摘要:
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection method thereof in order to efficiently carrying out a burn-in stress test. A command latch circuit having an access command input will output a low-level pulse in synchronism with an external clock. The pulse will pass through a NAND gate of test mode sequence circuit and a common NAND gate to output a low-level internal precharge signal, which will reset a word line activating signal from the control circuit. Simultaneously, an internal precharge signal passing through the NAND gate will be delayed by an internal timer a predetermined period of time to output through the NAND gate a low-level internal active signal, which will set a word line activating signal from the control circuit.
摘要:
To provide an operating method of a rotary hearth furnace for producing reduced iron in which a stuck substance stuck on the hearth surface is removed from the hearth surface to thereby prevent or reduce the wear of the knife edge of a screw of a discharge device, enabling continuous operation for a long period and capable of achieving high availability factor. The hearth surface is quenched by spraying or the like to generate cracks in the stuck substance on the hearth, and the stuck substance is scraped to thereby remove it from the hearth.
摘要:
An image forming apparatus including at least first and second developing devices for developing latent images formed on an image bearing member. The first and second developing devices contain developers of different colors, respectively. The second developing device contains a developer of a predetermined color and is fixedly mounted in the image forming apparatus. The first developing device contains a developer of a color other than the predetermined color and is detachably mountable in the image forming apparatus. Only the first developing device is exchangeable.
摘要:
An image forming apparatus capable of effecting plural image forming operations on one transfer sheet includes an image transfer device for transferring an image on the transfer sheet, an image magnification changing mechanism for changing the magnification of the image to be transferred onto the transfer sheet, and a control device for controlling the magnification changing mechanism in accordance with deformation of the transfer sheet caused by an image forming operation on the transfer sheet, after a first image is formed on the transfer sheet and before a second image is formed on the same transfer sheet, whereby those images are correctly registered.
摘要:
A both-side recording apparatus in which sheets having a first image recorded on a first side thereof are temporally contained in a relay tray and subsequently a second image is recorded on a second side of the sheets has a first side recording compensation mode in which if a deficiency occurs in the number of sheets during the sheet first side recording operation, recording is continuedly effect on sheets corresponding to the number of deficient sheets, a second side recording compensation mode in which if a deficiency occurs in the number of sheets during the sheet second side recording operation, the second image is continuedly recorded on the first side of sheets corresponding to the number of deficient sheets after the recording of the second image on the second side of the sheets from the relay tray has been terminated, whereafter the first image is recorded on the second side of said sheets, and a device for changing over a transportation path so that where the image recorded on the second side of the compensationally recorded sheets is the second image, the compensationally recorded sheets are reversed zero time or even times or odd times in accordance with whether the number of times of the reversing process of the sheets before compensationally recorded is zero or even or odd and that where the image recorded on the second side of the compensationally recorded sheets is the first image, the compensationally recorded sheets are reversed odd times or zero time or even times in accordance with whether the number of times of the reversing process of the sheets before compensationally recorded is zero or even or odd.
摘要:
A semiconductor light emitting device in which adhesion between an insulating layer and a semiconductor layer is improved while maintaining the ability of the insulating layer to limit the direction of current flow. The semiconductor light emitting device includes a semiconductor layer, a first electrode and a second electrode arranged to interpose the semiconductor layer therebetween, an insulating layer provided to the semiconductor layer at the same side as the second electrode and opposite to the first electrodes so as to surround the periphery of the second electrode, a first metal layer covering the second electrode and the insulating layer, and a second metal layer which has a thickness smaller than the thickness of the second electrode and is provided between the semiconductor layer and the insulating layer.
摘要:
Provided is a plant growth regulator composition.The plant growth regulator composition contains phenyllactic acid or a salt thereof and tryptophan or a salt thereof.
摘要:
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection method thereof in order to efficiently carrying out a burn-in stress test. A command latch circuit having an access command input will output a low-level pulse in synchronism with an external clock. The pulse will pass through a NAND gate of test mode sequence circuit and a common NAND gate to output a low-level internal precharge signal, which will reset a word line activating signal from the control circuit. Simultaneously, an internal precharge signal passing through the NAND gate will be delayed by an internal timer a predetermined period of time to output through the NAND gate a low-level internal active signal, which will set a word line activating signal from the control circuit.
摘要:
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection method thereof in order to efficiently carrying out a burn-in stress test. A command latch circuit having an access command input will output a low-level pulse in synchronism with an external clock. The pulse will pass through a NAND gate of test mode sequence circuit and a common NAND gate to output a low-level internal precharge signal, which will reset a word line activating signal from the control circuit. Simultaneously, an internal precharge signal passing through the NAND gate will be delayed by an internal timer a predetermined period of time to output through the NAND gate a low-level internal active signal, which will set a word line activating signal from the control circuit.
摘要:
An objective lens drive device (8) includes a supporting block (9), a movable block (10) for holding an objective lens (27), and supporting springs (22) for connecting the supporting block and the movable block. Elements of the supporting block of the objective lens drive device (8) are a stationary section (11), a supporting shaft (12), a tilt drive section (13), and tilt drive magnetic circuits (20 and 20). The stationary section (11) is secured to a movable base (7) that is movable in radial directions of a disc-shaped recording medium (100). An axial direction of the supporting shaft (12) is perpendicular to both focusing directions and tracking directions. The tilt drive section (13) is rotatably supported at the stationary section through the supporting shaft and is connected to the movable block through the supporting springs. The tilt drive magnetic circuits (20 and 20) are used to rotate the tilt drive section with respect to the stationary section.