摘要:
A fuse circuit includes a fuse configured for programming a configuration of an integrated circuit device and a resistive element having a known resistance value operably coupled in parallel with the fuse. The fuse and the resistive element form a parallel circuit configured for quickly sensing a state of the fuse in relation to the known value of the resistive element. In one embodiment, the device may further include a sense circuit operably coupled to the parallel circuit combination of the fuse and the resistive element. The sense circuit is configured to sense one of a FUSED state and an UNFUSED state of the fuse, for example, based on a comparison between a reference resistance and a FUSED resistance of the fuse when coupled to the known resistance. The fuse may comprise a programmable fuse, and the resistive element may comprise a MOS transistor.
摘要:
A memory device using tunneling field effect transistors (TFET) and buried bit lines is presented. The memory device includes a matrix containing rows and columns of storage cells. Each storage cell contains at least one cell transistor, which in turn contains first doped regions and second doped regions, one of which is a source and the other a drain. The memory device includes word lines, each of which is connected to storage cells of one row and bit lines, each of which is connected to storage cells of one column. The first doped regions are of a different doping type than the second doped regions.
摘要:
A memory includes a first tunneling field effect transistor including a first drain and a first source, the first drain coupled to a first resistive memory element. The memory includes a second tunneling field effect transistor including a second drain and sharing the first source, the second drain coupled to a second resistive memory element. The memory includes a first region coupled to the first source for providing a source node.
摘要:
One or more embodiments relate to an electronic device comprising a circuitry and a programmable resistive element. The programmable resistive element comprises a first and a second state, wherein the programmable resistive element is configured to allow switching from the second state into the first state in response to a signal comprising at least a predefined level. The circuitry is configured to provide signals up the predefined level, wherein the circuitry is configured to provide a switch signal to the programmable resistive element, wherein the switch signal causes switching from the first into the second state.
摘要:
In an embodiment, a memory cell arrangement is provided. The memory cell arrangement may include a first memory cell and a second memory cell, a first source/drain line coupled to a first source/drain region of the first memory cell and a second source/drain line coupled to a second source/drain region of the first memory cell, and a third source/drain line coupled to a first source/drain region of the second memory cell and a fourth source/drain line coupled to a second source/drain region of the second memory cell, wherein the third source/drain line is disposed proximate to the second source/drain line, and wherein the third source/drain line is disposed in the same metallization level as the second source/drain line.
摘要:
In an embodiment, a method for controlling an output voltage of a power supply system is disclosed. The method includes regulating the power supply to a first voltage. After regulating the power supply to a first voltage, the power supply is regulated to a second voltage, which includes changing an input to the power supply system, and altering charge at an output of the power supply system until the output voltage reaches the second output voltage.
摘要:
A security circuit comprising including a sensor located remotely from a central alarm handler and configured to sense an attack, and a phase-change memory cell coupled to and located remotely with the sensor, and configured to store an alarm event when the attack is sensed.
摘要:
A device utilizing a breakdown layer in combination with a programmable resistance material, a phase-change material or a threshold switching material. The breakdown layer having damage.
摘要:
A memory includes a first electrode, a second electrode, and a resistive memory element coupled between the first electrode and the second electrode. The memory includes a circuit configured to write a data value to the resistive memory element by sequentially applying a first signal from the first electrode to the second electrode and a second signal from the second electrode to the first electrode.
摘要:
A fuse circuit includes a fuse configured for programming a configuration of an integrated circuit device and a resistive element having a known resistance value operably coupled in parallel with the fuse. The fuse and the resistive element form a parallel circuit configured for quickly sensing a state of the fuse in relation to the known value of the resistive element. In one embodiment, the device may further include a sense circuit operably coupled to the parallel circuit combination of the fuse and the resistive element. The sense circuit is configured to sense one of a FUSED state and an UNFUSED state of the fuse, for example, based on a comparison between a reference resistance and a FUSED resistance of the fuse when coupled to the known resistance. The fuse may comprise a programmable fuse, and the resistive element may comprise a MOS transistor.