公开(公告)号：US5201503A

公开(公告)日：1993-04-13

申请号：US778361

申请日：1991-10-17

申请人： Toshikazu Matsui ,  Hiromi Sakata ,  Masanori Itakiyo ,  Kunihiko Ishikawa ,  Kenzo Ono

发明人： Toshikazu Matsui ,  Hiromi Sakata ,  Masanori Itakiyo ,  Kunihiko Ishikawa ,  Kenzo Ono

IPC分类号： B41J29/00 ,  B42B4/00 ,  B42C1/12 ,  B65H39/11 ,  G03G15/00

CPC分类号： G03G15/6541 ,  B42C1/125 ,  B65H39/11 ,  G03G15/6538 ,  B65H2408/113 ,  B65H2408/1141 ,  G03G2215/00827

摘要： A sorter incorporating a stapler sorts and staples sheets discharged from a discharger of an image forming apparatus. The sorter includes a plurality of bins, a stapler, a stacker, and a supplying/discharging mechanism. The plurality of bins are vertically arranged and vertically movable. The stapler staples a stack of sheets stored in each of the bins. The stacker stores the bundles of sheets stapled by the stapler. The supplying/discharging mechanism supplies into the bins of the sorter the sheets discharged from the discharger, and discharges the bundles of sheets stapled by the stapler into the stacker.

公开(公告)号：US4914349A

公开(公告)日：1990-04-03

申请号：US112490

申请日：1987-10-26

申请人： Toshikazu Matsui ,  Takeo Sugawara

发明人： Toshikazu Matsui ,  Takeo Sugawara

IPC分类号： H01J40/02 ,  H01J29/89 ,  H01J43/28

CPC分类号： H01J43/28 ,  H01J29/892

摘要： A photo electric conversion tube in which a translucent photocathode surface is provided inside of an incident light window. The incident light window is made of glass plate and an optical fiber plate bonded to at least part of the glass plate or just the optical fiber plate on the photocathode surface. The optical fiber plate contains fibers which are inclined at an angle to the photocathode surface.

摘要翻译： 一种光电转换管，其中在入射光窗内设置有半透明光电阴极表面。 入射光窗由玻璃板和光纤板制成，该光纤板与玻璃板的至少一部分或仅在光电阴极表面上的光纤板接合。 光纤板含有与光电阴极表面倾斜一定角度的纤维。

公开(公告)号：US08530958B2

公开(公告)日：2013-09-10

申请号：US12718002

申请日：2010-03-05

申请人： Koichi Toba ,  Yasushi Ishii ,  Yoshiyuki Kawashima ,  Satoru Machida ,  Munekatsu Nakagawa ,  Kentaro Saito ,  Toshikazu Matsui ,  Takashi Hashimoto ,  Kosuke Okuyama

发明人： Koichi Toba ,  Yasushi Ishii ,  Yoshiyuki Kawashima ,  Satoru Machida ,  Munekatsu Nakagawa ,  Kentaro Saito ,  Toshikazu Matsui ,  Takashi Hashimoto ,  Kosuke Okuyama

IPC分类号： H01L29/792

CPC分类号： H01L29/42324 ,  H01L21/28273 ,  H01L21/28282 ,  H01L27/115 ,  H01L27/11526 ,  H01L27/11531 ,  H01L29/66825 ,  H01L29/66833 ,  H01L29/7885

摘要： A semiconductor device having a non-volatile memory is disclosed, whose disturb defect can be diminished or prevented. A memory cell of the non-volatile memory has a memory gate electrode formed over a main surface of a semiconductor substrate through an insulating film for charge storage. A first side wall is formed on a side face of the memory gate electrode, and at a side face of the first side wall, a second side wall is formed. On an upper surface of an n+-type semiconductor region for source in the memory cell there is formed a silicide layer whose end portion on the memory gate electrode MG side is defined by the second side wall.

摘要翻译： 公开了一种具有非易失性存储器的半导体器件，其干扰缺陷可被减弱或防止。 非易失性存储器的存储单元具有通过用于电荷存储的绝缘膜形成在半导体衬底的主表面上的存储栅电极。 第一侧壁形成在存储栅电极的侧面上，在第一侧壁的侧面形成有第二侧壁。 在存储单元中用于源极的n +型半导体区域的上表面上形成硅化物层，其存储栅极电极MG侧的端部由第二侧壁限定。

公开(公告)号：US08258561B2

公开(公告)日：2012-09-04

申请号：US13307424

申请日：2011-11-30

申请人： Yoshiyuki Kawashima ,  Koichi Toba ,  Yasushi Ishii ,  Toshikazu Matsui ,  Takashi Hashimoto

发明人： Yoshiyuki Kawashima ,  Koichi Toba ,  Yasushi Ishii ,  Toshikazu Matsui ,  Takashi Hashimoto

IPC分类号： H01L27/08

CPC分类号： H01L28/60 ,  H01L27/0629 ,  H01L27/0805 ,  H01L27/105 ,  H01L27/10805 ,  H01L27/11526 ,  H01L27/11531 ,  H01L27/11573 ,  H01L28/40

摘要： In connection with a semiconductor device including a capacitor element there is provided a technique capable of improving the reliability of the capacitor element. A capacitor element is formed in an element isolation region formed over a semiconductor substrate. The capacitor element includes a lower electrode and an upper electrode formed over the lower electrode through a capacitor insulating film. Basically, the lower electrode and the upper electrode are formed from polysilicon films and a cobalt silicide film formed over the surfaces of the polysilicon films. End portions of the cobalt silicide film formed over the upper electrode are spaced apart a distance from end portions of the upper electrode. Besides, end portions of the cobalt silicide film formed over the lower electrode are spaced apart a distance from boundaries between the upper electrode and the lower electrode.

摘要翻译： 关于包括电容器元件的半导体器件，提供了一种能够提高电容器元件的可靠性的技术。 电容器元件形成在半导体衬底上形成的元件隔离区域中。 电容器元件包括通过电容器绝缘膜形成在下电极上的下电极和上电极。 基本上，下电极和上电极由形成在多晶硅膜的表面上的多晶硅膜和硅化钴膜形成。 形成在上电极上的钴硅化物膜的端部与上电极的端部间隔开一定距离。 此外，形成在下电极上的钴硅化物膜的端部与上电极和下电极之间的边界间隔一定距离。

公开(公告)号：US07863135B2

公开(公告)日：2011-01-04

申请号：US12706668

申请日：2010-02-16

申请人： Takeshi Sakai ,  Yasushi Ishii ,  Tsutomu Okazaki ,  Masaru Nakamichi ,  Toshikazu Matsui ,  Kyoya Nitta ,  Satoru Machida ,  Munekatsu Nakagawa ,  Yuichi Tsukada

发明人： Takeshi Sakai ,  Yasushi Ishii ,  Tsutomu Okazaki ,  Masaru Nakamichi ,  Toshikazu Matsui ,  Kyoya Nitta ,  Satoru Machida ,  Munekatsu Nakagawa ,  Yuichi Tsukada

IPC分类号： H01L21/00

CPC分类号： H01L27/11568 ,  H01L21/823842 ,  H01L21/82385 ,  H01L21/823857 ,  H01L21/823864 ,  H01L27/105 ,  H01L27/1052 ,  H01L27/11573

摘要： For enhancing the high performance of a non-volatile semiconductor memory device having an MONOS type transistor, a non-volatile semiconductor memory device is provided with MONOS type transistors having improved performance in which the memory cell of an MONOS non-volatile memory comprises a control transistor and a memory transistor. A control gate of the control transistor comprises an n-type polycrystal silicon film and is formed over a gate insulative film comprising a silicon oxide film. A memory gate of the memory transistor comprises an n-type polycrystal silicon film and is disposed on one of the side walls of the control gate. The memory gate comprises a doped polycrystal silicon film with a sheet resistance lower than that of the control gate comprising a polycrystal silicon film formed by ion implantation of impurities to the undoped silicon film.

摘要翻译： 为了增强具有MONOS型晶体管的非易失性半导体存储器件的高性能，非易失性半导体存储器件被提供有具有改进性能的MONOS型晶体管，其中MONOS非易失性存储器的存储单元包括控制 晶体管和存储晶体管。 控制晶体管的控制栅极包括n型多晶硅膜，并且形成在包括氧化硅膜的栅极绝缘膜上。 存储晶体管的存储栅极包括n型多晶硅膜，并设置在控制栅极的一个侧壁上。 存储器栅极包括具有低于控制栅极的薄层电阻的掺杂多晶硅膜，其包括通过将杂质离子注入未掺杂的硅膜形成的多晶硅膜。

公开(公告)号：US20100038700A1

公开(公告)日：2010-02-18

申请号：US12580289

申请日：2009-10-16

申请人： Tsutomu OKAZAKI ,  Daisuke Okada ,  Kyoya Nitta ,  Toshihiro Tanaka ,  Akira Kato ,  Toshikazu Matsui ,  Yasushi Ishii ,  Digh Hisamoto ,  Kan Yasui

发明人： Tsutomu OKAZAKI ,  Daisuke Okada ,  Kyoya Nitta ,  Toshihiro Tanaka ,  Akira Kato ,  Toshikazu Matsui ,  Yasushi Ishii ,  Digh Hisamoto ,  Kan Yasui

IPC分类号： H01L29/792

CPC分类号： H01L27/1157 ,  G11C16/0425 ,  H01L21/28282 ,  H01L27/0207 ,  H01L27/105 ,  H01L27/115 ,  H01L27/11568 ,  H01L29/0649 ,  H01L29/4234 ,  H01L29/42344 ,  H01L29/518 ,  H01L29/66833 ,  H01L29/792

摘要： A semiconductor memory array includes a first nonvolatile memory cell having a first charge storage layer and a first gate electrode and a second nonvolatile memory cell, adjacent to the first memory cell in a first direction, having a second charge storage layer and a second gate electrode. The first and second electrodes extend in a second direction perpendicular to the first direction, the first electrode has a first contact section extending toward the second electrode in the first direction, and the second electrode has a second contact section extending toward the first electrode in the first direction. The first and second contact positions are shifted in the second direction, respectively, and the first electrode and the first contact section are electrically separated from the second electrode and the second contact section.

摘要翻译： 半导体存储器阵列包括具有第一电荷存储层和第一非易失性存储单元的第一非易失性存储单元，第一非易失性存储单元与第一存储单元相邻，具有第二电荷存储层和第二栅电极 。 第一电极和第二电极在垂直于第一方向的第二方向上延伸，第一电极具有在第一方向上朝向第二电极延伸的第一接触部分，并且第二电极具有朝向第一电极的第二接触部分 第一个方向 第一和第二接触位置分别沿第二方向移动，第一电极和第一接触部分与第二电极和第二接触部分电气分离。

公开(公告)号：US07502257B2

公开(公告)日：2009-03-10

申请号：US11797164

申请日：2007-05-01

申请人： Tsutomu Okazaki ,  Daisuke Okada ,  Kyoya Nitta ,  Toshihiro Tanaka ,  Akira Kato ,  Toshikazu Matsui ,  Yasushi Ishii ,  Digh Hisamoto ,  Kan Yasui

发明人： Tsutomu Okazaki ,  Daisuke Okada ,  Kyoya Nitta ,  Toshihiro Tanaka ,  Akira Kato ,  Toshikazu Matsui ,  Yasushi Ishii ,  Digh Hisamoto ,  Kan Yasui

IPC分类号： G11C11/34

CPC分类号： H01L27/1157 ,  G11C16/0425 ,  H01L21/28282 ,  H01L27/0207 ,  H01L27/105 ,  H01L27/115 ,  H01L27/11568 ,  H01L29/0649 ,  H01L29/4234 ,  H01L29/42344 ,  H01L29/518 ,  H01L29/66833 ,  H01L29/792

摘要： A semiconductor memory array includes a first nonvolatile memory cell having a first charge storage layer and a first gate electrode and a second nonvolatile memory cell, adjacent to the first memory cell in a first direction, having a second charge storage layer and a second gate electrode. The first and second electrodes extend in a second direction perpendicular to the first direction, the first electrode has a first contact section extending toward the second electrode in the first direction, and the second electrode has a second contact section extending toward the first electrode in the first direction. The first and second contact positions are shifted in the second direction, respectively, and the first electrode and the first contact section are electrically separated from the second electrode and the second contact section.

公开(公告)号：US20080203466A1

公开(公告)日：2008-08-28

申请号：US12114074

申请日：2008-05-02

申请人： Takeshi SAKAI ,  Yasushi Ishii ,  Tsutomu Okazaki ,  Masaru Nakamichi ,  Toshikazu Matsui ,  Kyoya Nitta ,  Satoru Machida ,  Munekatsu Nakagawa ,  Yuichi Tsukada

发明人： Takeshi SAKAI ,  Yasushi Ishii ,  Tsutomu Okazaki ,  Masaru Nakamichi ,  Toshikazu Matsui ,  Kyoya Nitta ,  Satoru Machida ,  Munekatsu Nakagawa ,  Yuichi Tsukada

IPC分类号： H01L29/792

CPC分类号： H01L27/11568 ,  H01L21/823842 ,  H01L21/82385 ,  H01L21/823857 ,  H01L21/823864 ,  H01L27/105 ,  H01L27/1052 ,  H01L27/11573

摘要： For enhancing the high performance of a non-volatile semiconductor memory device having an MONOS type transistor, a non-volatile semiconductor memory device is provided with MONOS type transistors having improved performance in which the memory cell of an MONOS non-volatile memory comprises a control transistor and a memory transistor. A control gate of the control transistor comprises an n-type polycrystal silicon film and is formed over a gate insulative film comprising a silicon oxide film. A memory gate of the memory transistor comprises an n-type polycrystal silicon film and is disposed on one of the side walls of the control gate. The memory gate comprises a doped polycrystal silicon film with a sheet resistance lower than that of the control gate comprising a polycrystal silicon film formed by ion implantation of impurities to the undoped silicon film.

公开(公告)号：US20070228446A1

公开(公告)日：2007-10-04

申请号：US11717053

申请日：2007-03-13

申请人： Koichi Toba ,  Yasushi Ishii ,  Yoshiyuki Kawashima ,  Satoru Machida ,  Munekatsu Nakagawa ,  Kentaro Saito ,  Toshikazu Matsui ,  Takashi Hashimoto ,  Kosuke Okuyama

发明人： Koichi Toba ,  Yasushi Ishii ,  Yoshiyuki Kawashima ,  Satoru Machida ,  Munekatsu Nakagawa ,  Kentaro Saito ,  Toshikazu Matsui ,  Takashi Hashimoto ,  Kosuke Okuyama

IPC分类号： H01L29/76

CPC分类号： H01L29/42324 ,  H01L21/28273 ,  H01L21/28282 ,  H01L27/115 ,  H01L27/11526 ,  H01L27/11531 ,  H01L29/66825 ,  H01L29/66833 ,  H01L29/7885

摘要： A semiconductor device having a non-volatile memory is disclosed, whose disturb defect can be diminished or prevented. A memory cell of the non-volatile memory has a memory gate electrode formed over a main surface of a semiconductor substrate through an insulating film for charge storage. A first side wall is formed on a side face of the memory gate electrode, and at a side face of the first side wall, a second side wall is formed. On an upper surface of an n+-type semiconductor region for source in the memory cell there is formed a silicide layer whose end portion on the memory gate electrode MG side is defined by the second side wall.

摘要翻译： 公开了一种具有非易失性存储器的半导体器件，其干扰缺陷可被减弱或防止。 非易失性存储器的存储单元具有通过用于电荷存储的绝缘膜形成在半导体衬底的主表面上的存储栅电极。 第一侧壁形成在存储栅电极的侧面上，在第一侧壁的侧面形成有第二侧壁。 在存储单元中用于源极的n + + / - 型半导体区域的上表面上形成硅化物层，其存储栅电极MG侧的端部由第二侧壁限定。

公开(公告)号：US20060003508A1

公开(公告)日：2006-01-05

申请号：US11168639

申请日：2005-06-29

申请人： Takeshi Sakai ,  Yasushi Ishii ,  Tsutomu Okazaki ,  Masaru Nakamichi ,  Toshikazu Matsui ,  Kyoya Nitta ,  Satoru Machida ,  Munekatsu Nakagawa ,  Yuichi Tsukada

发明人： Takeshi Sakai ,  Yasushi Ishii ,  Tsutomu Okazaki ,  Masaru Nakamichi ,  Toshikazu Matsui ,  Kyoya Nitta ,  Satoru Machida ,  Munekatsu Nakagawa ,  Yuichi Tsukada

IPC分类号： H01L21/8234 ,  H01L21/336

CPC分类号： H01L27/11568 ,  H01L21/823842 ,  H01L21/82385 ,  H01L21/823857 ,  H01L21/823864 ,  H01L27/105 ,  H01L27/1052 ,  H01L27/11573

摘要： For enhancing the high performance of a non-volatile semiconductor memory device having an MONOS type transistor, a non-volatile semiconductor memory device is provided with MONOS type transistors having improved performance in which the memory cell of an MONOS non-volatile memory comprises a control transistor and a memory transistor. A control gate of the control transistor comprises an n-type polycrystal silicon film and is formed over a gate insulative film comprising a silicon oxide film. A memory gate of the memory transistor comprises an n-type polycrystal silicon film and is on one of the side walls of the control gate. The memory gate comprises a doped polycrystal silicon film with a sheet resistance lower than that of the control gate comprising a polycrystal silicon film formed by ion implantation of impurities to the undoped silicon film.

摘要翻译： 为了增强具有MONOS型晶体管的非易失性半导体存储器件的高性能，非易失性半导体存储器件被提供有具有改进性能的MONOS型晶体管，其中MONOS非易失性存储器的存储单元包括控制 晶体管和存储晶体管。 控制晶体管的控制栅极包括n型多晶硅膜，并且形成在包括氧化硅膜的栅极绝缘膜上。 存储晶体管的存储栅极包括n型多晶硅膜，并且位于控制栅极的一个侧壁上。 存储器栅极包括具有低于控制栅极的薄层电阻的掺杂多晶硅膜，其包括通过将杂质离子注入未掺杂的硅膜形成的多晶硅膜。