of methods for identifying cells with poor subthreshold slope and reduced transconductance. A first set of techniques focuses on the poor subthreshold behavior of degraded storage elements by cycling cells and then programming them to a state above the ground state and the reading them with a control gate voltage below the threshold voltage of this state to see if they still conduct. A second set of embodiments focuses on weak transconductance behavior by reading programmed cells with a control gate voltage well above the threshold voltage. A third set of embodiments alters the voltage levels at the source-drain regions of the storage elements. The current-voltage curve of a good storage element is relatively stable under this shift in bias conditions, while degraded elements exhibit a larger shift. The amount of shift can be used to differentiate the good elements from the bad.

摘要翻译： 本发明提出了用于鉴别具有差的亚阈值斜率和降低的跨导的细胞的许多方法。 第一组技术集中在通过循环单元对劣化的存储元件的差的亚阈值行为进行编程，然后将它们编程到高于基态的状态，并以低于该状态的阈值电压的控制栅极电压读取它们，以查看它们是否仍然 进行。 第二组实施例通过利用远高于阈值电压的控制栅极电压读取编程单元来侧重于弱跨导行为。 第三组实施例改变存储元件的源极 - 漏极区域处的电压电平。 在偏置条件下的这种偏移下，良好存储元件的电流 - 电压曲线相对稳定，而退化元件表现出较大的偏移。 偏移量可以用来区分好的元素和坏的元素。

公开(公告)号：US07440318B2

公开(公告)日：2008-10-21

申请号：US12021729

申请日：2008-01-29

申请人： Yupin Fong ,  Jun Wan ,  Jeffrey Lutze

发明人： Yupin Fong ,  Jun Wan ,  Jeffrey Lutze

IPC分类号： G11C11/34

CPC分类号： G11C16/3418 ,  G11C16/3427

摘要： A system is disclosed for reducing or removing a form of read disturb in a non-volatile storage device. One embodiment seeks to prevent read disturb by eliminating or minimizing boosting of the channel of the memory elements. For example, one implementation prevents or reduces boosting of the source side of the NAND string channel during a read process. Because the source side of the NAND string channel is not boosted, at least one form of read disturb is minimized or does not occur.

摘要翻译： 公开了一种用于减少或去除非易失性存储设备中的读取干扰形式的系统。 一个实施例旨在通过消除或最小化存储器元件的通道的升高来防止读取干扰。 例如，一个实施方式在读取过程期间防止或减少NAND串通道的源极侧的升压。 因为NAND串通道的源极侧不被提升，所以读取干扰的至少一种形式被最小化或不发生。

公开(公告)号：US20080137423A1

公开(公告)日：2008-06-12

申请号：US12021729

申请日：2008-01-29

申请人： Yupin Fong ,  Jun Wan ,  Jeffrey Lutze

发明人： Yupin Fong ,  Jun Wan ,  Jeffrey Lutze

IPC分类号： G11C16/06

CPC分类号： G11C16/3418 ,  G11C16/3427

摘要： A system is disclosed for reducing or removing a form of read disturb in a non-volatile storage device. One embodiment seeks to prevent read disturb by eliminating or minimizing boosting of the channel of the memory elements. For example, one implementation prevents or reduces boosting of the source side of the NAND string channel during a read process. Because the source side of the NAND string channel is not boosted, at least one form of read disturb is minimized or does not occur.

公开(公告)号：US20080019180A1

公开(公告)日：2008-01-24

申请号：US11866261

申请日：2007-10-02

申请人： Jun Wan ,  Jeffrey Lutze ,  Masaaki Higashitani ,  Gerrit Hemink ,  Ken Oowada ,  Jian Chen ,  Geoffrey Gongwer

发明人： Jun Wan ,  Jeffrey Lutze ,  Masaaki Higashitani ,  Gerrit Hemink ,  Ken Oowada ,  Jian Chen ,  Geoffrey Gongwer

IPC分类号： G11C11/34 ,  G11C16/04 ,  G11C16/06

CPC分类号： G11C16/3418

摘要： A non-volatile memory system is programmed so as to reduce or avoid program disturb. In accordance with one embodiment, multiple program inhibit schemes are employed for a single non-volatile memory system. Program inhibit schemes are selected based on the word line being programmed. Certain program inhibit schemes have been discovered to better minimize or eliminate program disturb at select word lines. In one embodiment, selecting a program inhibit scheme includes selecting a program voltage pulse ramp rate. Different ramp rates have been discovered to better minimize program disturb when applied to select word lines. In another embodiment, the temperature of a memory system is detected before or during a program operation. A program inhibit scheme can be selected based on the temperature of the system.

摘要翻译： 编程非易失性存储器系统以减少或避免编程干扰。 根据一个实施例，对于单个非易失性存储器系统采用多个程序禁止方案。 基于正在编程的字线选择程序禁止方案。 已经发现某些程序禁止方案能够更好地最小化或消除选择字线上的程序干扰。 在一个实施例中，选择编程禁止方案包括选择编程电压脉冲斜率。 在应用于选择字线时，已经发现了不同的斜率以更好地最小化程序干扰。 在另一个实施例中，在程序操作之前或期间检测存储器系统的温度。 可以基于系统的温度来选择程序禁止方案。

公开(公告)号：US07295478B2

公开(公告)日：2007-11-13

申请号：US11127743

申请日：2005-05-12

申请人： Jun Wan ,  Jeffrey Lutze ,  Masaaki Higashitani ,  Gerrit Jan Hemink ,  Ken Oowada ,  Jian Chen ,  Geoffrey S. Gongwer

发明人： Jun Wan ,  Jeffrey Lutze ,  Masaaki Higashitani ,  Gerrit Jan Hemink ,  Ken Oowada ,  Jian Chen ,  Geoffrey S. Gongwer

IPC分类号： G11C7/00

CPC分类号： G11C16/3418

摘要： A non-volatile memory system is programmed so as to reduce or avoid program disturb. In accordance with one embodiment, multiple program inhibit schemes are employed for a single non-volatile memory system. Program inhibit schemes are selected based on the word line being programmed. Certain program inhibit schemes have been discovered to better minimize or eliminate program disturb at select word lines. In one embodiment, selecting a program inhibit scheme includes selecting a program voltage pulse ramp rate. Different ramp rates have been discovered to better minimize program disturb when applied to select word lines. In another embodiment, the temperature of a memory system is detected before or during a program operation. A program inhibit scheme can be selected based on the temperature of the system.

摘要翻译： 编程非易失性存储器系统以减少或避免编程干扰。 根据一个实施例，对于单个非易失性存储器系统采用多个程序禁止方案。 基于正在编程的字线选择程序禁止方案。 已经发现某些程序禁止方案能够更好地最小化或消除选择字线上的程序干扰。 在一个实施例中，选择编程禁止方案包括选择编程电压脉冲斜率。 在应用于选择字线时，已经发现了不同的斜率以更好地最小化程序干扰。 在另一个实施例中，在程序操作之前或期间检测存储器系统的温度。 可以基于系统的温度来选择程序禁止方案。

公开(公告)号：US20070252192A1

公开(公告)日：2007-11-01

申请号：US11775808

申请日：2007-07-10

申请人： Nima Mokhlesi ,  Jeffrey Lutze

发明人： Nima Mokhlesi ,  Jeffrey Lutze

IPC分类号： H01L29/788 ,  H01L21/336

CPC分类号： H01L27/11521 ,  G11C16/0458 ,  H01L27/115 ,  H01L29/42328 ,  H01L29/42336 ,  H01L29/66825 ,  H01L29/7883

摘要： An array of a pillar-type nonvolatile memory cells (803) has each memory cell isolated from adjacent memory cells by a trench (810). Each memory cell is formed by a stacking process layers on a substrate: tunnel oxide layer (815), polysilicon floating gate layer (819), ONO or oxide layer (822), polysilicon control gate layer (825). Many aspects of the process are self-aligned. An array of these memory cells will require less segmentation. Furthermore, the memory cell has enhanced programming characteristics because electrons are directed at a normal or nearly normal angle (843) to the floating gate (819).

摘要翻译： 柱状非易失性存储单元（803）的阵列具有通过沟槽（810）与相邻存储单元隔离的每个存储单元。 每个存储单元由衬底上的堆叠处理层形成：隧道氧化物层（815），多晶硅浮动栅极层（819），ONO或氧化物层（822），多晶硅控制栅极层（825）。 这个过程的很多方面都是自相矛盾的。 这些存储单元的阵列将需要较少的分割。 此外，存储单元具有增强的编程特性，因为电子被引导到浮动栅极（819）的正常或几乎正常的角度（843）。

公开(公告)号：US20070127291A1

公开(公告)日：2007-06-07

申请号：US11296087

申请日：2005-12-06

申请人： Yupin Fong ,  Jun Wan ,  Jeffrey Lutze

发明人： Yupin Fong ,  Jun Wan ,  Jeffrey Lutze

IPC分类号： G11C16/04

CPC分类号： G11C16/3418 ,  G11C11/5628 ,  G11C11/5642 ,  G11C16/0483 ,  G11C16/3427

摘要： A system is disclosed for reducing or removing a form of read disturb in a non-volatile storage device. One embodiment seeks to prevent read disturb by eliminating or minimizing boosting of the channel of the memory elements. For example, one implementation prevents or reduces boosting of the source side of the NAND string channel during a read process. Because the source side of the NAND string channel is not boosted, at least one form of read disturb is minimized or does not occur.

公开(公告)号：US20070025157A1

公开(公告)日：2007-02-01

申请号：US11194439

申请日：2005-08-01

申请人： Jun Wan ,  Jeffrey Lutze

发明人： Jun Wan ,  Jeffrey Lutze

IPC分类号： G11C11/34 ,  G11C16/06 ,  G11C16/04

CPC分类号： G11C11/5628 ,  G11C16/0483 ,  G11C16/10 ,  G11C16/3454 ,  G11C16/3459 ,  G11C2211/5621

摘要： The maximum allowable number of voltage programming pulses to program memory elements of a non-volatile memory device is adjusted to account for changes in the memory elements which occur over time. Programming pulses are applied until the threshold voltage of one or more memory elements reaches a certain verify level, after which a defined maximum number of additional pulses may be applied to other memory elements to allow them to also reach associated target threshold voltage levels. The technique enforces a maximum allowable number of programming pulses that can change over time as the memory is cycled.

摘要翻译： 调整非易失性存储器件对程序存储器元件的电压编程脉冲的最大允许数量，以便考虑随时间发生的存储元件的变化。 施加编程脉冲，直到一个或多个存储器元件的阈值电压达到某个验证电平，之后可以将限定的最大数量的附加脉冲施加到其它存储器元件以允许它们也达到相关联的目标阈值电压电平。 该技术实现了随着存储器循环而随时间变化的最大允许编程脉冲数。