摘要:
The present invention provides a method for efficiently manufacturing a titanium oxide-containing slag from a material including titanium oxide and iron oxide, wherein a reduction of titanium dioxide is suppressed and the electric power consumption is minimized. The method includes the steps of: heating a raw material mixture including titanium oxide, iron oxide, and a carbonaceous reductant, or the raw material mixture further including a calcium oxide source, in a reducing furnace; reducing the iron oxide in the mixture to form reduced iron; feeding the resultant mixture to a heating melting furnace; heating the resultant mixture in the heating melting furnace to melt the reduced iron and separate the reduced iron from a titanium oxide-containing slag; and discharging and recovering the titanium oxide-containing slag out of the furnace.
摘要:
In a rotary hearth furnace for producing reduced metal through heating and reducing carbon containing materials composed of at least metal oxide-containing material and carbon-containing reduction material, a hearth structure is provided by which a refractory in a hearth lateral end is not damaged and carbon containing materials do not fall down to a water sealing section of the rotary hearth furnace. The upper part of a hearth lateral end 1a is covered with the lower end 2a of a side wall 2 of a hood covering the whole hearth, and a cooling means 3 is installed in the side wall lower end 2a.
摘要:
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection method thereof in order to efficiently carrying out a burn-in stress test. A command latch circuit having an access command input will output a low-level pulse in synchronism with an external clock. The pulse will pass through a NAND gate of test mode sequence circuit and a common NAND gate to output a low-level internal precharge signal, which will reset a word line activating signal from the control circuit. Simultaneously, an internal precharge signal passing through the NAND gate will be delayed by an internal timer a predetermined period of time to output through the NAND gate a low-level internal active signal, which will set a word line activating signal from the control circuit.
摘要:
To provide an operating method of a rotary hearth furnace for producing reduced iron in which a stuck substance stuck on the hearth surface is removed from the hearth surface to thereby prevent or reduce the wear of the knife edge of a screw of a discharge device, enabling continuous operation for a long period and capable of achieving high availability factor. The hearth surface is quenched by spraying or the like to generate cracks in the stuck substance on the hearth, and the stuck substance is scraped to thereby remove it from the hearth.
摘要:
An image forming apparatus including at least first and second developing devices for developing latent images formed on an image bearing member. The first and second developing devices contain developers of different colors, respectively. The second developing device contains a developer of a predetermined color and is fixedly mounted in the image forming apparatus. The first developing device contains a developer of a color other than the predetermined color and is detachably mountable in the image forming apparatus. Only the first developing device is exchangeable.
摘要:
An image forming apparatus capable of effecting plural image forming operations on one transfer sheet includes an image transfer device for transferring an image on the transfer sheet, an image magnification changing mechanism for changing the magnification of the image to be transferred onto the transfer sheet, and a control device for controlling the magnification changing mechanism in accordance with deformation of the transfer sheet caused by an image forming operation on the transfer sheet, after a first image is formed on the transfer sheet and before a second image is formed on the same transfer sheet, whereby those images are correctly registered.
摘要:
A semiconductor light emitting device in which adhesion between an insulating layer and a semiconductor layer is improved while maintaining the ability of the insulating layer to limit the direction of current flow. The semiconductor light emitting device includes a semiconductor layer, a first electrode and a second electrode arranged to interpose the semiconductor layer therebetween, an insulating layer provided to the semiconductor layer at the same side as the second electrode and opposite to the first electrodes so as to surround the periphery of the second electrode, a first metal layer covering the second electrode and the insulating layer, and a second metal layer which has a thickness smaller than the thickness of the second electrode and is provided between the semiconductor layer and the insulating layer.
摘要:
Provided is a plant growth regulator composition.The plant growth regulator composition contains phenyllactic acid or a salt thereof and tryptophan or a salt thereof.
摘要:
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection method thereof in order to efficiently carrying out a burn-in stress test. A command latch circuit having an access command input will output a low-level pulse in synchronism with an external clock. The pulse will pass through a NAND gate of test mode sequence circuit and a common NAND gate to output a low-level internal precharge signal, which will reset a word line activating signal from the control circuit. Simultaneously, an internal precharge signal passing through the NAND gate will be delayed by an internal timer a predetermined period of time to output through the NAND gate a low-level internal active signal, which will set a word line activating signal from the control circuit.
摘要:
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection method thereof in order to efficiently carrying out a burn-in stress test. A command latch circuit having an access command input will output a low-level pulse in synchronism with an external clock. The pulse will pass through a NAND gate of test mode sequence circuit and a common NAND gate to output a low-level internal precharge signal, which will reset a word line activating signal from the control circuit. Simultaneously, an internal precharge signal passing through the NAND gate will be delayed by an internal timer a predetermined period of time to output through the NAND gate a low-level internal active signal, which will set a word line activating signal from the control circuit.