CONTROLLABLE LASER ACUPUNCTURE DEVICE
    61.
    发明申请

    公开(公告)号:US20190168019A1

    公开(公告)日:2019-06-06

    申请号:US15878482

    申请日:2018-01-24

    Abstract: A controllable laser acupuncture device includes a laser generation module and a control unit. The laser generation module includes an emission end, a primary emission head mounted on the emission end, and a plurality of auxiliary emission heads mounted on the emission end. The control unit is electrically connected to the laser generation module. The control unit is configured to control each of the primary emission head and the plurality of auxiliary emission heads to emit or not to emit a laser beam and is configured to adjust properties of the laser beams outputted by the primary emission head and the plurality of auxiliary emission heads.

    DEFECT DETECTION METHOD FOR 3D CHIP AND SYSTEM USING THE SAME

    公开(公告)号:US20180285493A1

    公开(公告)日:2018-10-04

    申请号:US15604671

    申请日:2017-05-25

    CPC classification number: G06F17/5009 G06F17/5081 G06N99/005

    Abstract: A defect detection method for a 3D chip and a system using the same are provided. The method includes: generating a plurality of physical models having a defect of at least one defect type based on the at least one defect type of a 3D chip; generating a group of training samples for each of the physical models; generating a classifier model by using a machine learning technique algorithm via scattering parameter values of a training set; measuring an error value by comparing scattering parameter values of a testing set with the classifier model, using the classifier model as a defect model of the defect type based on the error value, and determining that a Through Silicon Via of a single die 3D chip or a stacked die 3D chip has a defect corresponding to the at least one defect type by comparing actual measurements of scattering parameter values.

    Chip-to-chip signal transmission system and method for arranging chips thereof

    公开(公告)号:US10063282B1

    公开(公告)日:2018-08-28

    申请号:US15657209

    申请日:2017-07-24

    CPC classification number: H04B5/0012 H04B5/0031

    Abstract: A chip-to-chip signal transmission system including a first unit set and a second unit set arranged in a first direction is provided. The first unit set and the second unit are configured to perform the signal transmission between a first chip and a second chip. There is a shift between the first unit set and the second unit set in a second direction such that the first unit set and the second unit set are shifted in the second direction and an overlapping region is formed. By adjusting the size of the overlapping region, the signal noise and the signal attenuation due to the misalignment between the first chip and the second chip or the electromagnetic interference of the adjacent signals are reduced and the signal transmission quality is thus improved. Furthermore, a method for arranging chips is also provided.

    Photoelectric conversion device
    67.
    发明授权

    公开(公告)号:US09831358B2

    公开(公告)日:2017-11-28

    申请号:US14854030

    申请日:2015-09-14

    CPC classification number: H01L31/02168 G02B1/005 H01L31/048 Y02E10/50

    Abstract: A photoelectric conversion device including a photoelectric converter, a transparent cover, an insulating material layer and a photonic crystal layer is provided. The photoelectric converter is adapted to receive a light. The transparent cover is disposed on a side of the photoelectric converter. The insulating material layer is disposed between the photoelectric converter and the transparent cover. The photonic crystal layer is disposed between the insulating material layer and the transparent cover, wherein the material of the photonic crystal layer is different from the material of the insulating material layer.

    Filter configuration
    68.
    发明授权

    公开(公告)号:US09774068B2

    公开(公告)日:2017-09-26

    申请号:US14983648

    申请日:2015-12-30

    CPC classification number: H03H7/38 H01P1/20363

    Abstract: A filter configuration including a substrate, a primary microstrip line and a first defected ground structure is disclosed. The substrate has a first face and a second face. The second face is a ground face. The primary microstrip line is arranged on the first face and extends in a first direction. The first defected ground structure is arranged on the second face. The first defected ground structure includes a first section, a first circular section, a second section, a second circular section and a third section that are connected to each other in sequence in a second direction perpendicular to the first direction. The second section is covered by the primary microstrip line in a vertical direction perpendicular to the first and second faces. The primary microstrip line has a width equal to a minimum length of the second section. As such, the filtering effect can be improved.

    METHOD FOR DETERMINING THE LEVEL OF DEGRADATION OF A ROAD MARKING

    公开(公告)号:US20170200058A1

    公开(公告)日:2017-07-13

    申请号:US14994663

    申请日:2016-01-13

    Abstract: A method for determining a level of degradation of a road marking is executed by a determination unit. The method includes generating a plurality of reference images by an image capturing device photographing a reference road marking with a plurality of shutter speeds. The reference images are stored in a database. The method further includes generating an image by the image capturing device photographing an examined road marking according to a selected shutter speed, retrieving one of the reference data from the database that has the same shutter speed as the examined road marking by a processor, and performing a difference determination procedure between the retrieved reference data and the examined data by the processor, and outputting a determined result of the level of degradation of the examined road marking by the processor. As such, accurate determination on the level of degradation of the examined road marking can be achieved.

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