3-Quinuclidinyl amino-substituted biaryl derivatives
    63.
    发明申请
    3-Quinuclidinyl amino-substituted biaryl derivatives 有权
    3-喹啉基氨基取代的联芳基衍生物

    公开(公告)号:US20050159597A1

    公开(公告)日:2005-07-21

    申请号:US11015158

    申请日:2004-12-17

    CPC classification number: C07D453/02

    Abstract: Compounds of formula (I) wherein A is N or N+—O−; n is 0, 1, or 2; Y is O, S, —NH—, and —N-alkyl-; Ar1 is both 6-membered aromatic rings; Ar2 is 5- or 6-membered aromatic rings with a —NR8R9 group, as defined herein. The compounds are useful in treating conditions or disorders prevented by or ameliorated by α7 nAChR ligands. Also disclosed are pharmaceutical compositions having compounds of formula (I) and methods for using such compounds and compositions.

    Abstract translation: 式(I)的化合物,其中A是N或N +,-O - n为0,1或2; Y是O,S,-NH-和-N-烷基 - ; Ar 1是两个6元芳环; Ar 2是如本文所定义的具有-NR 8 R 9 R 9基团的5-或6-元芳环。 该化合物可用于治疗由α7nAChR配体预防或改善的病症或病症。 还公开了具有式(I)化合物的药物组合物和使用这些化合物和组合物的方法。

    Method of selecting a charge transport and/or anti-quenching material
    66.
    发明申请
    Method of selecting a charge transport and/or anti-quenching material 审中-公开
    选择电荷输送和/或抗淬火材料的方法

    公开(公告)号:US20050014019A1

    公开(公告)日:2005-01-20

    申请号:US10623042

    申请日:2003-07-18

    Applicant: Ying Wang

    Inventor: Ying Wang

    Abstract: A method for selecting charge transport and/or anti-quenching materials is presented. The method includes determining a first luminescence intensity I0 of a luminescent material in the absence of the charge transport and/or anti-quenching material, determining a second luminescence intensity Iq of the luminescent material in the presence of the charge transport and/or anti-quenching material, and comparing the first luminescence intensity I0 with the second luminescence intensity Iq to determine a luminescence quenching constant of the charge transport and/or anti-quenching material with respect to the luminescent material. A device made using charge transport and/or anti-quenching material selected using the selection method and a kit to practice the selection method.

    Abstract translation: 提出了选择电荷传输和/或抗淬火材料的方法。 该方法包括在没有电荷传输和/或抗猝灭材料的情况下确定发光材料的第一发光强度I0,在存在电荷输送和/或抗反射的情况下确定发光材料的第二发光强度Iq, 淬火材料,并且将第一发光强度I0与第二发光强度Iq进行比较,以确定电荷输送和/或抗淬火材料相对于发光材料的发光猝灭常数。 使用选择方法选择的使用电荷传输和/或抗猝灭材料制成的器件和用于实践选择方法的试剂盒。

    Non-destructive root cause analysis on blocked contact or via
    67.
    发明授权
    Non-destructive root cause analysis on blocked contact or via 有权
    对破坏性接触或通过的非破坏性根本原因分析

    公开(公告)号:US06777676B1

    公开(公告)日:2004-08-17

    申请号:US10303267

    申请日:2002-11-21

    CPC classification number: G01N23/225 H01J2237/2561

    Abstract: Disclosed are apparatus and methods for characterizing a potential defect of a semiconductor structure. A charged particle beam is scanned over a structure which has a potential defect. X-rays are detected from the scanned structure. The X-rays are in response to the charged particle beam being scanned over the structure. The potential defect of the scanned structure is characterized based on the detected X-rays. For example, it may be determined whether a potentially defective via has a SiO2 plug defect by comparing an X-ray count ratio of oxygen over silicon of the defective via with an X-ray count ratio of a known defect-free reference via. If the defective via has a relatively high ratio (more oxygen than silicon) as compared to the reference via, then it may be determined that a SiO2 plug defect is present within the defective via. Otherwise, the via may be defmed as having a different type of defect (e.g., not a SiO2 plug defect) or defined resulting in a “false” defect. Accordingly, specific embodiments of the present invention may be utilized to filter “false” defects from a defect sample.

    Abstract translation: 公开了用于表征半导体结构的潜在缺陷的装置和方法。 带电粒子束在具有潜在缺陷的结构上扫描。 从扫描结构检测X射线。 X射线响应于在结构上扫描的带电粒子束。 基于检测到的X射线来表征扫描结构的潜在缺陷。 例如,可以通过将有缺陷的通孔的硅上的氧的X射线计数比与已知的无缺陷参考通孔的X射线计数比进行比较,来确定潜在缺陷通孔是否具有SiO 2插塞缺陷。 如果故障通孔与参考通孔相比具有相对高的比率(比硅更多的氧),则可以确定在缺陷通孔内存在SiO 2插塞缺陷。 否则,可以将通孔定义为具有不同类型的缺陷(例如,不是SiO2插塞缺陷)或定义导致“假”缺陷。 因此,可以利用本发明的具体实施例来从缺陷样品中过滤“假”缺陷。

    Diffraction compensation of FBG phase masks for multi-channel sampling applications
    69.
    发明授权
    Diffraction compensation of FBG phase masks for multi-channel sampling applications 有权
    用于多通道采样应用的FBG相位掩模的衍射补偿

    公开(公告)号:US06654521B2

    公开(公告)日:2003-11-25

    申请号:US10056575

    申请日:2002-01-23

    CPC classification number: G02B6/02085 G02B6/02138

    Abstract: The present invention is directed to a system and method for designing efficient multi-channel FBG gratings using a pre-compensated phase mask for diffracting light for side-writing the grating on an optical fiber core. A desired phase function of the FBG is generated, specifically tailored to an effective spacing between the phase mask and the optical fiber core. From the phase function a phase mask is pre-compensated to offset diffraction effects associated with each longitudinal position of the FBG receiving light from two corresponding longitudinal positions of the phase mask substantially symmetrically spaced longitudinally relative to each particular longitudinal position of the FBG. The two corresponding longitudinal positions of the phase mask are spaced longitudinally from each other by a spacing determined by the effective spacing between the phase mask and fiber core and by the first order diffraction angle of light through the phase mask.

    Abstract translation: 本发明涉及一种用于使用预补偿相位掩模设计有效的多通道FBG光栅的系统和方法,用于衍射光以在光纤芯上侧写光栅。 产生FBG的期望相位函数,专门针对相位掩模和光纤芯之间的有效间隔。 从相位函数中,相位掩模被预补偿以抵消与FBG的每个纵向位置相关联的衍射效应,所述FBG接收来自相位掩模的两个相应纵向位置的光,其相对于FBG的每个特定纵向位置基本对称地间隔开。 相位掩模的两个对应的纵向位置彼此纵向间隔由相位掩模和光纤芯之间的有效间隔确定的间隔以及通过相位掩模的一阶衍射光角。

    Fast data base research and learning apparatus
    70.
    发明授权
    Fast data base research and learning apparatus 失效
    快速的数据库研究和学习设备

    公开(公告)号:US06490279B1

    公开(公告)日:2002-12-03

    申请号:US09121586

    申请日:1998-07-23

    CPC classification number: H04L12/56

    Abstract: This invention discloses an improved address table apparatus that includes an address bus for receiving input data packets and for hashing a designated bucket number and extracting a key from each of the data packets. The address table apparatus further includes a plurality of memory banks connected to the address bus wherein each memory bank includes a plurality of memory buckets for storing a designation address (DA) and a port number in each of the buckets. The address table apparatus further includes a comparand bus connected to the address bus for receiving the key therefrom. The address table apparatus further includes a plurality of comparators each corresponding to one of the memory banks for receiving the designation address (DA) and the port number from the designated bucket from a corresponding memory bank. The comparators further connected to the comparand bus for receiving and comparing the key to the address from the designated bucket in each of the memory banks. The address table apparatus further includes a result bus connected to the comparators for displaying an output port number from one of the comparators if the key extracted from one the data packets matching the designation address (DA) from one of the designated buckets.

    Abstract translation: 本发明公开了一种改进的地址表装置,其包括用于接收输入数据分组的地址总线,并且用于散列指定的存储桶号并从每个数据分组提取密钥。 地址表装置还包括连接到地址总线的多个存储器组,其中每个存储体包括用于存储每个存储桶中的指定地址(DA)和端口号的多个存储器桶。 地址表装置还包括连接到地址总线的比较总线,用于从其接收密钥。 地址表装置还包括多个比较器,每个比较器对应于一个存储器组,用于从相应的存储体接收指定地址(DA)和来自指定存储器的端口号。 比较器还连接到比较总线,用于接收和比较每个存储体中的来自指定桶的地址的密钥。 地址表装置还包括连接到比较器的结果总线,用于从一个比较器显示输出端口号,如果从一个指定的桶中的一个指定的桶中的一个与指定地址(DA)匹配的数据分组提取的密钥。

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