公开(公告)号：US08035082B2

公开(公告)日：2011-10-11

申请号：US12580505

申请日：2009-10-16

申请人： Yuichiro Yamazaki ,  Ichirota Nagahama

发明人： Yuichiro Yamazaki ,  Ichirota Nagahama

IPC分类号： H01J37/244

CPC分类号： G01N23/2251 ,  H01J37/05 ,  H01J37/28 ,  H01J2237/057

摘要： A sample is evaluated at a high throughput by reducing axial chromatic aberration and increasing the transmittance of secondary electrons. Electron beams emitted from an electron gun 1 are irradiated onto a sample 7 through a primary electro-optical system, and electrons consequently emitted from the sample are detected by a detector 12 through a secondary electro-optical system. A Wien filter 8 comprising a multi-pole lens for correcting axial chromatic aberration is disposed between a magnification lens 10 in the secondary electro-optical system and a beam separator 5 for separating a primary electron beam and a secondary electron beam, for correcting axial chromatic aberration caused by an objective lens 14 which comprises an electromagnetic lens having a magnetic gap defined on a sample side.

摘要翻译： 通过减少轴向色差并增加二次电子的透射率，以高产量来评估样品。 从电子枪1发射的电子束通过初级电光系统照射到样品7上，由检测器12通过次级电光学系统检测从样品发射的电子。 包括用于校正轴向色差的多极透镜的维恩滤波器8设置在二次电光学系统中的放大透镜10和用于分离一次电子束和二次电子束的光束分离器5之间，用于校正轴向色度 由物镜14引起的像差包括具有限定在样品侧的磁隙的电磁透镜。

公开(公告)号：US08026277B2

公开(公告)日：2011-09-27

申请号：US12516454

申请日：2007-11-02

申请人： Takashi Aida ,  Tetsuya Nagasawa ,  Yuichiro Yamazaki

发明人： Takashi Aida ,  Tetsuya Nagasawa ,  Yuichiro Yamazaki

IPC分类号： A61K31/21 ,  C07C51/16

CPC分类号： C07C69/007 ,  A23L2/56 ,  A23L27/2028 ,  A23L27/204 ,  A61K8/37 ,  A61L9/01 ,  A61Q19/00 ,  C07C69/145 ,  C07C69/24 ,  C07C69/78 ,  C11B9/0019 ,  C11B9/0061 ,  C11D3/50

摘要： Disclosed is a 2-methyl-2-pentenyl ester represented by the general formula (1) [wherein R represents a hydrogen atom or a hydrocarbon group having 1 to 9 carbon atoms which may have a substituent]. The compound has a new-type, unprecedented aroma and/or flavor, particularly a fruity, greenish or floral aroma and/or flavor. The compound can be added to a flavor or fragrance composition in an amount of 0.001 to 30 wt %. The flavor or fragrance composition can be added to a cosmetic product, a toiletry product, a bath agent, a food, a beverage or a pharmaceutical product in an amount of 0.0001 to 30 wt %. All of the compounds of the general formula (1) are novel, except for those compounds of the general formula (1) wherein R represents a methyl group, an isopropyl group, a phenyl group or a mesityl group.

摘要翻译： 公开了由通式（1）表示的2-甲基-2-戊烯基酯[其中R表示氢原子或可具有取代基的碳原子数1〜9的烃基]。 该化合物具有新型，前所未有的香气和/或风味，特别是水果，绿色或花香的香气和/或风味。 该化合物可以以0.001至30重量％的量加入香料或香料组合物中。 风味剂或香料组合物可以以0.0001〜30重量％的量添加到化妆品，化妆品，浴剂，食品，饮料或药品中。 所有通式（1）的化合物都是新的，除了通式（1）的那些化合物，其中R代表甲基，异丙基，苯基或均三甲苯基。

公开(公告)号：US07569838B2

公开(公告)日：2009-08-04

申请号：US12068484

申请日：2008-02-07

申请人： Kenji Watanabe ,  Hirosi Sobukawa ,  Nobuharu Noji ,  Tohru Satake ,  Shoji Yoshikawa ,  Tsutomu Karimata ,  Mamoru Nakasuji ,  Masahiro Hatakeyama ,  Takeshi Murakami ,  Yuichiro Yamazaki ,  Ichirota Nagahama ,  Takamitsu Nagai ,  Kazuyoshi Sugihara

发明人： Kenji Watanabe ,  Hirosi Sobukawa ,  Nobuharu Noji ,  Tohru Satake ,  Shoji Yoshikawa ,  Tsutomu Karimata ,  Mamoru Nakasuji ,  Masahiro Hatakeyama ,  Takeshi Murakami ,  Yuichiro Yamazaki ,  Ichirota Nagahama ,  Takamitsu Nagai ,  Kazuyoshi Sugihara

IPC分类号： H01J37/00 ,  H01J37/30

CPC分类号： H01J37/28 ,  H01J37/224 ,  H01J37/244 ,  H01J2237/006 ,  H01J2237/20221 ,  H01J2237/2445 ,  H01J2237/2817

摘要： An electron beam inspection system of the image projection type includes a primary electron optical system for shaping an electron beam emitted from an electron gun into a rectangular configuration and applying the shaped electron beam to a sample surface to be inspected. A secondary electron optical system converges secondary electrons emitted from the sample. A detector converts the converged secondary electrons into an optical image through a fluorescent screen and focuses the image to a line sensor. A controller controls the charge transfer time of the line sensor at which the picked-up line image is transferred between each pair of adjacent pixel rows provided in the line sensor in association with the moving speed of a stage for moving the sample.

公开(公告)号：US07411191B2

公开(公告)日：2008-08-12

申请号：US11806573

申请日：2007-06-01

申请人： Mamoru Nakasuji ,  Nobuharu Noji ,  Tohru Satake ,  Masahiro Hatakeyama ,  Toshifumi Kimba ,  Hiroshi Sobukawa ,  Shoji Yoshikawa ,  Takeshi Murakami ,  Kenji Watanabe ,  Tsutomu Karimata ,  Shin Oowada ,  Mutsumi Saito ,  Yuichiro Yamazaki ,  Takamitsu Nagai ,  Ichirota Nagahama

发明人： Mamoru Nakasuji ,  Nobuharu Noji ,  Tohru Satake ,  Masahiro Hatakeyama ,  Toshifumi Kimba ,  Hiroshi Sobukawa ,  Shoji Yoshikawa ,  Takeshi Murakami ,  Kenji Watanabe ,  Tsutomu Karimata ,  Shin Oowada ,  Mutsumi Saito ,  Yuichiro Yamazaki ,  Takamitsu Nagai ,  Ichirota Nagahama

IPC分类号： H01J37/26

CPC分类号： H01J29/70 ,  G01N23/225 ,  G01N23/2251 ,  G01N23/227 ,  H01J37/06 ,  H01J37/073 ,  H01J37/141 ,  H01J37/185 ,  H01J37/20 ,  H01J37/222 ,  H01J37/244 ,  H01J37/266 ,  H01J37/28 ,  H01J2237/082 ,  H01J2237/202 ,  H01J2237/20228 ,  H01J2237/204 ,  H01J2237/22 ,  H01J2237/24564 ,  H01J2237/2806 ,  H01J2237/2816 ,  H01J2237/2817 ,  H01L21/6719 ,  H01L21/67213

摘要： An inspection apparatus by an electron beam comprises: an electron-optical device 70 having an electron-optical system for irradiating the object with a primary electron beam from an electron beam source, and a detector for detecting the secondary electron image projected by the electron-optical system; a stage system 50 for holding and moving the object relative to the electron-optical system; a mini-environment chamber 20 for supplying a clean gas to the object to prevent dust from contacting to the object; a working chamber 31 for accommodating the stage device, the working chamber being controllable so as to have a vacuum atmosphere; at least two loading chambers 41, 42 disposed between the mini-environment chamber and the working chamber, adapted to be independently controllable so as to have a vacuum atmosphere; and a loader 60 for transferring the object to the stage system through the loading chambers.

摘要翻译： 电子束检查装置包括：电子光学装置70，具有用于从电子束源向一个电子束照射物体的电子 - 光学系统;以及用于检测由电子束投射的二次电子图像的检测器， 光学系统; 用于相对于电子 - 光学系统保持和移动物体的平台系统50; 微型环境室20，用于向物体供应清洁气体，以防止灰尘与物体接触; 用于容纳平台装置的工作室31，工作室可控制为具有真空气氛; 设置在微环境室和工作室之间的至少两个装载室41,42适于独立控制以具有真空气氛; 以及用于通过装载室将物体传送到舞台系统的装载器60。

公开(公告)号：US07351969B2

公开(公告)日：2008-04-01

申请号：US11290688

申请日：2005-12-01

申请人： Kenji Watanabe ,  Hirosi Sobukawa ,  Nobuharu Noji ,  Tohru Satake ,  Shoji Yoshikawa ,  Tsutomu Karimata ,  Mamoru Nakasuji ,  Masahiro Hatakeyama ,  Takeshi Murakami ,  Yuichiro Yamazaki ,  Ichirota Nagahama ,  Takamitsu Nagai ,  Kazuyoshi Sugihara

发明人： Kenji Watanabe ,  Hirosi Sobukawa ,  Nobuharu Noji ,  Tohru Satake ,  Shoji Yoshikawa ,  Tsutomu Karimata ,  Mamoru Nakasuji ,  Masahiro Hatakeyama ,  Takeshi Murakami ,  Yuichiro Yamazaki ,  Ichirota Nagahama ,  Takamitsu Nagai ,  Kazuyoshi Sugihara

IPC分类号： G21K7/00

CPC分类号： H01J37/28 ,  H01J37/224 ,  H01J37/244 ,  H01J2237/006 ,  H01J2237/20221 ,  H01J2237/2445 ,  H01J2237/2817

摘要： An electron beam inspection system of the image projection type includes a primary electron optical system for shaping an electron beam emitted from an electron gun into a rectangular configuration and applying the shaped electron beam to a sample surface to be inspected. A secondary electron optical system converges secondary electrons emitted from the sample. A detector converts the converged secondary electrons into an optical image through a fluorescent screen and focuses the image to a line sensor. A controller controls the charge transfer time of the line sensor at which the picked-up line image is transferred between each pair of adjacent pixel rows provided in the line sensor in association with the moving speed of a stage for moving the sample.

摘要翻译： 图像投影型的电子束检查系统包括用于将从电子枪发射的电子束成形为矩形构造的一次电子光学系统，并将成形的电子束施加到要检查的样品表面。 二次电子光学系统收敛从样品发射的二次电子。 检测器通过荧光屏将会聚的二次电子转换成光学图像，并将图像聚焦到线传感器。 一个控制器控制线传感器的电荷转移时间，该线传感器在行传感器中设置的每对相邻像素行之间与用于移动样本的平台的移动速度相关联地传送拾取线图像。

公开(公告)号：US20080024894A1

公开(公告)日：2008-01-31

申请号：US11905012

申请日：2007-09-27

申请人： Yuichiro Yamazaki

发明人： Yuichiro Yamazaki

IPC分类号： G11B27/36

CPC分类号： G11B27/36 ,  G11B20/182 ,  G11B2220/2516

摘要： This invention provides a magnetic recording and reproducing device, having a recording media with a diagnostic area to which diagnostic data is written, and a computation unit having a program area which determines the possibility of erroneous reading of data read out from the recording media and a memory area which stores diagnostic data and a threshold value for the possibility of erroneous reading. The computation unit writes diagnostic data to the diagnostic area of the recording media, reads out diagnostic data written to the diagnostic area of the recording media a plurality of times with time intervals, determines the possibility of erroneous reading of the read-out diagnostic data upon each reading-out, and estimates whether the possibility of erroneous reading after a prescribed time has elapsed exceeds the threshold value based on a plurality of possibilities of erroneous reading and times of reading-out.

摘要翻译： 本发明提供了一种磁记录和再现装置，具有一记录介质，具有诊断数据被写入的诊断区域，以及具有一个程序区的计算单元，该程序区确定从该记录介质读出的数据的错误读取的可能性， 存储诊断数据的存储区域和用于错误读取的可能性的阈值。 计算单元将诊断数据写入到记录介质的诊断区域，以时间间隔多次读取写入记录介质的诊断区域的诊断数据，确定读出诊断数据的错误读取的可能性 每个读出，并且基于多个读取的可能性和读出次数来估计经过了规定时间之后的错误读取的可能性是否超过阈值。

公开(公告)号：US20070211365A1

公开(公告)日：2007-09-13

申请号：US11452841

申请日：2006-06-14

申请人： Yuichiro Yamazaki

发明人： Yuichiro Yamazaki

IPC分类号： G11B5/02 ,  G11B5/09

CPC分类号： G11B5/09 ,  G11B27/36 ,  G11B2220/2516

摘要： There is provided a magnetic disk device or the like which is capable of improving signal quality by suppressing occurrence of erasure of adjacent tracks due to spreading of a writing spot. The magnetic disk device is capable of controlling a steady state value of a write current for writing into a magnetic disk, an overshoot value, or a width thereof. The magnetic disk device comprises a VMM measurement section that measures a VMM, and a write current setting section that sets the write current, based on a value of the VMM measured by the VMM measurement section, such that a data writing spot is prevented from spreading during writing into the medium and occurrence of side erasure is prevented.

摘要翻译： 提供了一种磁盘装置等，其能够通过抑制由于写入点的扩展而导致的相邻轨迹的擦除的发生而提高信号质量。 磁盘装置能够控制用于写入磁盘的写入电流的稳定状态值，过冲值或其宽度。 磁盘装置包括测量VMM的VMM测量部分和基于由VMM测量部分测量的VMM的值来设置写入电流的写入电流设置部分，使得防止数据写入点扩展 在写入介质期间并且防止发生侧擦除。

公开(公告)号：US07098457B2

公开(公告)日：2006-08-29

申请号：US11134330

申请日：2005-05-23

申请人： Ichirota Nagahama ,  Yuichiro Yamazaki ,  Kenji Watanabe ,  Masahiro Hatakeyama ,  Tohru Satake ,  Nobuharu Noji

发明人： Ichirota Nagahama ,  Yuichiro Yamazaki ,  Kenji Watanabe ,  Masahiro Hatakeyama ,  Tohru Satake ,  Nobuharu Noji

IPC分类号： G01N23/00

CPC分类号： H01J37/28 ,  H01J2237/0044 ,  H01J2237/2817

摘要： A defect inspecting apparatus is provided for generating a less distorted test image to reliably observe a surface of a sample for detecting defects thereon. The defect detecting apparatus comprises a primary electron beam source for irradiating a sample, electrostatic lenses for focusing secondary electrons emitted from the surface of the sample irradiated with the primary electron beam, a detector for detecting the secondary electrons, and an image processing unit for processing a signal from the detector. Further, a second electron source may be provided for emitting an electron beam irradiated to the sample, wherein the sample may be irradiated with the electron beam from the second electron source before it is irradiated with the primary electron beam from the first electron source for observing the sample. A device manufacturing method is also provided for inspecting devices under processing with high throughput using the defect detecting apparatus.

公开(公告)号：US07009793B2

公开(公告)日：2006-03-07

申请号：US10776124

申请日：2004-02-11

申请人： Yuichiro Yamazaki

发明人： Yuichiro Yamazaki

IPC分类号： G11B5/09

CPC分类号： G11B20/10481 ,  G11B5/012 ,  G11B20/10009 ,  G11B20/10296 ,  G11B2005/001

摘要： A hard disk controller generates a read gate signal RG which has a predefined read start time and read end time set based on a sector pulse as a reference. A read data demodulation unit reproduces read data from a readout signal of medium by executing a read based on the read gate signal RG. A read gate optimization unit detects errors of read data demodulated by the data demodulation unit while varying the read start time and the read end time of the read gate signal RG, determines the read start time and the read end time at which the detected errors will be minimized and sets these in the read gate generation unit.

摘要翻译： 硬盘控制器产生读栅极信号RG，其具有基于扇区脉冲作为参考的预定义的读取开始时间和读取结束时间设置。 读取数据解调单元通过基于读取门信号RG执行读取，从介质的读出信号再现读取数据。 读取门优化单元在读取开始时间和读取门信号RG的读取结束时间的同时，检测由数据解调单元解调的读取数据的错误，确定读取的开始时间和读取的结束时间， 并将其设置在读门生成单元中。

公开(公告)号：US06992290B2

公开(公告)日：2006-01-31

申请号：US09985317

申请日：2001-11-02

申请人： Kenji Watanabe ,  Hirosi Sobukawa ,  Nobuharu Noji ,  Tohru Satake ,  Shoji Yoshikawa ,  Tsutomu Karimata ,  Mamoru Nakasuji ,  Masahiro Hatakeyama ,  Takeshi Murakami ,  Yuichiro Yamazaki ,  Ichirota Nagahama ,  Takamitsu Nagai ,  Kazuyoshi Sugihara

发明人： Kenji Watanabe ,  Hirosi Sobukawa ,  Nobuharu Noji ,  Tohru Satake ,  Shoji Yoshikawa ,  Tsutomu Karimata ,  Mamoru Nakasuji ,  Masahiro Hatakeyama ,  Takeshi Murakami ,  Yuichiro Yamazaki ,  Ichirota Nagahama ,  Takamitsu Nagai ,  Kazuyoshi Sugihara

IPC分类号： H01J37/26

CPC分类号： H01J37/28 ,  H01J37/224 ,  H01J37/244 ,  H01J2237/006 ,  H01J2237/20221 ,  H01J2237/2445 ,  H01J2237/2817

摘要： An electron beam inspection system of the image projection type includes a primary electron optical system for shaping an electron beam emitted from an electron gun into a rectangular configuration and applying the shaped electron beam to a sample surface to be inspected. A secondary electron optical system converges secondary electrons emitted from the sample. A detector converts the converged secondary electrons into an optical image through a fluorescent screen and focuses the image to a line sensor. A controller controls the charge transfer time of the line sensor at which the picked-up line image is transferred between each pair of adjacent pixel rows provided in the line sensor in association with the moving speed of a stage for moving the sample.