Abstract:
A substrate having appropriate strength and allowing firm bonding to a piezoelectric substrate and the like can be obtained at a lower cost. The substrate for an SAW device is formed of spinel, and PV value representing difference in level of one main surface of the substrate is at least 2 nm and at most 8 nm. Preferably, average roughness Ra of one main surface of the substrate is at least 0.01 nm and at most 0.5 nm. With such characteristics, the main surface of the substrate to be bonded to a piezoelectric substrate of the SAW device can be bonded satisfactorily to the piezoelectric material forming the piezoelectric substrate utilizing van der Waals interaction.
Abstract:
Provided are an oxide sintered body and a sputtering target which are suitable for use in producing an oxide semiconductor film for display devices and combine high electroconductivity with a high relative density and with which it is possible to form an oxide semiconductor film having a high carrier mobility. In particular, even when used in production by a direct-current sputtering method, the oxide sintered body and the sputtering target are less apt to generate nodules and have excellent direct-current discharge stability which renders long-term stable discharge possible. This oxide sintered body is an oxide sintered body obtained by mixing zinc oxide, tin oxide, and an oxide of at least one metal (M metal) selected from the group consisting of Al, Hf, Ni, Si, Ga, In, and Ta, and sintering the mixture, the oxide sintered body having a Vickers hardness of 400 Hv or higher.
Abstract:
Provided is an aluminum nitride sintered body with high optical transmissivity and which has a smooth surface in the unpolished condition after firing. The aluminum nitride sintered body has an oxygen concentration of 450 ppm or less, a concentration of impurity elements excluding oxygen, nitrogen, and aluminum of 350 ppm or less, and an average crystal grain diameter of between 2 μm and 20 μm, and also has an arithmetic mean surface height Ra of 1 μm or less and a maximum height Rz of 10 μm or less in the unpolished condition after firing.
Abstract:
A silicon nitride sintered body, wherein in a silicon nitride substrate consisting of crystal grains of β-type silicon nitride and a grain boundary phase containing at least one type of rare earth element (RE), magnesium (Mg) and silicon (Si), the grain boundary phase consists of an amorphous phase and a MgSiN2 crystal phase. The X-ray diffraction peak intensity of any crystal plane of a crystal phase containing the rare earth element (RE) is less than 0.0005 times the sum of the diffraction peak intensities of (110), (200), (101), (210), (201), (310), (320) and (002) of the crystal grains of the β-type silicon nitride; and the X-ray diffraction peak intensity of (121) of the MgSiN2 crystal phase is 0.0005 to 0.003 times the sum of the X-ray diffraction peak intensities of (110), (200), (101), (210), (201), (310), (320) and (002) of the crystal grains of the β-type silicon nitride.
Abstract:
A first inorganic powder molded body and a second inorganic powder molded body are obtained. Each of the bodies contains an inorganic powder, an organic dispersion medium having a reactive functional group and a gelling agent and is solidified by chemical reaction of the organic dispersion medium and the gelling agent. Slurry containing a powder component and an organic dispersion medium is applied to a joint surface of the first inorganic powder molded body. The inorganic powder molded bodies are allowed to abut on each other while interposing the slurry therebetween, and integrated together into a joined body. A sintered body is obtained by sintering the joined body.
Abstract:
Disclosed is a MnZn ferrite core comprising basic components, subcomponents and unavoidable impurities. To the basic components comprising: iron oxide (as Fe2O3): 51.0-54.5 mol %, zinc oxide (as ZnO): 8.0-12.0 mol % and manganese oxide (as MnO): remainder, are added silicon oxide (as SiO2): 50-400 mass ppm and calcium oxide (as CaO): 50-4000 ppm as subcomponents and in the unavoidable impurities, phosphorous, boron, sulfur and chlorine are respectively kept to: less than 3 mass ppm, less than 3 mass ppm, less than 5 mass ppm, and less than 10 mass ppm. The ratio of the measure specific surface area to the ideal specific surface area of the MnZn ferrite core satisfies the formula: Measured specific surface area/ideal specific surface area
Abstract translation:公开了包含碱性成分,亚成分和不可避免的杂质的MnZn铁氧体磁心。 对于包含氧化铁(以Fe 2 O 3计):51.0-54.5mol%,氧化锌(ZnO):8.0-12.0mol%和氧化锰(作为MnO))的基本组分:余量加入氧化硅(SiO 2): 50-400质量ppm和氧化钙(作为CaO):50-4000ppm作为次要成分,在不可避免的杂质中,磷,硼,硫和氯分别保持为:小于3质量ppm,小于3质量ppm,少 大于5质量ppm,小于10质量ppm。 MnZn铁氧体磁芯的测量比表面积与理想比表面积的比例满足下式:测量比表面积/理想比表面积<1500。
Abstract:
An electrostatic chuck includes an electrostatic electrode embedded in a ceramic base having a wafer-supporting surface capable of holding a wafer, the electrostatic electrode being parallel to the wafer-supporting surface. The ceramic base is composed of a dense ceramic having a MgO content of 99% by weight or more. The electrostatic electrode is a disc-like electrode composed of, for example, at least one metal selected from the group consisting of Ni, Co, and Fe. The electrostatic electrode includes a conductive tablet connected to the center thereof. The tablet is exposed at the bottom of a counter-bored hole formed so as to reach the tablet from a back surface of the ceramic base, and is connected to a feeding terminal, composed of Ni, inserted into the counter-bored hole.
Abstract:
A bonding agent is provided which includes a flux containing either calcium aluminate or calcium oxide and aluminum oxide and aluminum nitride powder.
Abstract:
A method for making a smooth ceramic including loading ceramic powder to be densified into a hot press die, placing one or more spacers with a polished surface between a hot press punch and the ceramic powder, placing the die and punch into a hot press and hot pressing the ceramic powder, and removing a smooth ceramic shape that requires no subsequent polishing or processing and has a surface roughness of 5 nm RMS or better. The smooth ceramic shape may be transparent, and it may be spinel, magnesia, yttria, lutetia, scandia, YAG, any composites thereof, or any of their rare earth doped compounds. Also disclosed is the related smooth ceramic made by this process.