Method and layout of an integrated circuit
    61.
    发明授权
    Method and layout of an integrated circuit 有权
    集成电路的方法和布局

    公开(公告)号:US09245887B2

    公开(公告)日:2016-01-26

    申请号:US13955796

    申请日:2013-07-31

    Abstract: An integrated circuit layout includes a first active region, a second active region, a first PODE (poly on OD edge), a second PODE, a first transistor and a second transistor. The first transistor, on the first active region, includes a gate electrode, a source region and a drain region. The second transistor, on the second active region, includes a gate electrode, a source region and a drain region. The first active region and the second active region are adjacent and electrically disconnected with each other. The first PODE and the second PODE are on respective adjacent edges of the first active region and the second active region. The source regions of the first and second transistor are adjacent with the first PODE and the second PODE respectively. The first PODE and the second PODE are sandwiched between source regions of the first transistor and the second transistor.

    Abstract translation: 集成电路布局包括第一有源区,第二有源区,第一PODE(OD边缘上的poly),第二PODE,第一晶体管和第二晶体管。 在第一有源区上的第一晶体管包括栅电极,源极区和漏极区。 在第二有源区上的第二晶体管包括栅电极,源极区和漏极区。 第一有源区和第二有源区相邻并且彼此电断开。 第一PODE和第二PODE位于第一有源区和第二有源区的相邻相邻边缘上。 第一和第二晶体管的源极区分别与第一PODE和第二PODE相邻。 第一PODE和第二PODE夹在第一晶体管和第二晶体管的源极区之间。

    Integrated circuit structure
    62.
    发明授权

    公开(公告)号:US12277378B2

    公开(公告)日:2025-04-15

    申请号:US18362946

    申请日:2023-07-31

    Abstract: An IC structure includes a first cell and a first and second rail. The first cell includes a first and second active region and a first, a second and a third gate structure. The first active region having a first dopant type. The second active region having a second dopant type. The first gate structure extending in a second direction, overlapping the first or the second active region. The second gate structure extending in the second direction, and overlapping a first edge of the first or second active region. The third gate structure extending in the second direction, and overlapping at least a second edge of the first or second active region. The first rail extending in the first direction and overlapping a middle portion of the first active region. The second rail extending in the first direction and overlapping a middle portion of the second active region.

    Method of making semiconductor device having self-aligned interconnect structure

    公开(公告)号:US12266594B2

    公开(公告)日:2025-04-01

    申请号:US18517298

    申请日:2023-11-22

    Abstract: A method of making a semiconductor device includes manufacturing a first transistor over a first side of a substrate. The method further includes depositing a spacer material against a sidewall of the first transistor. The method further includes recessing the spacer material to expose a first portion of the sidewall of the first transistor. The method further includes manufacturing a first electrical connection to the transistor, a first portion of the electrical connection contacts a surface of the first transistor farthest from the substrate, and a second portion of the electrical connect contacts the first portion of the sidewall of the first transistor. The method further includes manufacturing a self-aligned interconnect structure (SIS) extending along the spacer material, wherein the spacer material separates a portion of the SIS from the first transistor, and the first electrical connection directly contacts the SIS.

    Manufacturing method of an input circuit of a flip-flop

    公开(公告)号:US12224753B2

    公开(公告)日:2025-02-11

    申请号:US18365199

    申请日:2023-08-03

    Abstract: A manufacturing method of an input circuit of a flip-flop including: depositing a first gate strip, a second gate strip, a third gate strip, and a fourth gate strip, wherein a distance between the first and second gate strips, a distance between the second and third gate strips, and a distance between the third and fourth gate strips equal; executing a cut-off operation upon the first gate strip to generate a first first gate strip and a second first gate strip; executing a cut-off operation upon the third gate strip to generate a first third gate strip and a second third gate strip; and directing a first signal to the first first gate strip and the second third gate strip, and a second signal to the second first gate strip and the first third gate strip.

    Method of making cell regions of integrated circuits

    公开(公告)号:US12124785B2

    公开(公告)日:2024-10-22

    申请号:US18448115

    申请日:2023-08-10

    CPC classification number: G06F30/392 H01L21/041 H01L27/0207

    Abstract: A method of manufacturing an integrated circuit (IC) includes forming a first active region in a first cell. The method includes forming a plurality of second active regions in a second cell, wherein the second cell abuts the first cell. The method includes forming a third active region in a third cell, wherein the second cell is between the first cell and the third cell, and a height of the second cell is different from a height of the first cell or the third cell. The method includes forming a plurality of gate structures extending across each of the first active region, the plurality of second active regions, and the third active region. The method includes removing a first portion of a first gate structure at an interface between the first cell and the second cell between the first active region and the plurality of second active regions.

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