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51.
公开(公告)号:US11409352B2
公开(公告)日:2022-08-09
申请号:US16354040
申请日:2019-03-14
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Vipin Tiwari , Mark Reiten , Nhan Do
Abstract: Numerous embodiments of power management techniques are disclosed for various operations involving one or more vector-by-matrix multiplication (VMM) arrays within an artificial neural network.
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公开(公告)号:US11158374B2
公开(公告)日:2021-10-26
申请号:US16930777
申请日:2020-07-16
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Nhan Do , Vipin Tiwari , Mark Reiten
Abstract: Numerous embodiments are disclosed for providing temperature compensation in a an analog memory array. The analog memory array optionally is a vector-by-matrix multiplier in an analog neuromorphic memory system used in a deep learning neural network. One embodiment comprises measuring an operating temperature within a memory array and applying, by a temperature compensation block, a bias voltage to a terminal of a memory cell in the array, wherein the bias voltage is a function of the operating temperature.
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公开(公告)号:US20210174185A1
公开(公告)日:2021-06-10
申请号:US17181656
申请日:2021-02-22
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Vipin Tiwari , Mark Reiten , Nhan Do
Abstract: Numerous output circuits are disclosed for an analog neural memory system for a deep learning neural network. In one embodiment, an adaptable neuron circuit receives output current from a neuron and converts it into a voltage. In another embodiment, a current sample and hold circuit samples an input current and generates an output current. In another embodiment, a voltage sample and hold circuit samples an input voltage and generates an output voltage.
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公开(公告)号:US10755783B2
公开(公告)日:2020-08-25
申请号:US16183250
申请日:2018-11-07
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Nhan Do , Vipin Tiwari , Mark Reiten
Abstract: Numerous embodiments are disclosed for providing temperature compensation and leakage compensation for an analog neuromorphic memory system used in a deep learning neural network. The embodiments for providing temperature compensation implement discreet or continuous adaptive slope compensation and renormalization for devices, reference memory cells, or selected memory cells in the memory system. The embodiments for providing leakage compensation within a memory cell in the memory system implement adaptive erase gate coupling or the application of a negative bias on a control gate terminal, a negative bias on a word line terminal, or a bias on a source line terminal.
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公开(公告)号:US10699779B2
公开(公告)日:2020-06-30
申请号:US16382013
申请日:2019-04-11
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C16/04 , G11C11/54 , G06N3/04 , H01L29/423 , G11C16/14 , H01L27/11521 , G11C16/10
Abstract: A neural network device having a first plurality of synapses that includes a plurality of memory cells. Each memory cell includes a floating gate over a first portion of a channel region and a first gate over a second portion of the channel region. The memory cells are arranged in rows and columns. A plurality of first lines each electrically connect together the first gates in one of the memory cell rows, a plurality of second lines each electrically connect together the source regions in one of the memory cell rows, and a plurality of third lines each electrically connect together the drain regions in one of the memory cell columns. The first plurality of synapses receives a first plurality of inputs as electrical voltages on the plurality of third lines, and provides a first plurality of outputs as electrical currents on the plurality of second lines.
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56.
公开(公告)号:US20200066345A1
公开(公告)日:2020-02-27
申请号:US16183250
申请日:2018-11-07
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Nhan Do , Vipin Tiwari , Mark Reiten
Abstract: Numerous embodiments are disclosed for providing temperature compensation and leakage compensation for an analog neuromorphic memory system used in a deep learning neural network. The embodiments for providing temperature compensation implement discreet or continuous adaptive slope compensation and renormalization for devices, reference memory cells, or selected memory cells in the memory system. The embodiments for providing leakage compensation within a memory cell in the memory system implement adaptive erase gate coupling or the application of a negative bias on a control gate terminal, a negative bias on a word line terminal, or a bias on a source line terminal.
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公开(公告)号:US10373686B2
公开(公告)日:2019-08-06
申请号:US15660552
申请日:2017-07-26
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Hung Quoc Nguyen , Mark Reiten
Abstract: A three-dimensional flash memory system is disclosed. The system comprises a memory array comprising a plurality of stacked dies, where each die comprises memory cells. The system further comprises a plurality of pins, where the function of at least some of the pins can be configured using a mechanism that selects a function for those pins from a plurality of possible functions.
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公开(公告)号:US20170323682A1
公开(公告)日:2017-11-09
申请号:US15660552
申请日:2017-07-26
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Hung Quoc Nguyen , Mark Reiten
CPC classification number: G11C16/08 , G11C7/1045 , G11C7/1057 , G11C16/04 , G11C2207/105 , H01L24/13 , H01L24/14 , H01L24/16 , H01L25/0652 , H01L25/0657 , H01L25/18 , H01L2224/14181 , H01L2224/16145 , H01L2224/16225 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2924/1431 , H01L2924/1432 , H01L2924/1434 , H01L2924/1435 , H01L2924/1438 , H01L2924/15311 , H01L2924/157
Abstract: A three-dimensional flash memory system is disclosed. The system comprises a memory array comprising a plurality of stacked dies, where each die comprises memory cells. The system further comprises a plurality of pins, where the function of at least some of the pins can be configured using a mechanism that selects a function for those pins from a plurality of possible functions.
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公开(公告)号:US12200926B2
公开(公告)日:2025-01-14
申请号:US17949962
申请日:2022-09-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: H10B41/42 , G06N3/08 , G11C16/04 , H01L29/788
Abstract: Numerous examples of an input function circuit block and an output neuron circuit block coupled to a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one example, an artificial neural network comprises a vector-by-matrix multiplication array comprising a plurality of non-volatile memory cells organized into rows and columns; an input function circuit block to receive digital input signals, convert the digital input signals into analog signals, and apply the analog signals to control gate terminals of non-volatile memory cells in one or more rows of the array during a programming operation; and an output neuron circuit block to receive analog currents from the columns of the array during a read operation and generate an output signal.
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公开(公告)号:US20240282369A1
公开(公告)日:2024-08-22
申请号:US18645184
申请日:2024-04-24
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Steven Lemke , Vipin Tiwari , Nhan Do , Mark Reiten
IPC: G11C11/54 , G06N3/045 , G11C16/04 , G11C16/10 , G11C16/14 , H01L29/423 , H01L29/788 , H10B41/30
CPC classification number: G11C11/54 , G06N3/045 , G11C16/0483 , G11C16/10 , G11C16/14 , H01L29/42324 , H01L29/42328 , H01L29/7883 , H10B41/30
Abstract: A neural network device with synapses having memory cells each having a floating gate and a first gate over first and second portions of a channel region disposed between source and drain regions, and a second gate over the floating gate or the source region. First lines each electrically connect the first gates in one of the memory cell rows, second lines each electrically connect the second gates in one of the memory cell rows, third lines each electrically connect the source regions in one of the memory cell rows, and fourth lines each electrically connect the drain regions in one of the memory cell columns. The synapses receive a first plurality of inputs as electrical voltages on the fourth lines, and provide a first plurality of outputs as electrical currents on the third lines.
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