Semiconductor device having insulated gate bipolar transistor with dielectric isolation structure
    51.
    发明授权
    Semiconductor device having insulated gate bipolar transistor with dielectric isolation structure 失效
    具有绝缘栅双极晶体管的半导体器件,具有绝缘隔离结构

    公开(公告)号:US06677622B2

    公开(公告)日:2004-01-13

    申请号:US10090823

    申请日:2002-03-06

    IPC分类号: H01L2974

    CPC分类号: H01L29/66325 H01L29/7394

    摘要: A semiconductor substrate is of first-conductivity-type and has a principal surface. A first semiconductor region and a second semiconductor region are of second-conductivity-type and formed apart from each other in the principal surface of the semiconductor substrate. A third semiconductor region is of second-conductivity-type and formed on the first semiconductor region. The third semiconductor region has an impurity concentration higher than that of the first semiconductor region. A fourth semiconductor region is of first-conductivity-type and formed on the third semiconductor region. A first main electrode is formed on the fourth semiconductor region. A second main electrode is formed on the second semiconductor region. A gate electrode is formed, at least on the first semiconductor region and on the principal surface of the semiconductor substrate between the fourth semiconductor region and the second semiconductor region, with a gate insulating film therebetween.

    摘要翻译: 半导体衬底是第一导电型并具有主表面。 第一半导体区域和第二半导体区域是第二导电型并且在半导体衬底的主表面中彼此分开形成。 第三半导体区域是第二导电型并形成在第一半导体区域上。 第三半导体区域的杂质浓度高于第一半导体区域。 第四半导体区域是第一导电型并形成在第三半导体区域上。 第一主电极形成在第四半导体区域上。 第二主电极形成在第二半导体区域上。 至少在第一半导体区域和第四半导体区域与第二半导体区域之间的半导体衬底的主表面上形成栅电极,其间具有栅极绝缘膜。

    Method and apparatus for measuring FM frequency deviation
    55.
    发明授权
    Method and apparatus for measuring FM frequency deviation 失效
    用于测量FM频率偏差的方法和装置

    公开(公告)号:US5771443A

    公开(公告)日:1998-06-23

    申请号:US530717

    申请日:1995-09-15

    摘要: An FM input signal V(t) is A/D converted, then an in-phase component I and a quadrature component Q are obtained. Then, an instantaneous phase .theta.=tan.sup.-1 (Q/I) of the V(t) is obtained and also an instantaneous frequency of the modulated signal f.sub.a (t)=(1/2.pi.)d.theta./dt is obtained. Alternately, f.sub.a (t)=(IdQ/dt-QdI/dt)/{2.pi.(I.sup.2 +Q.sup.2)} is directly obtained from I and Q. A positive peak P+ and a negative peak P- of the obtained f.sub.a (t) is detected to display the average value of these as a frequency deviation.

    摘要翻译: FM输入信号V(t)被A / D转换,然后获得同相分量I和正交分量Q。 然后,获得V(t)的瞬时相位θ= tan-1(Q / I),并且调制信号的瞬时频率fa(t)=(+ E,fra 1/2 + EE pi)d theta / dt。 或者,从I和Q直接获得fa(t)=(IdQ / dt-QdI / dt)/ {2 pi(I2 + Q2)}。获得的fa(t)的正峰值P +和负峰值P- )被检测为将它们的平均值显示为频率偏差。

    Projector
    56.
    发明授权
    Projector 失效
    投影机

    公开(公告)号:US5676441A

    公开(公告)日:1997-10-14

    申请号:US692517

    申请日:1996-08-05

    申请人: Hitoshi Takahashi

    发明人: Hitoshi Takahashi

    摘要: A projector includes a plurality of cabinets arranged in rows and columns and each of the cabinets has a screen located at its front end with a plurality of the screens being adapted to collectively form a large display screen on which an image is formed. The cabinet further includes a screen a screen frame for holding edges of the screen, a screen holder, which is secured to the screen by the screen frame, a screen bracket for mounting the screen holder to the cabinet, a mechanism for securing the screen holder to the screen bracket and permitting disconnection of the screen holder from the screen bracket when the screen holder is pushed rearwardly toward the screen bracket, and a slide mechanism mounted on one side of the screen bracket and the screen holder and adapted to permit reciprocal movement of the screen holder relative to the cabinet when the screen holder is disconnected from the screen bracket.

    摘要翻译: 一种投影仪包括以行和列布置的多个机柜,并且每个机柜具有位于其前端的屏幕,多个屏幕适于共同形成形成图像的大型显示屏幕。 该橱柜还包括屏幕,用于保持屏幕边缘的屏幕框架,通过屏幕框架固定到屏幕的屏幕保持器,用于将屏幕保持器安装到机壳的屏幕支架,用于固定屏幕保持架的机构 当屏幕保持器向后推动到屏幕支架时,允许屏幕保持器与屏幕支架断开;以及滑动机构,其安装在屏幕支架和屏幕保持器的一侧,并且适于允许屏幕支架相互移动, 当屏幕支架与屏幕支架断开时,屏幕支架相对于机柜。

    Waste paper processing system
    58.
    发明授权

    公开(公告)号:US5538193A

    公开(公告)日:1996-07-23

    申请号:US453876

    申请日:1995-05-30

    摘要: A waste paper processing system includes an upper shredding portion and a lower compressing portion. The shredding portion includes to horizontally parallel shafts mounting thereon a plurality of circular blades. The shafts are rotated to spin outwardly of a space between the shafts from a paper feeding direction. Presser arms are provided for retaining paper from above during shredding and stopper arms and a filter portion are provided below the blades to assure the paper is shredded sufficiently. After shredding the paper falls into a hopper and is introduced via a rotor to the compression portion. In the compression portion a screw is rotated for urging the shredded paper into a compression tube the tube as a narrower portion at the lower end for assuring sufficient compression of the shredded paper. In addition, water is added to the shredded paper in the upper side of the compression tube for binding the shredded paper together as pulp. A sensor arrangement is provided for assuring sufficient water is introduced to the shredded paper automatically during compression operation. After the pulp is output from the compression portion, a conveyer arrangement is provided for loading the pulp into a tray or bag to facilitate easy disposal or recycling.

    Double-gated integrating scheme for electron beam tester
    59.
    发明授权
    Double-gated integrating scheme for electron beam tester 失效
    电子束测试仪双栅集成方案

    公开(公告)号:US5210487A

    公开(公告)日:1993-05-11

    申请号:US710768

    申请日:1991-06-04

    CPC分类号: G01R31/305

    摘要: A surface is probed with a pulsed electron beam and secondary electrons are detected to produce a detector signal. First portions of the detector signal are substantially dependent on the voltage of the surface being probed, while second portions of the detector signal are substantially independent of the voltage of the surface being probed. In general, the first and second portions of the detector signal include unwanted noise caused by low-level sampling due to beam leakage and/or by scintillator afterglow in the secondary-electron detector. The detector signal is sampled during the first signal portions and is sampled during the second signal portions. The sampled first signal portions are combined with the complement of the sampled second signal portions to produce a measured voltage signal representing voltage of the conductor. In a preferred sampling scheme, alternate electron-beam sampling pulses are held-off. A first gate samples the secondary-electron detector signal when sampling pulses are not held off. A second gate samples the secondary-electron detector signal when sampling pulses are held off, and these samples are inverted. The samples from the first gate are combined with the inverted samples from the second gate to substantially cancel unwanted background noise caused by beam leakage and/or scintillator afterglow after sufficient integration.