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公开(公告)号:US20220037803A1
公开(公告)日:2022-02-03
申请号:US17402916
申请日:2021-08-16
Applicant: Intel Corporation
Inventor: Zhichao Zhang , Jiwei Sun , Kemal Aygun
Abstract: Length matching and phase matching between circuit paths of differing lengths is disclosed. Two signals are specified to arrive at respective path destinations at a predetermined time and with a predetermined phase. An IC provides a first electronic signal over a first conductive path to a first destination and a second electronic signal over a second conductive path to a second destination. A first slow wave structure comprises the first conductive path and a second slow wave structure comprises the second conductive path. The effective relative permittivity of the first slow wave structure is tuned such that the first electronic signal arrives at its destination at a first time and at a first phase, and the effective relative permittivity of the second slow wave structure is tuned such that the second electronic signal arrives at its destination at a second time and at a second phase.
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公开(公告)号:US11222848B2
公开(公告)日:2022-01-11
申请号:US16634864
申请日:2017-09-28
Applicant: Intel Corporation
Inventor: Kemal Aygun , Zhiguo Qian , Jianyong Xie
IPC: H01L23/52 , H01L21/4763 , H01L23/538 , H01L21/48 , H01L23/48 , H01L23/498 , H01L23/31
Abstract: Methods/structures of joining package structures are described. Those methods/structures may include a die disposed on a surface of a substrate, an interconnect bridge embedded in the substrate, and at least one vertical interconnect structure disposed through a portion of the interconnect bridge, wherein the at least one vertical interconnect structure is electrically and physically coupled to the die.
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公开(公告)号:US11094633B2
公开(公告)日:2021-08-17
申请号:US16305758
申请日:2016-06-30
Applicant: Intel Corporation
Inventor: Zhiguo Qian , Kemal Aygun , Dae-Woo Kim , Jackie C. Preciado
IPC: H01L23/538 , H01L25/065 , H01L23/00 , H01L25/18
Abstract: A microelectronic package bridge can comprising a plurality of ground layers, and a plurality of signal layers interwoven with the plurality of ground layers. Each of the signal layers can include a plurality of electrically conductive pathways. Each of the electrically conductive pathways can be arranged to form an electrical connection between one of a first plurality of bumps of a first die and one of a second plurality of bumps of a second die. Each of the plurality of electrically conductive pathways can have a length substantially equal to one another.
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公开(公告)号:US11081434B2
公开(公告)日:2021-08-03
申请号:US16993112
申请日:2020-08-13
Applicant: Intel Corporation
Inventor: Zhiguo Qian , Kaladhar Radhakrishnan , Kemal Aygun
IPC: H01L23/49 , H01L23/538 , H01L23/498 , H01L21/48 , H01L23/00 , H01L21/68
Abstract: The present disclosure is directed to systems and methods for improving the impedance matching of semiconductor package substrates by incorporating one or more magnetic build-up layers proximate relatively large diameter, relatively high capacitance, conductive pads formed on the lower surface of the semiconductor package substrate. The one or more magnetic layers may be formed using a magnetic build-up material deposited on the lower surface of the semiconductor package substrate. Vias conductively coupling the conductive pads to bump pads on the upper surface of the semiconductor package substrate pass through and are at least partially surrounded by the magnetic build-up material.
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公开(公告)号:US10510667B2
公开(公告)日:2019-12-17
申请号:US15386737
申请日:2016-12-21
Applicant: Intel Corporation
Inventor: Li-Sheng Weng , Chung-Hao Joseph Chen , Emile Davies-Venn , Kemal Aygun , Mitul B. Modi
IPC: H01L23/66 , H01L23/538 , H01L23/552 , H01L25/065 , H01L21/48
Abstract: Disclosed is a microelectronics package. The microelectronics package may include a reference plane, a signal routing layer, a dielectric layer, and a conductive layer. The signal routing layer may include a plurality of signal routing traces. The dielectric layer may be located adjacent to the signal routing layer. The conductive layer may be applied to the dielectric layer such that the dielectric layer is located in between the signal routing layer and the conductive layer. The conductive layer may be in electrical communication with the reference plane.
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公开(公告)号:US10416378B2
公开(公告)日:2019-09-17
申请号:US15979382
申请日:2018-05-14
Applicant: Intel Corporation
Inventor: Zhichao Zhang , Kemal Aygun , Robert L. Sankman
Abstract: Techniques and mechanisms for providing a bridge between integrated circuit (IC) chips. In an embodiment, the bridge device comprises a semiconductor substrate having disposed thereon contacts to couple the bridge device to two IC chips. Circuit structures and photonic structures of a bridge link are integrated with the substrate. The structures include an optical waveguide coupled between an electrical-to-optical signal conversion mechanism and an optical-to-electrical conversion mechanism. The bridge device converts signaling from an electrical domain to an optical domain and back to an electrical domain. In another embodiment, optical signals received via different respective contacts of an IC chip are converted by the bridge device, where the optical signals are multiplexed with each other and variously propagated with the same optical waveguide.
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公开(公告)号:US10396022B2
公开(公告)日:2019-08-27
申请号:US16026824
申请日:2018-07-03
Applicant: Intel Corporation
Inventor: Zhiguo Qian , Kemal Aygun , Yu Zhang
IPC: H01L21/48 , H01L23/498
Abstract: Embodiments of the present disclosure are directed towards techniques and configurations for ground via clustering for crosstalk mitigation in integrated circuit (IC) assemblies. In some embodiments, an IC package assembly may include a first package substrate configured to route input/output (I/O) signals and ground between a die and a second package substrate. The first package substrate may include a plurality of contacts disposed on one side of the first package substrate and at least two ground vias of a same layer of vias, and the at least two ground vias may form a cluster of ground vias electrically coupled with an individual contact. Other embodiments may be described and/or claimed.
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68.
公开(公告)号:US20190101961A1
公开(公告)日:2019-04-04
申请号:US15720484
申请日:2017-09-29
Applicant: Intel Corporation
Inventor: Kemal Aygun , Zhichao Zhang , Cemil Geyik , Guneet Kaur
Abstract: Methods/structures of forming package structures are described. Those methods/structures may include a conductive pin comprising: a cantilever beam portion physically coupled with a first side of a package substrate; a contact pin portion, wherein a terminal end of the contact pin portion is physically and electrically coupled to a board; a housing structure comprising a housing cavity, wherein the contact pin portion is disposed at least partially within the housing cavity; and a conductive material disposed on housing sides and/or adjacent a surface of the housing cavity. The placement of the conductive material is optimized to meet the requirements for either double data rate (DDR) and/or peripheral component interface express (PCIe) interfaces.
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公开(公告)号:US10103054B2
公开(公告)日:2018-10-16
申请号:US13802011
申请日:2013-03-13
Applicant: INTEL CORPORATION
Inventor: Zhichao Zhang , Zhiguo Qian , Tolga Memioglu , Kemal Aygun
IPC: H05K7/10 , H05K7/12 , H01L21/768 , H05K1/02 , H01L23/498 , H01L23/50
Abstract: Capacitively coupled vertical transitions are configured with a desired amount of mutual capacitance to at least partially cancel crosstalk for an overall channel crosstalk (e.g., FEXT) reduction. In embodiments, capacitive coupling of adjacent vertical transitions is achieved with overlapping metal surfaces within the vertical transitions. In embodiments, one or more of the overlapping metal surfaces are vias, via pads, or metal stub features extending off a vertical transition. In embodiments, signal paths with overlapped vertical transitions are utilized to achieve crosstalk reduction of more than one victim-aggressor pair and/or to achieve crosstalk reduction of more than two aggressors. In embodiments, capacitively coupled vertical transitions are implemented in a package substrate, an interposer, or a printed circuit board.
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公开(公告)号:US20180263117A1
公开(公告)日:2018-09-13
申请号:US15810800
申请日:2017-11-13
Applicant: Intel Corporation
Inventor: Sasha N. Oster , Robert L. Sankman , Charles Gealer , Omkar Karhade , John S. Guzek , Ravindranath V. Mahajan , James C. Matayabas, JR. , Johanna M. Swan , Feras Eid , Shawna Liff , Timothy McIntosh , Telesphor Kamgaing , Adel A. Elsherbini , Kemal Aygun
CPC classification number: H05K1/189 , G06F1/163 , H01L21/568 , H01L24/19 , H01L24/96 , H01L2224/04105 , H01L2224/12105 , H01L2224/24137 , H01L2924/12042 , H01L2924/181 , H01L2924/18162 , H05K1/0393 , H05K1/181 , H05K1/185 , H05K13/0469 , H05K2201/0137 , H05K2203/1469 , Y10T29/49146 , H01L2924/00
Abstract: This disclosure relates generally to devices, systems, and methods for making a flexible microelectronic assembly. In an example, a polymer is molded over a microelectronic component, the polymer mold assuming a substantially rigid state following the molding. A routing layer is formed with respect to the microelectronic component and the polymer mold, the routing layer including traces electrically coupled to the microelectronic component. An input is applied to the polymer mold, the polymer mold transitioning from the substantially rigid state to a substantially flexible state upon application of the input.
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