Abstract:
A data transmission circuit includes: a driving voltage generation unit configured to generate a driving voltage having a lower level than an external driving voltage; a switch unit configured to transmit the driving voltage when any one of a write enable signal and a read enable signal is enabled; and a data transmission unit configured to be driven by receiving the driving voltage, transmit a signal of a DQ pad as data in response to the write enable signal, and transmit the data to the DQ pad in response to the read enable signal.
Abstract:
A refresh signal generating circuit of a semiconductor memory device includes a flag signal generator which generates a flag signal in response to a refresh signal and a precharge signal, a clock enable signal buffer which generates first and second buffer enable signals based on an external clock enable signal in response to the flag signal, and a chip select signal buffer which generates an internal chip select signal based on an external chip select signal in response to the flag signal.
Abstract:
An image device, a receiving method of contents, a server, and a providing method of contents are provided. The image device includes: a communication unit which communicates with a server that provides content received from a content provider; a display unit; at least one application execution unit which executes the content; and an application controller which controls the communication unit to receive the content corresponding to a log-in user from the server and displays, on the display unit, reception information indicating reception of the content based on a user ID for the log-in user to be logged in to the image device and a token which matches the user ID to a content ID for the log-in user to be connected to the content provider.
Abstract:
A burn-in test apparatus and a semiconductor device using the same are disclosed. The burn-in test apparatus includes a flag signal generating unit configured to receive an external input signal and an external address externally inputted for a burn-in test and generate a flag signal, and a burn-in test unit configured to receive the flag signal, generate a toggled output enable signal, and drive an input/output line to toggle a signal on the input/output line.
Abstract:
The data output circuit includes a first decoder, a second decoder, a first selective output circuit, a second selective output circuit, and an output driver. The first decoder is configured to generate a pull-up selection signal by decoding a pull-up code. The second decoder is configured to generate a pull-down selection signal by decoding a pull-down code. The first selective output circuit is configured to select and output a voltage level of a pull-up level signal in response to the pull-up selection signal. The second selective output circuit is configured to select and output a voltage level of a pull-down level signal in response to the pull-down selection signal. The output driver is configured to drive output data in response to receiving a pre-pull-up signal and a pre-pull-down signal.
Abstract:
The present invention relates to a column decoder for low power consumption in a semiconductor memory apparatus. The semiconductor device according to the present invention includes a column select signal decoder, which has a driving voltage input node and uses a driving voltage, for producing a plurality of column select signals by decoding a column select control signal; and a driving voltage supply controller for controlling a supply of the driving voltage to the driving voltage input node.
Abstract:
A semiconductor memory device includes a clock enable buffer; a clock enable controller; a clock controller; a clock buffer; and a small clock buffer. The clock enable buffer buffers a clock enable signal to provide an internal clock enable signal. The clock enable controller synchronizes the internal clock enable signal with a small clock signal to output a first and a second signal. The clock controller generates a clock buffer enable signal and a small clock buffer enable signal based on the first and the second signals. The clock buffer is driven in response to the clock buffer enable signal and buffers a clock to produce a clock pulse. The small clock buffer is driven in response to the small clock buffer enable signal and buffers the clock to produce the small clock signal.
Abstract:
A burn-in test apparatus and a semiconductor device using the same are disclosed. The burn-in test apparatus includes a flag signal generating unit configured to receive an external input signal and an external address externally inputted for a burn-in test and generate a flag signal, and a burn-in test unit configured to receive the flag signal, generate a toggled output enable signal, and drive an input/output line to toggle a signal on the input/output line.
Abstract:
A system and method of providing quality of service (QoS)-enabled digital content in peer-to-peer (P2P) networks are provided. The QoS-enabled service system on the P2P network includes: a service provider capable of providing digital content; one or more user nodes receiving digital content from the service provider; one or more donor nodes lending resources for providing digital content; and a supernode receiving information on user nodes and donor nodes, and a copy of digital content from the service provider, allowing the exchange of digital content among the user nodes through P2P networking, and when at least one user node experiences a P2P networking error during the exchange of the digital content, arranging for a predetermined number of donor nodes from among the one or more donor nodes to join the P2P networking. According to the system and method, even when the function of a peer does not normally work on a P2P network, a donor as a replacement of the peer is utilized, thereby providing QoS-enabled digital content to a user requesting the digital content.
Abstract:
A semiconductor memory device includes a clock enable buffer; a clock enable controller; a clock controller; a clock buffer; and a small clock buffer. The clock enable buffer buffers a clock enable signal to provide an internal clock enable signal. The clock enable controller synchronizes the internal clock enable signal with a small clock signal to output a first and a second signal. The clock controller generates a clock buffer enable signal and a small clock buffer enable signal based on the first and the second signals. The clock buffer is driven in response to the clock buffer enable signal and buffers a clock to produce a clock pulse. The small clock buffer is driven in response to the small clock buffer enable signal and buffers the clock to produce the small clock signal.