Optical displacement detection mechanism and surface information measurement device using the same
    62.
    发明授权
    Optical displacement detection mechanism and surface information measurement device using the same 有权
    光学位移检测机构和表面信息测量装置使用相同

    公开(公告)号:US07973942B2

    公开(公告)日:2011-07-05

    申请号:US11841445

    申请日:2007-08-20

    CPC classification number: G01B11/024 G01Q20/02

    Abstract: There is provided an optical displacement detection mechanism in which, even if a measurement object changes, a detection sensitivity and a ratio of a noise are adjustable without depending on optical characteristics such as reflectivity, or a shape and mechanical characteristics of a measurement object, an influence of a thermal deformation of the measurement object by an irradiated light to the measurement object can be made small, and a measurement accuracy can be ensured under optimum conditions. In an optical displacement detection mechanism comprising a light source irradiating a light to a cantilever becoming the measurement object, a light source drive circuit driving the light source, a photodetector receiving the light after irradiated to the cantilever from the light source to thereby detect an intensity of the light, and an amplifier amplifying a detection signal of the photodetector at a predetermined amplification rate, there is made such that, by providing a light intensity regulator and an amplification rate regulator, an irradiated light intensity to the cantilever and an amplification rate of the photodetector can be made variable.

    Abstract translation: 提供了一种光学位移检测机构,其中即使测量对象改变,检测灵敏度和噪声比可以调节,而不依赖于诸如反射率的光学特性或测量对象的形状和机械特性, 可以使通过照射光将测量对象的热变形对测量对象的影响减小,并且可以在最佳条件下确保测量精度。 在包括将光照射到作为测量对象的悬臂的光源的光学位移检测机构中,驱动光源的光源驱动电路,从光源照射到悬臂的光接收器,其接收光,从而检测强度 以及以预定的放大率放大光检测器的检测信号的放大器,通过提供光强度调节器和放大率调节器,对悬臂的照射光强度和放大率 可以使光电检测器变得可变。

    2-SUBSTITUTED-6-HETEROCYCLIC PYRIMIDONE DERIVATIVES AS TAU PROTEIN KINASE 1 INHIBITORS
    65.
    发明申请
    2-SUBSTITUTED-6-HETEROCYCLIC PYRIMIDONE DERIVATIVES AS TAU PROTEIN KINASE 1 INHIBITORS 失效
    2-取代的6-杂环基吡啶酮衍生物作为TAU蛋白激酶1抑制剂

    公开(公告)号:US20100113775A1

    公开(公告)日:2010-05-06

    申请号:US12518997

    申请日:2007-12-26

    CPC classification number: C07D413/14

    Abstract: A compound represented by the formula (I), an optically active isomer thereof, or a pharmaceutical acceptable salt thereof: wherein each R1 represents hydrogen atom or the like; X represents oxygen atom or the like; A represents a C3-C7 cycloalkyl group, a C6-C10 aryl group or a heterocyclic group; R6 represents a halogen atom or the like; s represents 0 or an integer of 1 to 5; Q represents a pyridine ring which may be substituted or pyrimidine ring; and R2 represents hydrogen atom or the like, which is used for preventive and/or therapeutic treatment of a disease caused by abnormal activity of tau protein kinase 1 such as a neurodegenerative diseases (e.g. Alzheimer disease).

    Abstract translation: 由式(I)表示的化合物或其光学活性异构体或其药学上可接受的盐:其中每个R 1表示氢原子等; X表示氧原子等; A表示C 3 -C 7环烷基,C 6 -C 10芳基或杂环基; R6表示卤素原子等; s表示0或1〜5的整数, Q表示可以被取代或嘧啶环的吡啶环; R2代表氢原子等,其用于预防和/或治疗由tau蛋白激酶1的异常活性引起的疾病,例如神经变性疾病(例如阿尔茨海默病)。

    Scanning probe microscope
    69.
    发明申请
    Scanning probe microscope 失效
    扫描探针显微镜

    公开(公告)号:US20060207317A1

    公开(公告)日:2006-09-21

    申请号:US11374842

    申请日:2006-03-14

    CPC classification number: G01Q60/40 G01Q20/04 G01Q60/30

    Abstract: To provide a scanning probe microscope which measures an electric property of a sample with a high degree of accuracy without being affected by light leak. The scanning probe microscope is provided with a self detection type probe 6 including a cantilever 3 whose probe 2 is disposed at its front end, a supporting part 4 that supports the cantilever 3, and a piezoresistance element 5 whose resistance value is changed depending on the change amount of the cantilever 3; detecting means that detects the value of the current passing through the piezoresistance element 5 so as to detect the change amount of the cantilever 3; moving means that relatively moves a sample table that mounts the sample thereon and the probe 2 along X and Y directions and a Z direction; control means that controls the moving means so that a distance between the probe 2 and the surface of the sample is fixed and measures the surface shape of a sample S; applying means that applies a predetermined voltage between the probe 2 and the surface of the sample; and measuring means that measures the electric property information caused by the applied voltage; wherein the probe 2 is elongated to the base end side of the cantilever 3 and is electrically connected to a conducting film 28 that can be electrically connected to the measuring means.

    Abstract translation: 提供一种扫描探针显微镜,其可以高精度地测量样品的电性,而不受光泄漏的影响。 扫描探针显微镜设置有自检型探针6,其包括其前端设置有探针2的悬臂3,支撑悬臂3的支撑部4和电阻值根据其变化的压阻元件5 改变悬臂3的量; 检测装置,检测通过压阻元件5的电流的值,以检测悬臂3的变化量; 移动装置,其相对移动在其上安装样品的样品台和探针2沿X和Y方向以及Z方向; 控制装置控制移动装置,使得探针2和样品表面之间的距离是固定的,并测量样品S的表面形状; 施加装置,其在探针2和样品表面之间施加预定的电压; 以及测量装置,其测量由施加的电压引起的电特性信息; 其中探针2伸长到悬臂3的基端侧,并且电连接到可以电连接到测量装置的导电膜28。

    Fine-adjustment mechanism for scanning probe microscopy
    70.
    发明申请
    Fine-adjustment mechanism for scanning probe microscopy 有权
    扫描探针显微镜微调机构

    公开(公告)号:US20050231066A1

    公开(公告)日:2005-10-20

    申请号:US11045916

    申请日:2005-01-28

    CPC classification number: G01Q10/04 Y10S977/872

    Abstract: The invention provides a fine-adjustment mechanism for a scanning probe microscopy with high rigidity and high degree of measurement accuracy wherein a strain gauge displacement sensor which can be installed in a small space is arranged so that temperature compensation is achieved. The fine-adjustment mechanism composed of a piezoelectric device is provided with at least two-piece electrode. One of the electrodes is configured as a dummy electrode, to which no voltage is applied, and the other electrode is configured as an active electrode which generates strain when voltage is applied. One or two resistors are provided on each of the active electrode and dummy electrode, and a bridge circuit is configured by the resistors.

    Abstract translation: 本发明提供了一种用于具有高刚性和高测量精度的扫描探针显微镜的精细调节机构,其中可以安装在小空间中的应变片位移传感器被布置成实现温度补偿。 由压电元件构成的微调机构具有至少两片电极。 其中一个电极被配置为没有施加电压的虚拟电极,另一个电极被配置为当施加电压时产生应变的有源电极。 有源电极和虚拟电极均设置有一个或两个电阻器,桥接电路由电阻器构成。

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